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Results: 1-22 |
Results: 22
HYDROGEN-MEDIATED STRUCTURAL-CHANGES OF AMORPHOUS AND MICROCRYSTALLINE SILICON
Authors: KAISER I NICKEL NH FUHS W PILZ W
Citation: I. Kaiser et al., HYDROGEN-MEDIATED STRUCTURAL-CHANGES OF AMORPHOUS AND MICROCRYSTALLINE SILICON, Physical review. B, Condensed matter, 58(4), 1998, pp. 1718-1721
DIRECT OBSERVATION OF DANGLING BOND MOTION IN DISORDERED SILICON
Authors: NICKEL NH SCHIFF EA
Citation: Nh. Nickel et Ea. Schiff, DIRECT OBSERVATION OF DANGLING BOND MOTION IN DISORDERED SILICON, Physical review. B, Condensed matter, 58(3), 1998, pp. 1114-1117
INFLUENCE OF HYDROGEN ON THE STRUCTURAL ORDER OF MICROCRYSTALLINE SILICON DURING THE GROWTH-PROCESS
Authors: BECKERS I NICKEL NH PILZ W FUHS W
Citation: I. Beckers et al., INFLUENCE OF HYDROGEN ON THE STRUCTURAL ORDER OF MICROCRYSTALLINE SILICON DURING THE GROWTH-PROCESS, Journal of non-crystalline solids, 230, 1998, pp. 847-851
INFLUENCE OF GRAIN-BOUNDARIES ON HYDROGEN TRANSPORT IN POLYCRYSTALLINE SILICON
Authors: NICKEL NH JACKSON WB WALKER J
Citation: Nh. Nickel et al., INFLUENCE OF GRAIN-BOUNDARIES ON HYDROGEN TRANSPORT IN POLYCRYSTALLINE SILICON, Journal of non-crystalline solids, 230, 1998, pp. 885-889
INFLUENCE OF OXYGEN PLASMA TREATMENTS ON THE STRUCTURAL-PROPERTIES OFC-SI
Authors: NICKEL NH SIEBER I
Citation: Nh. Nickel et I. Sieber, INFLUENCE OF OXYGEN PLASMA TREATMENTS ON THE STRUCTURAL-PROPERTIES OFC-SI, Applied physics letters, 72(21), 1998, pp. 2683-2685
GRAIN-BOUNDARY DEFECTS IN LASER-CRYSTALLIZED POLYCRYSTALLINE SILICON
Authors: NICKEL NH ANDERSON GB JOHNSON RI
Citation: Nh. Nickel et al., GRAIN-BOUNDARY DEFECTS IN LASER-CRYSTALLIZED POLYCRYSTALLINE SILICON, Physical review. B, Condensed matter, 56(19), 1997, pp. 12065-12068
HYDROGEN-INDUCED PASSIVATION AND GENERATION OF DEFECTS IN POLYCRYSTALLINE SILICON
Authors: NICKEL NH JACKSON WB JOHNSON NM WALKER J
Citation: Nh. Nickel et al., HYDROGEN-INDUCED PASSIVATION AND GENERATION OF DEFECTS IN POLYCRYSTALLINE SILICON, Physica status solidi. a, Applied research, 159(1), 1997, pp. 65-74
HYDROGEN MIGRATION IN POLYCRYSTALLINE SILICON
Authors: NICKEL NH JACKSON WB WALKER J
Citation: Nh. Nickel et al., HYDROGEN MIGRATION IN POLYCRYSTALLINE SILICON, Physical review. B, Condensed matter, 53(12), 1996, pp. 7750-7761
HYDROGEN-INDUCED PLATELETS IN DISORDERED SILICON
Authors: NICKEL NH ANDERSON GB WALKER J
Citation: Nh. Nickel et al., HYDROGEN-INDUCED PLATELETS IN DISORDERED SILICON, Solid state communications, 99(6), 1996, pp. 427-431
HYDROGEN-INDUCED DEFECTS IN POLYCRYSTALLINE SILICON
Authors: NICKEL NH
Citation: Nh. Nickel, HYDROGEN-INDUCED DEFECTS IN POLYCRYSTALLINE SILICON, Journal of non-crystalline solids, 200, 1996, pp. 46-51
EFFECTS OF ELECTRON-CYCLOTRON-RESONANCE PLASMA THERMAL-OXIDATION ON THE PROPERTIES OF POLYCRYSTALLINE SILICON FILM - COMMENT
Authors: NICKEL NH
Citation: Nh. Nickel, EFFECTS OF ELECTRON-CYCLOTRON-RESONANCE PLASMA THERMAL-OXIDATION ON THE PROPERTIES OF POLYCRYSTALLINE SILICON FILM - COMMENT, Applied physics letters, 69(9), 1996, pp. 1330-1331
HYDROGEN PERMEATION THROUGH THIN SILICON-OXIDE FILMS
Authors: NICKEL NH JACKSON WB WU IW TSAI CC CHIANG A
Citation: Nh. Nickel et al., HYDROGEN PERMEATION THROUGH THIN SILICON-OXIDE FILMS, Physical review. B, Condensed matter, 52(11), 1995, pp. 7791-7794
HYDROGEN-MEDIATED CREATION AND ANNIHILATION OF STRAIN IN AMORPHOUS-SILICON
Authors: NICKEL NH JACKSON WB
Citation: Nh. Nickel et Wb. Jackson, HYDROGEN-MEDIATED CREATION AND ANNIHILATION OF STRAIN IN AMORPHOUS-SILICON, Physical review. B, Condensed matter, 51(8), 1995, pp. 4872-4881
ENERGETICS OF BOND-CENTERED HYDROGEN IN STRAINED SI-SI BONDS
Authors: VANDEWALLE CG NICKEL NH
Citation: Cg. Vandewalle et Nh. Nickel, ENERGETICS OF BOND-CENTERED HYDROGEN IN STRAINED SI-SI BONDS, Physical review. B, Condensed matter, 51(4), 1995, pp. 2636-2639
HYDROGEN-INDUCED GENERATION OF ACCEPTOR-LIKE DEFECTS IN POLYCRYSTALLINE SILICON
Authors: NICKEL NH JOHNSON NM WALKER J
Citation: Nh. Nickel et al., HYDROGEN-INDUCED GENERATION OF ACCEPTOR-LIKE DEFECTS IN POLYCRYSTALLINE SILICON, Physical review letters, 75(20), 1995, pp. 3720-3723
LUMINESCENCE OF A-SI-C-H ALLOYS DEPOSITED WITH HYDROGEN DILUTION
Authors: STREET RA NICKEL NH TSAI CC
Citation: Ra. Street et al., LUMINESCENCE OF A-SI-C-H ALLOYS DEPOSITED WITH HYDROGEN DILUTION, Journal of non-crystalline solids, 190(1-2), 1995, pp. 33-37
ON THE NATURE OF THE DEFECT PASSIVATION IN POLYCRYSTALLINE SILICON BYHYDROGEN AND OXYGEN PLASMA TREATMENTS
Authors: NICKEL NH MEI P BOYCE JB
Citation: Nh. Nickel et al., ON THE NATURE OF THE DEFECT PASSIVATION IN POLYCRYSTALLINE SILICON BYHYDROGEN AND OXYGEN PLASMA TREATMENTS, I.E.E.E. transactions on electron devices, 42(8), 1995, pp. 1559-1560
HYDROGEN-INDUCED METASTABLE CHANGES IN THE ELECTRICAL-CONDUCTIVITY OFPOLYCRYSTALLINE SILICON
Authors: NICKEL NH JOHNSON NM VANDEWALLE CG
Citation: Nh. Nickel et al., HYDROGEN-INDUCED METASTABLE CHANGES IN THE ELECTRICAL-CONDUCTIVITY OFPOLYCRYSTALLINE SILICON, Physical review letters, 72(21), 1994, pp. 3393-3396
INFLUENCE OF HYDROGEN AND OXYGEN PLASMA TREATMENTS ON GRAIN-BOUNDARY DEFECTS IN POLYCRYSTALLINE SILICON
Authors: NICKEL NH YIN A FONASH SJ
Citation: Nh. Nickel et al., INFLUENCE OF HYDROGEN AND OXYGEN PLASMA TREATMENTS ON GRAIN-BOUNDARY DEFECTS IN POLYCRYSTALLINE SILICON, Applied physics letters, 65(24), 1994, pp. 3099-3101
LIGHT-INDUCED CREATION OF METASTABLE PARAMAGNETIC DEFECTS IN HYDROGENATED POLYCRYSTALLINE SILICON
Authors: NICKEL NH JACKSON WB JOHNSON NM
Citation: Nh. Nickel et al., LIGHT-INDUCED CREATION OF METASTABLE PARAMAGNETIC DEFECTS IN HYDROGENATED POLYCRYSTALLINE SILICON, Physical review letters, 71(17), 1993, pp. 2733-2736
THE EFFECT OF POST-HYDROGENATION ON THE EQUILIBRIUM AND METASTABLE PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON
Authors: NICKEL NH JACKSON WB
Citation: Nh. Nickel et Wb. Jackson, THE EFFECT OF POST-HYDROGENATION ON THE EQUILIBRIUM AND METASTABLE PROPERTIES OF HYDROGENATED AMORPHOUS-SILICON, Journal of non-crystalline solids, 166, 1993, pp. 281-284
HYDROGEN PASSIVATION OF GRAIN-BOUNDARY DEFECTS IN POLYCRYSTALLINE SILICON THIN-FILMS
Authors: NICKEL NH JOHNSON NM JACKSON WB
Citation: Nh. Nickel et al., HYDROGEN PASSIVATION OF GRAIN-BOUNDARY DEFECTS IN POLYCRYSTALLINE SILICON THIN-FILMS, Applied physics letters, 62(25), 1993, pp. 3285-3287
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