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Results:
1-11
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Results: 11
Authors:
MURRAY CE
NOYAN IC
Citation: Ce. Murray et Ic. Noyan, COMMENT ON AN ANALYSIS TECHNIQUE FOR EXTRACTION OF THIN-FILM STRESSESFROM X-RAY DATA [APPL. PHYS. LETT. 71, 2949 (1997)], Applied physics letters, 73(21), 1998, pp. 3165-3166
Authors:
NOYAN IC
JORDANSWEET J
LINIGER EG
KALDOR SK
Citation: Ic. Noyan et al., CHARACTERIZATION OF SUBSTRATE THIN-FILM INTERFACES WITH X-RAY MICRODIFFRACTION/, Applied physics letters, 72(25), 1998, pp. 3338-3340
Authors:
WANG PC
CARGILL GS
NOYAN IC
HU CK
Citation: Pc. Wang et al., ELECTROMIGRATION-INDUCED STRESS IN ALUMINUM CONDUCTOR LINES MEASURED BY X-RAY MICRODIFFRACTION, Applied physics letters, 72(11), 1998, pp. 1296-1298
Authors:
CHIDAMBARRAO D
SONG YC
NOYAN IC
Citation: D. Chidambarrao et al., NUMERICAL-SIMULATION OF THE X-RAY STRESS-ANALYSIS TECHNIQUE IN POLYCRYSTALLINE MATERIALS UNDER ELASTIC LOADING, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 28(12), 1997, pp. 2515-2525
Authors:
NOYAN IC
SHAW TM
GOLDSMITH CC
Citation: Ic. Noyan et al., INHOMOGENEOUS STRAIN STATES IN SPUTTER-DEPOSITED TUNGSTEN THIN-FILMS, Journal of applied physics, 82(9), 1997, pp. 4300-4302
Authors:
MURRAY CE
NOYAN IC
Citation: Ce. Murray et Ic. Noyan, THE RELATIONSHIP BETWEEN THE GOLDEN SECTION-PHI AND THE ELASTIC-CONSTANTS OF ENSEMBLES SELECTED BY DIFFRACTION METHODS, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 73(5), 1996, pp. 1313-1321
Authors:
SONG YC
NOYAN IC
Citation: Yc. Song et Ic. Noyan, VARIATION OF THE EFFECTIVE ELASTIC-CONSTANTS IN THE SAMPLE COORDINATESYSTEM WITH TILT ANGLE (PSI) FOR X-RAY STRAIN-STRESS ANALYSIS, Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties, 73(4), 1996, pp. 1105-1112
Authors:
BONDA NR
NOYAN IC
Citation: Nr. Bonda et Ic. Noyan, EFFECT OF THE SPECIMEN SIZE IN PREDICTING THE MECHANICAL-PROPERTIES OF PBSN SOLDER ALLOYS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 19(2), 1996, pp. 208-212
Authors:
NOYAN IC
HUANG TC
YORK BR
Citation: Ic. Noyan et al., RESIDUAL-STRESS STRAIN ANALYSIS IN THIN-FILMS BY X-RAY-DIFFRACTION, Critical reviews in solid state and materials sciences, 20(2), 1995, pp. 125-177
Authors:
SCHADLER L
NOYAN IC
Citation: L. Schadler et Ic. Noyan, QUANTITATIVE MEASUREMENT OF THE STRESS TRANSFER-FUNCTION IN NICKEL POLYIMIDE THIN-FILM COPPER THIN-FILM STRUCTURES/, Applied physics letters, 66(1), 1995, pp. 22-24
Authors:
NOYAN IC
SCHADLER LS
Citation: Ic. Noyan et Ls. Schadler, CHARACTERIZATION OF INHOMOGENEOUS ELASTIC-DEFORMATION WITH X-RAY-DIFFRACTION, Metallurgical and materials transactions. A, Physical metallurgy andmaterials science, 25(2), 1994, pp. 341-347
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