Authors:
Kato, K
Nishida, M
Yamane, H
Nakamae, K
Tagami, Y
Tetsumoto, K
Citation: K. Kato et al., Glistening formation in an AcrySof lens initiated by spinodal decomposition of the polymer network by temperature change, J CAT REF S, 27(9), 2001, pp. 1493-1498
Authors:
Sudaryanto,"Nishino, T
Asaoka, S
Nakamae, K
Citation: T. Sudaryanto,"nishino et al., Incorporation of methyl groups into hard segments of segmented polyurethane: microphase separation and adhesive properties, INT J ADHES, 21(1), 2001, pp. 71-75
Authors:
Sudaryanto,"Nishino, T
Ueno, M
Asaoka, S
Nakamae, K
Citation: T. Sudaryanto,"nishino et al., Interfacial and mechanical properties of gamma-Fe2O3/segmented polyurethane/poly(vinyl chloride) composites, J APPL POLY, 82(12), 2001, pp. 3030-3035
Authors:
Nishino, T
Naito, H
Nakamura, K
Nakamae, K
Citation: T. Nishino et al., X-ray diffraction studies on the stress transfer of transversely loaded carbon fibre reinforced composite, COMPOS P A, 31(11), 2000, pp. 1225-1230
Authors:
Nakamura, Y
Okumura, H
Yoshimoto, N
Iida, T
Nagata, K
Nigo, H
Yoshitani, H
Nishino, T
Nakamae, K
Citation: Y. Nakamura et al., Silane-treated glass bead surfaces: Their characterization by atomic forcemicroscopy and their effect on the yield stress of filled poly(vinyl chloride), POLYM POL C, 8(2), 2000, pp. 123-130
Authors:
Dogru, M
Tetsumoto, K
Tagami, Y
Kato, K
Nakamae, K
Citation: M. Dogru et al., Optical and atomic force microscopy of an explanted AcrySof intraocular lens with glistenings, J CAT REF S, 26(4), 2000, pp. 571-575
Authors:
Nishino, T
Nozawa, A
Kotera, M
Nakamae, K
Citation: T. Nishino et al., In situ observation of surface deformation of polymer films by atomic force microscopy, REV SCI INS, 71(5), 2000, pp. 2094-2096
Authors:
Nishino, T
Kotera, M
Inayoshi, N
Miki, N
Nakamae, K
Citation: T. Nishino et al., Residual stress and microstructures of aromatic polyimide with different imidization processes, POLYMER, 41(18), 2000, pp. 6913-6918
Citation: K. Nakamae et al., A simple VLSI spherical particle-induced fault simulator: application to DRAM production process, MICROEL REL, 40(2), 2000, pp. 245-253
Authors:
Hoffman, AS
Stayton, PS
Bulmus, V
Chen, GH
Chen, JP
Cheung, C
Chilkoti, A
Ding, ZL
Dong, LC
Fong, R
Lackey, CA
Long, CJ
Miura, M
Morris, JE
Murthy, N
Nabeshima, Y
Park, TG
Press, OW
Shimoboji, T
Shoemaker, S
Yang, HJ
Monji, N
Nowinski, RC
Cole, CA
Priest, JH
Harris, JM
Nakamae, K
Nishino, T
Miyata, T
Citation: As. Hoffman et al., Really smart bioconjugates of smart polymers and receptor proteins, J BIOMED MR, 52(4), 2000, pp. 577-586
Citation: A. Chikamura et al., Verification of wafer test process simulation in VLSI manufacturing systemand its application, IEICE TR EL, E82C(6), 1999, pp. 1013-1017
Citation: A. Chikamura et al., Effect of 300 mm wafer transition and test processing logistics on VLSI manufacturing final test process efficiency and cost, IEICE TR EL, E82C(4), 1999, pp. 638-645
Citation: A. Chikamura et al., Effect of express lots on production dispatching rule scheduling and cost in VLSI manufacturing final test process, IEICE TR EL, E82C(1), 1999, pp. 86-93
Authors:
Nishino, T
Miki, N
Mitsuoka, Y
Nakamae, K
Saito, T
Kikuchi, T
Citation: T. Nishino et al., Elastic modulus of the crystalline regions of polyimide derived from poly(amic acid)-biphtalic dianhydride and p-phenylene diamine, J POL SC PP, 37(23), 1999, pp. 3294-3301
Citation: K. Nakamae, Special issue: IUMRS-ICA-97 - Selected papers from Symposium A: Polymer Surfaces - Structure, Property and Function, INT J ADHES, 19(5), 1999, pp. 335-335