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Results: 1-25/40
Authors:
Kaambre, T
Qian, L
Rubensson, JE
Guo, JH
Sathe, C
Nordgren, J
Palmqvist, JP
Jansson, U
Citation: T. Kaambre et al., Study of oxygen-C-60 compound formation by NEXAFS and RIXS, EUR PHY J D, 16(1-3), 2001, pp. 357-360
Authors:
Amusia, MY
Baltenkov, AS
Chernysheva, LV
Felfli, Z
Msezane, AZ
Nordgren, J
Citation: My. Amusia et al., Directed motion of electrons in gases under the action of photon flux - art. no. 052512, PHYS REV A, 6305(5), 2001, pp. 2512
Authors:
Kurmaev, EZ
Katsnelson, MI
Moewes, A
Magnuson, M
Guo, JH
Butorin, SM
Nordgren, J
Ederer, DL
Iwami, M
Citation: Ez. Kurmaev et al., Spectroscopic observation of polaron-lattice band structure in the conducting polymer polyaniline, J PHYS-COND, 13(17), 2001, pp. 3907-3912
Authors:
Guo, JH
Butorin, SM
Wassdahl, N
Warwick, T
Nordgren, J
Citation: Jh. Guo et al., The electronic structure of K6C60 studied by soft X-ray spectroscopy, J ELEC SPEC, 114, 2001, pp. 885-888
Authors:
Takata, Y
Hatsui, T
Kosugi, N
Agui, A
Magnuson, M
Sathe, C
Rubensson, JE
Nordgren, J
Citation: Y. Takata et al., Valence excitations observed in resonant soft X-ray emission spectra of K2Ni(CN)(4)center dot H2O at the Ni 2p edge, J ELEC SPEC, 114, 2001, pp. 909-913
Authors:
McGuinness, C
Smith, KE
Butorin, SM
Guo, JH
Nordgren, J
Vogt, T
Schneider, G
Reilly, J
Tu, JJ
Johnson, PD
Shuh, DK
Citation: C. Mcguinness et al., High-resolution X-ray emission and absorption study of the B 2p valence band electronic structure of MgB2, EUROPH LETT, 56(1), 2001, pp. 112-118
Authors:
Nilsson, PO
Mankefors, S
Guo, J
Nordgren, J
Debowska-Nilsson, D
Ni, WX
Hansson, GV
Citation: Po. Nilsson et al., Electronic structure of ultrathin Ge layers buried in Si(100) - art. no. 115306, PHYS REV B, 6411(11), 2001, pp. 5306
Authors:
Yablonskikh, MV
Yarmoshenko, YM
Grebennikov, VI
Kurmaev, EZ
Butorin, SM
Duda, LC
Nordgren, J
Plogmann, S
Neumann, M
Citation: Mv. Yablonskikh et al., Origin of magnetic circular dichroism in soft x-ray fluorescence of Heusler alloys at threshold excitation - art. no. 235117, PHYS REV B, 6323(23), 2001, pp. 5117
Authors:
Nyberg, M
Luo, Y
Qian, L
Rubensson, JE
Sathe, C
Ding, D
Guo, JH
Kaambre, T
Nordgren, J
Citation: M. Nyberg et al., Bond formation in titanium fulleride compounds studied through x-ray emission spectroscopy - art. no. 115117, PHYS REV B, 6311(11), 2001, pp. 5117
Authors:
Qian, L
Nyberg, M
Luo, Y
Rubensson, JE
Talyzine, AV
Sathe, C
Ding, D
Guo, JH
Hogberg, H
Kambre, T
Jansson, U
Nordgren, J
Citation: L. Qian et al., Bonding mechanism in the transition-metal fullerides studied by symmetry-selective resonant x-ray inelastic scattering - art. no. 085418, PHYS REV B, 6308(8), 2001, pp. 5418
Authors:
Magnuson, M
Butorin, SM
Guo, JH
Agui, A
Nordgren, J
Ogasawara, H
Kotani, A
Takahashi, T
Kunii, S
Citation: M. Magnuson et al., Electronic-structure investigation of CeB6 by means of soft-x-ray scattering - art. no. 075101, PHYS REV B, 6307(7), 2001, pp. 5101
Authors:
Agui, A
Guo, JH
Sathe, C
Nordgren, J
Hidaka, M
Yamada, I
Citation: A. Agui et al., Resonant OK alpha emission spectra of CuGe0(3) single-crystal, SOL ST COMM, 118(12), 2001, pp. 619-622
Authors:
Mankefors, S
Nilsson, PO
Kanski, J
Andersson, T
Karlsson, K
Agui, A
Sathe, C
Guo, JH
Nordgren, J
Citation: S. Mankefors et al., Theoretical investigation of the thickness dependence of soft-x-ray emission from thin AlAs(100) layers buried in GaAs, PHYS REV B, 61(8), 2000, pp. 5540-5545
Authors:
Guo, JH
Butorin, SM
Wassdahl, N
Nordgren, J
Berastegut, P
Johansson, LG
Citation: Jh. Guo et al., Electronic structure of YBa2Cu3Ox and YBa2Cu4O8 studied by soft-x-ray absorption and emission spectroscopies, PHYS REV B, 61(13), 2000, pp. 9140-9144
Authors:
Butorin, SM
Guo, JH
Wassdahl, N
Nordgren, J
Citation: Sm. Butorin et al., The character of doped holes in La1.9Sr0.1CuO4: polarization-dependent x-ray fluorescence study at the OK edge, J PHYS-COND, 12(28), 2000, pp. L463-L470
Authors:
Nordgren, J
Guo, JH
Citation: J. Nordgren et Jh. Guo, Instrumentation for soft X-ray emission spectroscopy, J ELEC SPEC, 110(1-3), 2000, pp. 1-13
Authors:
Guo, JH
Skytt, P
Wassdahl, N
Nordgren, J
Citation: Jh. Guo et al., In situ and ex situ characterization of thin films by soft X-ray emission spectroscopy, J ELEC SPEC, 110(1-3), 2000, pp. 41-67
Authors:
Guo, JH
Nordgren, J
Citation: Jh. Guo et J. Nordgren, Resonant CK alpha X-ray emission of some carbon allotropes and organic compounds, J ELEC SPEC, 110(1-3), 2000, pp. 105-134
Authors:
Duda, LC
Nordgren, J
Drager, G
Bocharov, S
Kirchner, T
Citation: Lc. Duda et al., Polarized resonant inelastic X-ray scattering from single-crystal transition metal oxides, J ELEC SPEC, 110(1-3), 2000, pp. 275-285
Authors:
Nordgren, J
Citation: J. Nordgren, Special issue - Soft X-ray emission spectroscopy - Preface, J ELEC SPEC, 110(1-3), 2000, pp. IX-X
Authors:
Agui, A
Sathe, C
Guo, JH
Nordgren, J
Mankefors, S
Nilsson, PO
Kanski, J
Andersson, TG
Karlsson, K
Citation: A. Agui et al., Direct observation of interface effects of thin AlAs(100) layers buried inGaAs, APPL SURF S, 166(1-4), 2000, pp. 309-312
Authors:
Yin, H
Wang, M
Strom, M
Nordgren, J
Citation: H. Yin et al., Study of a wave-front-dividing interferometer for Fourier transform spectroscopy, NUCL INST A, 451(2), 2000, pp. 529-539
Authors:
Yablonskikh, MV
Grebennikov, VI
Yarmoshenko, YM
Kurmaev, EZ
Butorin, SM
Duda, LC
Sathe, C
Kaambre, T
Magnuson, M
Nordgren, J
Plogmann, S
Neumann, M
Citation: Mv. Yablonskikh et al., Magnetic circular dichroism in X-ray fluorescence of Heusler alloys at threshold excitation, SOL ST COMM, 117(2), 2000, pp. 79-82
Authors:
Bliman, S
Cornille, M
Huber, BA
Lebius, H
Langereis, A
Nordgren, J
Bruch, R
Citation: S. Bliman et al., Collision spectroscopy of Ar8++H-2 at low velocities (upsilon < 1 a.u.), PHYS REV A, 60(4), 1999, pp. 2799-2807
Authors:
Langereis, A
Nordgren, J
Bliman, S
Cornille, M
Bruch, R
Phaneuf, RA
Schneider, D
Citation: A. Langereis et al., Experimental study of single- and double-electron transfer in slow Ne8++Hecollisions using photon and electron spectroscopy, PHYS REV A, 60(4), 1999, pp. 2917-2930