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Results:
1-8
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Results: 8
Authors:
Volk, CP
Novikov, YA
Ozerin, YV
Rakov, AV
Citation: Cp. Volk et al., Accuracy of measurement of microrelief dimensions from a scanning electronmicroscope image of a cleavage, MEAS TECH R, 44(4), 2001, pp. 365-369
Authors:
Gornev, ES
Novikov, YA
Plotnikov, YI
Rakov, AV
Citation: Es. Gornev et al., Scanning force microscope measurement of the parameters of the profiles ofsubmillimeter VLSI components, MEAS TECH R, 44(1), 2001, pp. 44-48
Authors:
Shantarovich, VP
Novikov, YA
Suptel, ZK
Kevdina, IB
Masuda, T
Khotimskii, VS
Yampolskii, YP
Citation: Vp. Shantarovich et al., Influence of deformation and chemical structure on elementary free volumesin glassy polymers, RADIAT PH C, 58(5-6), 2000, pp. 513-520
Authors:
Volk, CP
Novikov, YA
Rakov, AV
Citation: Cp. Volk et al., SEM calibration in the micrometer and submicrometer ranges by means of a periodic linear measure, MEAS TECH R, 43(4), 2000, pp. 346-352
Authors:
Shantarovich, VP
Novikov, YA
Suptel, ZK
Oleinik, EF
Boyce, MC
Citation: Vp. Shantarovich et al., The influence of deformation and chemical composition on elementary free volumes in glassy polymers, ACT PHY P A, 95(4), 1999, pp. 659-662
Authors:
Novikov, YA
Rakov, AV
Citation: Ya. Novikov et Av. Rakov, Metrology of VLSI critical element sizes, MEAS TECH R, 42(1), 1999, pp. 20-26
Authors:
Shantarovich, VP
Novikov, YA
Oleinik, EF
Arzhakov, MS
Suptel', ZK
Salamatina, OB
Kevdina, IB
Citation: Vp. Shantarovich et al., Positron annihilation studies of the effect of composition and external actions on free volume in glassy polymers, VYSO SOED, 41(7), 1999, pp. 1138-1150
Authors:
Kirkinskii, VA
Novikov, YA
Citation: Va. Kirkinskii et Ya. Novikov, A new approach to theoretical modelling of nuclear fusion in palladium deuteride, EUROPH LETT, 46(4), 1999, pp. 448-453
Risultati:
1-8
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