AAAAAA

   
Results: 1-22 |
Results: 22

Authors: SEKO T ONDA N
Citation: T. Seko et N. Onda, ANALYSIS OF VOCS IN AIR BY AUTOMATED TUBE SAMPLING AND THERMAL-DESORPTION GC-MS, Analytical sciences, 13, 1997, pp. 437-442

Authors: FANCIULLI M WEYER G CHEVALLIER J VONKANEL H DELLER H ONDA N MIGLIO L TAVAZZA F CELINO M
Citation: M. Fanciulli et al., SELF-ORGANIZED LAYERED STRUCTURE IN EPITAXIALLY STABILIZED FESI, Europhysics letters, 37(2), 1997, pp. 139-144

Authors: VONKANEL H MULLER E GONCALVESCONTO S SCHWARZ C ONDA N
Citation: H. Vonkanel et al., STRUCTURAL-PROPERTIES OF EPITAXIAL SILICIDE LAYERS ON SI, Applied surface science, 104, 1996, pp. 204-212

Authors: ONDA N
Citation: N. Onda, A NEW APPROACH TO EXTENDING THE DYNAMIC-RANGE IN INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY, Tohoku Journal of Experimental Medicine, 178(1), 1996, pp. 91-99

Authors: FANCIULLI M ROSENBLAD C WEYER G VONKANEL H ONDA N
Citation: M. Fanciulli et al., CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY STUDY OF IRON DISILICIDE FILMS GROWN BY MBE, Thin solid films, 275(1-2), 1996, pp. 8-11

Authors: KORNER N BECK E DOMMANN A ONDA N RAMM J
Citation: N. Korner et al., HYDROGEN PLASMA CHEMICAL CLEANING OF METALLIC SUBSTRATES AND SILICON-WAFERS, Surface & coatings technology, 77(1-3), 1995, pp. 731-737

Authors: WHITEAKER KL ROBINSON IK BENSON C SMILGIES DM ONDA N VONKANEL H
Citation: Kl. Whiteaker et al., DISORDERED STRUCTURE OF CUBIC IRON SILICIDE FILMS ON SI(111), Physical review. B, Condensed matter, 51(15), 1995, pp. 9715-9721

Authors: FANCIULLI M WEYER G VONKANEL H ONDA N
Citation: M. Fanciulli et al., CONVERSION ELECTRON MOSSBAUER-SPECTROSCOPY STUDY OF IRON SILICIDE FILMS GROWN BY MBE, Physica scripta. T, 54, 1994, pp. 16-19

Authors: VONKANEL H MENDIK M MADER KA ONDA N GONCALVESCONTO S SCHWARZ C MALEGORI G MIGLIO L MARABELLI F
Citation: H. Vonkanel et al., ELASTIC AND VIBRATIONAL PROPERTIES OF PSEUDOMORPHIC FESI FILMS, Physical review. B, Condensed matter, 50(6), 1994, pp. 3570-3576

Authors: MO YJ VONKANEL H ONDA N WACHTER P MATTEI G
Citation: Yj. Mo et al., A STUDY OF EPITAXIALLY STABILIZED FESI2 BY SURFACE-ENHANCED RAMAN-SCATTERING, Journal of applied physics, 76(3), 1994, pp. 1968-1972

Authors: SCHWARZ C ONDA N GONCALVESCONTO S SIRRINGHAUS H VONKANEL H PIXLEY RE
Citation: C. Schwarz et al., ION CHANNELING STUDIES OF EPITAXIAL FE AND CO SILICIDES ON SI, Journal of applied physics, 76(11), 1994, pp. 7256-7264

Authors: MENDIK M FRAIT Z VONKANEL H ONDA N
Citation: M. Mendik et al., FERROMAGNETIC-RESONANCE AND BRILLOUIN LIGHT-SCATTERING FROM EPITAXIALFEXSI1-X FILMS ON SI(111) (ABSTRACT), Journal of applied physics, 76(10), 1994, pp. 6897-6897

Authors: MULLER E GRINDATTO DP NISSEN HU ONDA N VONKANEL H
Citation: E. Muller et al., HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPIC STUDY OF THE GAMMA-FESI2 SI(111) INTERFACE, Applied physics letters, 64(15), 1994, pp. 1938-1940

Authors: ONDA N SIRRINGHAUS H GONCALVESCONTO S SCHWARZ C ZEHNDER S VONKANEL H
Citation: N. Onda et al., EPITAXY OF CUBIC IRON SILICIDES ON SI(111), Applied surface science, 73, 1993, pp. 124-130

Authors: VONKANEL H ONDA N SIRRINGHAUS H MULLERGUBLER E GONCALVESCONTO S SCHWARZ C
Citation: H. Vonkanel et al., EPITAXIAL PHASE-TRANSITIONS IN THE IRON SILICON SYSTEM, Applied surface science, 70-1, 1993, pp. 559-563

Authors: SIRRINGHAUS H ONDA N MULLERGUBLER E MULLER P STALDER R VONKANEL H
Citation: H. Sirringhaus et al., PHASE-TRANSITION FROM PSEUDOMORPHIC FESI2 TO BETA-FESI2 SI(111) STUDIED BY INSITU SCANNING-TUNNELING-MICROSCOPY/, Physical review. B, Condensed matter, 47(16), 1993, pp. 10567-10577

Authors: SIRRINGHAUS H ONDA N MULLERGUBLER E MULLER P ZEHNDER S VONKANEL H
Citation: H. Sirringhaus et al., FUNDAMENTAL PHENOMENA IN HETEROEPITAXIAL GROWTH STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 287, 1993, pp. 1019-1024

Authors: GUIZZETTI G MARABELLI F ONDA N VONKANEL H
Citation: G. Guizzetti et al., OPTICAL CHARACTERISTIC OF EPITAXIAL PSEUDOMORPHIC FESI2, Solid state communications, 86(4), 1993, pp. 217-219

Authors: ONDA N SIRRINGHAUS H MULLER E VONKANEL H
Citation: N. Onda et al., STRUCTURAL AND ELECTRONIC-PROPERTIES OF PSEUDOMORPHIC FESI1+X FILMS ON SI(111), Journal of crystal growth, 127(1-4), 1993, pp. 634-637

Authors: SCHWARZ C SCHARER U SUTTER P STALDER R ONDA N VONKANEL H
Citation: C. Schwarz et al., APPLICATION OF EPITAXIAL COSI2 SI/COSI2 HETEROSTRUCTURES TO TUNABLE SCHOTTKY-BARRIER DETECTORS/, Journal of crystal growth, 127(1-4), 1993, pp. 659-662

Authors: PATRINI M MARABELLI F ONDA N VONKANEL H
Citation: M. Patrini et al., SPECTROSCOPIC ELLIPSOMETRY OF FESI FILMS, Helvetica Physica Acta, 66(4), 1993, pp. 421-422

Authors: KUWATA S TANAKA J ONDA N YAMADA T MIYAZAWA T SUGIURA M IN Y DOI M INOUE M ISHIDA T
Citation: S. Kuwata et al., X-RAY STRUCTURAL INVESTIGATION OF THE CHIRAL RECOGNITION OF BRUCINE IN SALT FORMATION WITH AN N-PROTECTED AMINO-ACID, N-PHTHALOYL-THREO-BETA-HYDROXY-D-LEUCINE AND L-LEUCINE, Bulletin of the Chemical Society of Japan, 66(5), 1993, pp. 1501-1510
Risultati: 1-22 |