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Results: 1-15 |
Results: 15
TIME-RESOLVED INFRARED RADIOMETRY WITH STEP HEATING - A REVIEW
Authors: OSIANDER R SPICER JWM
Citation: R. Osiander et Jwm. Spicer, TIME-RESOLVED INFRARED RADIOMETRY WITH STEP HEATING - A REVIEW, Revue generale de thermique, 37(8), 1998, pp. 680-692
DEVELOPMENT OF MINIATURE MAGNETOMETERS
Authors: WICKENDEN DK KISTENMACHER TJ OSIANDER R ECELBERGER SA BENGIVENS R MURPHY JC
Citation: Dk. Wickenden et al., DEVELOPMENT OF MINIATURE MAGNETOMETERS, Johns Hopkins APL technical digest, 18(2), 1997, pp. 271-278
COMPARISON OF TIME-RESOLVED THERMOGRAPHY AND SHEAROGRAPHY FOR NDE
Authors: SPICER JWM OSIANDER R CHAMPION JL SPICER JB
Citation: Jwm. Spicer et al., COMPARISON OF TIME-RESOLVED THERMOGRAPHY AND SHEAROGRAPHY FOR NDE, Progress in Natural Science, 6, 1996, pp. 72-75
TIME-RESOLVED INFRARED RADIOMETRY FOR SUBSURFACE INTERFACE IMAGING
Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., TIME-RESOLVED INFRARED RADIOMETRY FOR SUBSURFACE INTERFACE IMAGING, Progress in Natural Science, 6, 1996, pp. 154-157
MICROWAVE-SOURCE TIME-RESOLVED INFRARED RADIOMETRY FOR MONITORING OF CURING AND DEPOSITION PROCESSES
Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., MICROWAVE-SOURCE TIME-RESOLVED INFRARED RADIOMETRY FOR MONITORING OF CURING AND DEPOSITION PROCESSES, Progress in Natural Science, 6, 1996, pp. 181-184
TIME-RESOLVED MICROWAVE THERMOREFLECTOMETRY FOR EVALUATION OF DIELECTRIC-METAL INTERFACES
Authors: SPICER JWM OSIANDER R MURPHY JC CHANG Y HILDEBRAND R
Citation: Jwm. Spicer et al., TIME-RESOLVED MICROWAVE THERMOREFLECTOMETRY FOR EVALUATION OF DIELECTRIC-METAL INTERFACES, Progress in Natural Science, 6, 1996, pp. 239-242
TIME-DEPENDENT THERMAL-DIFFUSIVITY AND ITS APPLICATION TO PHOTOTHERMAL EXPERIMENTS
Authors: OSIANDER R KORPIUN P
Citation: R. Osiander et P. Korpiun, TIME-DEPENDENT THERMAL-DIFFUSIVITY AND ITS APPLICATION TO PHOTOTHERMAL EXPERIMENTS, Progress in Natural Science, 6, 1996, pp. 653-656
TIME-RESOLVED SHEAROGRAPHIC AND THERMOGRAPHIC NDE METHODS FOR GRAPHITE EPOXY HONEYCOMB COMPOSITE/
Authors: SPICER JB CHAMPION JL OSIANDER R SPICER JWM
Citation: Jb. Spicer et al., TIME-RESOLVED SHEAROGRAPHIC AND THERMOGRAPHIC NDE METHODS FOR GRAPHITE EPOXY HONEYCOMB COMPOSITE/, Materials evaluation, 54(10), 1996, pp. 1210-1213
A MICROELECTROMECHANICAL-BASED MAGNETOSTRICTIVE MAGNETOMETER
Authors: OSIANDER R ECELBERGER SA GIVENS RB WICKENDEN DK MURPHY JC KISTENMACHER TJ
Citation: R. Osiander et al., A MICROELECTROMECHANICAL-BASED MAGNETOSTRICTIVE MAGNETOMETER, Applied physics letters, 69(19), 1996, pp. 2930-2931
A HIGH-SENSITIVITY, WIDE DYNAMIC-RANGE MAGNETOMETER DESIGNED ON A XYLOPHONE RESONATOR
Authors: GIVENS RB MURPHY JC OSIANDER R KISTENMACHER TJ WICKENDEN DK
Citation: Rb. Givens et al., A HIGH-SENSITIVITY, WIDE DYNAMIC-RANGE MAGNETOMETER DESIGNED ON A XYLOPHONE RESONATOR, Applied physics letters, 69(18), 1996, pp. 2755-2757
TIME-DEPENDENT TEMPERATURE DISTRIBUTIONS FOR NONDESTRUCTIVE PROBING OF MATERIAL PROPERTIES
Authors: SPICER JWM OSIANDER R
Citation: Jwm. Spicer et R. Osiander, TIME-DEPENDENT TEMPERATURE DISTRIBUTIONS FOR NONDESTRUCTIVE PROBING OF MATERIAL PROPERTIES, Johns Hopkins APL technical digest, 16(3), 1995, pp. 278-287
THERMAL NONDESTRUCTIVE EVALUATION USING MICROWAVE SOURCES
Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., THERMAL NONDESTRUCTIVE EVALUATION USING MICROWAVE SOURCES, Materials evaluation, 53(8), 1995, pp. 942-948
CHARACTERIZATION OF BACK SURFACE-MORPHOLOGY FOR CORROSION DETECTION USING PATTERNED HEAT-SOURCES
Authors: SPICER JWM OSIANDER R AAMODT LC MURPHY JC
Citation: Jwm. Spicer et al., CHARACTERIZATION OF BACK SURFACE-MORPHOLOGY FOR CORROSION DETECTION USING PATTERNED HEAT-SOURCES, Journal de physique. IV, 4(C7), 1994, pp. 59-62
MICROWAVE-INDUCED TIME-RESOLVED INFRARED RADIOMETRY FOR SUBSURFACE DEFECT DETECTION AND CHARACTERIZATION
Authors: OSIANDER R SPICER JWM MURPHY JC
Citation: R. Osiander et al., MICROWAVE-INDUCED TIME-RESOLVED INFRARED RADIOMETRY FOR SUBSURFACE DEFECT DETECTION AND CHARACTERIZATION, Journal de physique. IV, 4(C7), 1994, pp. 563-566
OPTICAL BEAM DEFLECTION IMAGING OF THE ELECTRON-BEAM INTERACTION VOLUME IN SEMICONDUCTORS
Authors: CHANG GY GIVENS RB SPICER JWM OSIANDER R MURPHY JC
Citation: Gy. Chang et al., OPTICAL BEAM DEFLECTION IMAGING OF THE ELECTRON-BEAM INTERACTION VOLUME IN SEMICONDUCTORS, Applied physics letters, 63(5), 1993, pp. 645-647
Risultati: 1-15 |