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Results: 26-44/44
Authors:
HULT M
PERSSON L
ELBOUANANI M
ANDERSSON M
OSTLING M
LUNDBERG N
ZARING C
GEORGSSON K
COHEN DD
DYTLEWSKI N
JOHNSTON PN
WALKER SR
Citation: M. Hult et al., FORMATION OF THIN-FILMS OF COSI2 ON GAAS, Journal of applied physics, 77(6), 1995, pp. 2435-2443
Authors:
TORNBLAD O
BREITHOLTZ B
OSTLING M
LINDEFELT U
Citation: O. Tornblad et al., THE INFLUENCE OF EMITTER PROPERTIES ON THE HEAT-GENERATION IN SIC ANDSI PIN DIODES UNDER FORWARD CONDUCTION, Physica scripta. T, 54, 1994, pp. 60-64
Authors:
LUNDBERG N
OSTLING M
Citation: N. Lundberg et M. Ostling, COBALT DISILICIDE (COSI2) SCHOTTKY CONTACTS TO 6H-SIC, Physica scripta. T, 54, 1994, pp. 273-277
Authors:
ZETTERLING CM
OSTLING M
Citation: Cm. Zetterling et M. Ostling, THERMAL-OXIDATION OF N-TYPE AND P-TYPE 6H SILICON-CARBIDE, Physica scripta. T, 54, 1994, pp. 291-293
Authors:
ERLESAND U
OSTLING M
Citation: U. Erlesand et M. Ostling, PROPERTIES OF IRON SILICIDE CONTACTS TO N-TYPE AND P-TYPE SILICON, Physica scripta. T, 54, 1994, pp. 300-304
Authors:
WALKER SR
JOHNSTON PN
BUBB IF
STANNARD WB
COHEN DD
DYTLEWSKI N
HULT M
WHITLOW HJ
ZARING C
OSTLING M
ANDERSSON M
Citation: Sr. Walker et al., MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY OF MOCVD GROWN ALXGA1-XAS, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 353(1-3), 1994, pp. 563-567
Authors:
ELBOUANANI M
HULT M
PERSSON L
SWIETLICKI E
ANDERSSON M
OSTLING M
LUNDBERG N
ZARING C
COHEN DD
DYTLEWSKI N
JOHNSTON PN
WALKER SR
BUBB IF
WHITLOW HJ
Citation: M. Elbouanani et al., MULTIVARIATE-ANALYSIS METHOD FOR ENERGY CALIBRATION AND IMPROVED MASSASSIGNMENT IN RECOIL SPECTROMETRY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 94(4), 1994, pp. 530-536
Authors:
JOHNSTON PN
WALKER SR
BUBB IF
COHEN DD
DYTLEWSKI N
HULT M
WHITLOW HJ
ZARING C
OSTLING M
ANDERSSON M
Citation: Pn. Johnston et al., MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY OF SIXGE1-X GROWN BY ELECTRON-BEAM EVAPORATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 907-910
Authors:
HULT M
WHITLOW HJ
OSTLING M
LUNDBERG N
ZARING C
COHEN DD
DYTLEWSKI N
JOHNSTON PN
WALKER SR
Citation: M. Hult et al., RBS AND RECOIL SPECTROMETRY ANALYSIS OF COSI2 FORMATION ON GAAS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 916-920
Authors:
HUDNER J
OHLSEN H
OSTLING M
STOLT L
NORLING P
Citation: J. Hudner et al., STUDIES OF YBA2CU3O(7-X) FORMATION IN COEVAPORATED Y-BAF2-CU-O THIN-FILMS ON SAPPHIRE SUBSTRATES, Thin solid films, 247(2), 1994, pp. 213-225
Authors:
TORNEVIK C
GOTHELID M
HAMMAR M
KARLSSON UO
NILSSON NG
FLODSTROM SA
WIGREN C
OSTLING M
Citation: C. Tornevik et al., ADSORPTION OF SN ON SI(111)7X7 - RECONSTRUCTIONS IN THE MONOLAYER REGIME, Surface science, 314(2), 1994, pp. 179-187
Authors:
HULT M
WHITLOW HJ
OSTLING M
ANDERSSON M
ANDERSSON Y
LINDEBERG I
STAHL K
Citation: M. Hult et al., RAPID THERMAL ANNEALING-INDUCED REACTIONS OF CO GAAS THIN-FILM STRUCTURES - STUDIES USING MASS AND ENERGY-DISPERSIVE RECOIL SPECTROMETRY/, Journal of applied physics, 75(2), 1994, pp. 835-843
Authors:
ZHANG SL
OSTLING M
NORSTROM H
ARNBORG T
Citation: Sl. Zhang et al., ON CONTACT RESISTANCE MEASUREMENT USING 4-TERMINAL KELVIN STRUCTURES IN ADVANCED DOUBLE-POLYSILICON BIPOLAR-TRANSISTOR PROCESSES, I.E.E.E. transactions on electron devices, 41(8), 1994, pp. 1414-1420
Authors:
THOMAS O
HUDNER J
OSTLING M
MOSSANG E
CHENEVIER B
WEISS F
BOURSIER D
SENATEUR JP
Citation: O. Thomas et al., GROWTH AND PROPERTIES OF MOCVD YBA2CU3O7-X THIN-FILMS, Journal of alloys and compounds, 195(1-2), 1993, pp. 287-290
Authors:
ERLESAND U
OSTLING M
Citation: U. Erlesand et M. Ostling, DOPANT REDISTRIBUTION DURING THE FORMATION OF IRON SILICIDES, Applied surface science, 73, 1993, pp. 186-196
Authors:
KARLIN TE
ZHANG SL
RYDEN KH
NYGREN S
OSTLING M
DHEURLE FM
Citation: Te. Karlin et al., ELECTRICAL EVALUATION OF HIGH-TEMPERATURE EFFECTS ON GATE OXIDE INTEGRITY IN A SELF-ALIGNED COSI2 MOS PROCESS, Applied surface science, 73, 1993, pp. 277-279
Authors:
LUNDBERG N
ZETTERLING CM
OSTLING M
Citation: N. Lundberg et al., TEMPERATURE STABILITY OF COBALT SCHOTTKY CONTACTS ON N-TYPE AND P-TYPE 6H SILICON-CARBIDE, Applied surface science, 73, 1993, pp. 316-321
Authors:
HUDNER J
THOMAS O
MOSSANG E
CHAUDOUET P
WEISS F
BOURSIER D
SENATEUR JP
OSTLING M
GASKOV A
Citation: J. Hudner et al., THIN-FILM GROWTH AND COMPOSITIONAL EFFECTS IN YBA2CU3O7-X LAYERS PREPARED BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 74(7), 1993, pp. 4631-4642
Authors:
LUNDBERG N
OSTLING M
Citation: N. Lundberg et M. Ostling, FORMATION AND CHARACTERIZATION OF COBALT 6H-SILICON CARBIDE SCHOTTKY CONTACTS, Applied physics letters, 63(22), 1993, pp. 3069-3071