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Citation: Jd. Park et Ts. Oh, Thickness dependence of the ferroelectric characteristics of SBT and SBTN thin films, INTEGR FERR, 33(1-4), 2001, pp. 235-244
Citation: Jw. Choi et Ts. Oh, Peel strength and peel angle measured by the T-peel test on Cr/BPDA-PDA interfaces, J ADHES SCI, 15(2), 2001, pp. 139-152
Citation: Ds. Park et al., Effect of Nd : YAG laser irradiation on the apical leakage of obturated root canals: an electrochemical study, INT ENDOD J, 34(4), 2001, pp. 318-321
Citation: Db. Hyun et al., Thermoelectric properties of (Bi0.25Sb0.75)(2)Te-3 alloys fabricated by hot-pressing method, J MATER SCI, 36(5), 2001, pp. 1285-1291
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Citation: Jd. Park et Ts. Oh, Preparation of Pt/SrBi2Ta2O9/TiO2/Si structures for metal-ferroelectric-insulator-semiconductor field-effect-transistors, J KOR PHYS, 37(6), 2000, pp. 1072-1076
Citation: Jd. Park et Ts. Oh, Effects of the Sr content on the ferroelectric characteristics of SrxBi2.4Ta2O9 films, J MAT SCI L, 19(19), 2000, pp. 1693-1696
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Citation: Js. Choi et al., The Crystalline quality of InxAl1-xAs layers on lnP grown by molecular beam epitaxy at 520 degrees C, J MATER SCI, 35(3), 2000, pp. 655-660
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Citation: Db. Hyun et al., Electrical and thermoelectric properties of 90%Bi2Te3-5% Sb2Te3-5% Sb2Se3 single crystals doped with SbI3, SCR MATER, 40(1), 1998, pp. 49-56
Authors:
Hyun, DB
Hwang, JS
You, BC
Oh, TS
Hwang, CW
Citation: Db. Hyun et al., Thermoelectric properties of the n-type 85%Bi2Te3-15%Bi2Se3 alloys doped with SbI3 and CuBr, J MATER SCI, 33(23), 1998, pp. 5595-5600