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Results: 1-14 |
Results: 14
Fault detection and feature analysis in interferometric fringe patterns bythe application of wavelet filters in convolution processors
Authors: Kruger, S Wernicke, G Osten, W Kayser, D Demoli, N Gruber, H
Citation: S. Kruger et al., Fault detection and feature analysis in interferometric fringe patterns bythe application of wavelet filters in convolution processors, J ELECTR IM, 10(1), 2001, pp. 228-233
Microcomponents requirement measurement techniques for determination of physical parameters
Authors: Osten, W Beumler, K
Citation: W. Osten et K. Beumler, Microcomponents requirement measurement techniques for determination of physical parameters, TEC MES, 68(2), 2001, pp. 55-56
The metrological basis for the inspection of microcomponents by Digital Holography
Authors: Osten, W Seebacher, S Baumbach, T Juptner, W
Citation: W. Osten et al., The metrological basis for the inspection of microcomponents by Digital Holography, TEC MES, 68(2), 2001, pp. 68-79
A measurement system for the determination of material properties of microcomponents on the basis of digital holography
Authors: Osten, W Seebacher, S Baumbach, T Juptner, W
Citation: W. Osten et al., A measurement system for the determination of material properties of microcomponents on the basis of digital holography, TEC MES, 68(2), 2001, pp. 80-85
Optical microsystems metrology - Part II
Authors: Osten, W
Citation: W. Osten, Optical microsystems metrology - Part II, OPT LASER E, 36(5), 2001, pp. 401-402
Inspection of nano-sized SNOM-tips by optical far-field evaluation
Authors: Seebacher, S Osten, W Veiko, VP Voznessenski, NB
Citation: S. Seebacher et al., Inspection of nano-sized SNOM-tips by optical far-field evaluation, OPT LASER E, 36(5), 2001, pp. 451-473
Optical microsystems metrology
Authors: Osten, W
Citation: W. Osten, Optical microsystems metrology, OPT LASER E, 36(2), 2001, pp. 75-76
The determination of material parameters of microcomponents using digital holography
Authors: Seebacher, S Osten, W Baumbach, T Juptner, W
Citation: S. Seebacher et al., The determination of material parameters of microcomponents using digital holography, OPT LASER E, 36(2), 2001, pp. 103-126
Direct shape measurement by digital wavefront reconstruction and multiwavelength contouring
Authors: Wagner, C Osten, W Seebacher, S
Citation: C. Wagner et al., Direct shape measurement by digital wavefront reconstruction and multiwavelength contouring, OPT ENG, 39(1), 2000, pp. 79-85
Application of optical shape measurement for the nondestructive evaluationof complex objects
Authors: Osten, W
Citation: W. Osten, Application of optical shape measurement for the nondestructive evaluationof complex objects, OPT ENG, 39(1), 2000, pp. 232-243
Analysis and modeling of technical surfaces with combinative laser metrology
Authors: Osten, W
Citation: W. Osten, Analysis and modeling of technical surfaces with combinative laser metrology, TEC MES, 66(11), 1999, pp. 411-412
Highly-resolved measurement of extended technical surfaces with scalable topometry
Authors: Osten, W Andra, P Kayser, D
Citation: W. Osten et al., Highly-resolved measurement of extended technical surfaces with scalable topometry, TEC MES, 66(11), 1999, pp. 413-428
Non-linear speckle phase changes in the image plane caused by out of planedisplacement
Authors: Kolenovic, E Osten, W Juptner, W
Citation: E. Kolenovic et al., Non-linear speckle phase changes in the image plane caused by out of planedisplacement, OPT COMMUN, 171(4-6), 1999, pp. 333-344
Digital recording and numerical reconstruction of lensless Fourier holograms in optical metrology
Authors: Wagner, C Seebacher, S Osten, W Juptner, W
Citation: C. Wagner et al., Digital recording and numerical reconstruction of lensless Fourier holograms in optical metrology, APPL OPTICS, 38(22), 1999, pp. 4812-4820
Risultati: 1-14 |