Citation: G. Palasantzas et al., INTERFACE ROUGHNESS FRACTALITY EFFECTS ON THE ELECTRON-MOBILITY IN SEMICONDUCTING QUANTUM-WELLS, Physica status solidi. b, Basic research, 209(2), 1998, pp. 319-327
Authors:
ZUIDDAM MR
ROGGE S
GEERLIGS LJ
VANDERDRIFT E
ILGE B
PALASANTZAS G
Citation: Mr. Zuiddam et al., CONTACT AND ALIGNMENT MARKER TECHNOLOGY FOR ATOMIC-SCALE DEVICE FABRICATION, Microelectronic engineering, 42, 1998, pp. 567-570
Citation: G. Palasantzas, SURFACE-ROUGHNESS AND GRAIN-BOUNDARY SCATTERING EFFECTS ON THE ELECTRICAL-CONDUCTIVITY OF THIN-FILMS, Physical review. B, Condensed matter, 58(15), 1998, pp. 9685-9688
Citation: G. Palasantzas et A. Widom, ROUGHNESS EFFECTS ON THE SLIDING FRICTIONAL FORCE OF SUBMONOLAYER LIQUID-FILMS ON SOLID SUBSTRATES, Physical review. B, Condensed matter, 57(8), 1998, pp. 4764-4767
Citation: G. Palasantzas et J. Krim, EFFECT OF THE FORM OF THE HEIGHT-HEIGHT CORRELATION-FUNCTION ON DIFFUSE-X-RAY SCATTERING FROM A SELF-AFFINE SURFACE (VOL 48, PG 2873, 1993), Physical review. B, Condensed matter, 57(5), 1998, pp. 3169-3169
Citation: G. Palasantzas et G. Backx, EFFECTS ON THE FLUID INTERFACE FLUCTUATIONS DUE TO THE INTERACTION POTENTIAL FORM - EXPONENTIAL INTERACTIONS, Physical review. B, Condensed matter, 57(23), 1998, pp. 14650-14653
Authors:
ILGE B
PALASANTZAS G
DENIJS J
GEERLIGS LJ
Citation: B. Ilge et al., THE TEMPERATURE EVOLUTION OF ULTRA-THIN FILMS IN SOLID-PHASE REACTIONOF CO WITH SI(111) STUDIED BY SCANNING-TUNNELING-MICROSCOPY, Surface science, 414(1-2), 1998, pp. 279-289
Citation: G. Palasantzas, ROUGHNESS EFFECTS ON THE CRITICAL FRACTURE-TOUGHNESS OF MATERIALS UNDER UNIAXIAL-STRESS, Journal of applied physics, 83(10), 1998, pp. 5212-5216
Citation: G. Palasantzas, STATIC AND DYNAMIC ASPECTS OF THE RMS LOCAL SLOPE OF GROWING RANDOM SURFACES, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 56(1), 1997, pp. 1254-1257
Citation: G. Palasantzas et J. Barnas, SURFACE-ROUGHNESS FRACTALITY EFFECTS IN ELECTRICAL-CONDUCTIVITY OF SINGLE METALLIC AND SEMICONDUCTING-FILMS, Physical review. B, Condensed matter, 56(12), 1997, pp. 7726-7731
Citation: G. Palasantzas et G. Backx, FLUID INTERFACE FLUCTUATIONS WITHIN THE GENERALIZED DERJAGUIN APPROXIMATION, Physical review. B, Condensed matter, 56(11), 1997, pp. 6478-6481
Citation: G. Palasantzas et G. Backx, FLUCTUATION PROPERTIES OF INTERFACES AND MEMBRANES BOUNDED BY SELF-AFFINE SURFACES, Physical review. B, Condensed matter, 55(15), 1997, pp. 9371-9374
Citation: G. Palasantzas et Lj. Geerligs, ESTIMATION OF KINETIC-PROPERTIES OF PARTICLES FORMING RANDOM ROUGH SURFACES, Solid state communications, 103(10), 1997, pp. 555-558
Citation: J. Barnas et G. Palasantzas, INTERFACE ROUGHNESS EFFECTS IN THE GIANT MAGNETORESISTANCE IN MAGNETIC MULTILAYERS, Journal of applied physics, 82(8), 1997, pp. 3950-3956
Citation: G. Palasantzas, ROUGHNESS EFFECTS ON THE ELECTROSTATIC-IMAGE POTENTIAL NEAR A DIELECTRIC INTERFACE, Journal of applied physics, 82(1), 1997, pp. 351-355
Citation: G. Palasantzas, A STUDY OF (1-DIMENSIONAL HEIGHT-HEIGHT CORRELATION-FUNCTIONS FOR SELF-AFFINE FRACTAL MORPHOLOGIES(1)), Solid state communications, 100(10), 1996, pp. 705-710
Citation: J. Krim et G. Palasantzas, EXPERIMENTAL-OBSERVATIONS OF SELF-AFFINE SCALING AND KINETIC ROUGHENING AT SUBMICRON LENGTHSCALES, International journal of modern physics b, 9(6), 1995, pp. 599-632
Citation: G. Palasantzas, SELF-AFFINE CASE FOR THE ROUGHNESS EFFECT ON THE FRICTIONAL FORCE IN BOUNDARY LUBRICATION, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 50(5), 1994, pp. 4256-4257
Citation: G. Palasantzas, FREQUENCY-SHIFT OF A QUARTZ-CRYSTAL OSCILLATOR BOUNDED BY A SELF-AFFINE FRACTAL ROUGH-SURFACE IN CONTACT WITH A LIQUID, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 50(2), 1994, pp. 1682-1685