Citation: Va. Krupenin et al., INSTABILITY OF SINGLE-ELECTRON MEMORY AT LOW-TEMPERATURES IN AL ALOX/AL STRUCTURES/, Journal of experimental and theoretical physics, 84(1), 1997, pp. 190-196
Authors:
KRUPENIN VA
LOTKHOV SV
PASHKIN YA
PRESNOV DE
Citation: Va. Krupenin et al., AN EXPERIMENTAL-STUDY OF CHARGE EFFECTS I N SUPERSMALL TUNNEL-JUNCTIONS, Uspehi fiziceskih nauk, 167(5), 1997, pp. 566-568
Authors:
WOLF H
AHLERS FJ
NIEMEYER J
SCHERER H
WEIMANN T
ZORIN AB
KRUPENIN VA
LOTKHOV SV
PRESNOV DE
Citation: H. Wolf et al., INVESTIGATION OF THE OFFSET CHARGE NOISE IN SINGLE-ELECTRON TUNNELINGDEVICES, IEEE transactions on instrumentation and measurement, 46(2), 1997, pp. 303-306
Authors:
SOLDATOV ES
KHANIN VV
TRIFONOV AS
PRESNOV DE
YAKOVENKO SA
KHOMUTOV GB
GUBIN CP
KOLESOV VV
Citation: Es. Soldatov et al., SINGLE-ELECTRON TRANSISTOR BASED ON A SINGLE CLUSTER-MOLECULE AT ROOM-TEMPERATURE, JETP letters, 64(7), 1996, pp. 556-560
Authors:
ARUTYUNOV KY
LOTKHOV SV
PAVOLOTSKI AB
PRESNOV DE
RINDERER L
Citation: Ky. Arutyunov et al., ON THE REPRODUCIBILITY OF THE RESISTIVE TRANSITION ANOMALIES IN SUPERCONDUCTING NANOSTRUCTURES, Helvetica Physica Acta, 69, 1996, pp. 31-32
Authors:
ZORIN AB
KRUPENIN VA
LOTKHOV SV
NIEMEYER J
PRESNOV DE
SCHERER H
WOLF H
AHLERS FJ
WEIMAN T
Citation: Ab. Zorin et al., DETECTION OF THE SINGLE-ELECTRON TUNNELING NOISE USING COULOMB-BLOCKADE ELECTROMETER, Czechoslovak journal of Physics, 46, 1996, pp. 2281-2282