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Results: 1-17 |
Results: 17
SOFT-X-RAY PHOTOELECTRON DIFFRACTION STUDY OF EPITAXIAL INGAAS GAAS(001)/
Authors: PROIETTI MG TURCHINI S GARCIA J ARSENIO MC CASADO C MARTELLI F PROSPERI T
Citation: Mg. Proietti et al., SOFT-X-RAY PHOTOELECTRON DIFFRACTION STUDY OF EPITAXIAL INGAAS GAAS(001)/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2318-2325
X-RAY NATURAL CIRCULAR-DICHROISM
Authors: ALAGNA L PROSPERI T TURCHINI S GOULON J ROGALEV A GOULONGINET C NATOLI CR PEACOCK RD STEWART B
Citation: L. Alagna et al., X-RAY NATURAL CIRCULAR-DICHROISM, Physical review letters, 80(21), 1998, pp. 4799-4802
DIFFRACTION ANOMALOUS NEAR-EDGE STRUCTURE IN ORDERED GAINP
Authors: ALAGNA L PROSPERI T TURCHINI S FERRARI C FRANCESIO L FRANZOSI P
Citation: L. Alagna et al., DIFFRACTION ANOMALOUS NEAR-EDGE STRUCTURE IN ORDERED GAINP, Journal of applied physics, 83(7), 1998, pp. 3552-3555
SEXAFS STUDY OF THE GAAS INP INTERFACE
Authors: PROIETTI MG TURCHINI S MARTELLI F GARCIA J PROSPERI T CHANDESRIS D VOGEL J
Citation: Mg. Proietti et al., SEXAFS STUDY OF THE GAAS INP INTERFACE, Journal de physique. IV, 7(C2), 1997, pp. 697-698
XAS OF RUTHENIUM PHTHALOCYANINE DIMER - STRUCTURAL-PROPERTIES OF BULKAND FILM FORM
Authors: ALAGNA L CAPOBIANCHI A PENNESI G PROSPERI T ROSSI G
Citation: L. Alagna et al., XAS OF RUTHENIUM PHTHALOCYANINE DIMER - STRUCTURAL-PROPERTIES OF BULKAND FILM FORM, Journal de physique. IV, 7(C2), 1997, pp. 1261-1262
NATURAL CIRCULAR-DICHROISM AT THE ND L-3 EDGE IN SINGLE-CRYSTALS OF NA3ND(C4H4O5)(3)2NABF(4)6H(2)O
Authors: ALAGNA L GOULON J GOULONGINET C PEACOCK RD PROSPERI T ROGALEV A STEWART B TURCHINI S
Citation: L. Alagna et al., NATURAL CIRCULAR-DICHROISM AT THE ND L-3 EDGE IN SINGLE-CRYSTALS OF NA3ND(C4H4O5)(3)2NABF(4)6H(2)O, Journal de physique. IV, 7(C2), 1997, pp. 463-464
PHOTOELECTRON DIFFRACTION INVESTIGATION OF STRAINED INGAAS GROWN ON (001)-GAAS
Authors: PROIETTI MG TURCHINI S GARCIA J ASENSIO MC CASADO C MARTELLI F PROSPERI T
Citation: Mg. Proietti et al., PHOTOELECTRON DIFFRACTION INVESTIGATION OF STRAINED INGAAS GROWN ON (001)-GAAS, Journal de physique. IV, 7(C2), 1997, pp. 575-576
MICROSCOPIC STRUCTURE OF STRAINED INGAAS GAAS HETEROSTRUCTURES/
Authors: PROIETTI MG TURCHINI S GARCIA J LAMBLE G MARTELLI F PROSPERI T
Citation: Mg. Proietti et al., MICROSCOPIC STRUCTURE OF STRAINED INGAAS GAAS HETEROSTRUCTURES/, Solid-state electronics, 40(1-8), 1996, pp. 653-658
GLANCING ANGLE XAFS OF INAS INP AND GAAS/INP - STRAIN AND INTERFACE/
Authors: TURCHINI S PROIETTI MG MARTELLI F PROSPERI T GARCIA J
Citation: S. Turchini et al., GLANCING ANGLE XAFS OF INAS INP AND GAAS/INP - STRAIN AND INTERFACE/, Physica. B, Condensed matter, 209(1-4), 1995, pp. 557-558
HIGH-FLUX AND HIGH-RESOLUTION BEAMLINE FOR ELLIPTICALLY POLARIZED RADIATION IN THE VACUUM-ULTRAVIOLET AND SOFT-X-RAY REGIONS
Authors: DEROSSI A LAMA F PIACENTINI M PROSPERI T ZEMA N
Citation: A. Derossi et al., HIGH-FLUX AND HIGH-RESOLUTION BEAMLINE FOR ELLIPTICALLY POLARIZED RADIATION IN THE VACUUM-ULTRAVIOLET AND SOFT-X-RAY REGIONS, Review of scientific instruments, 66(2), 1995, pp. 1718-1720
GLANCING-ANGLE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF STRAINED INGAAS GAAS HETEROSTRUCTURES/
Authors: PROIETTI MG TURCHINI S GARCIA J LAMBLE G MARTELLI F PROSPERI T
Citation: Mg. Proietti et al., GLANCING-ANGLE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF STRAINED INGAAS GAAS HETEROSTRUCTURES/, Journal of applied physics, 78(11), 1995, pp. 6574-6583
EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF INAS INP AND GAAS/INP STRAINED HETEROSTRUCTURES/
Authors: PROIETTI MG TURCHINI S MARTELLI F GARCIA J PROSPERI T
Citation: Mg. Proietti et al., EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF INAS INP AND GAAS/INP STRAINED HETEROSTRUCTURES/, Journal of applied physics, 77(1), 1995, pp. 62-65
X-RAY-ABSORPTION SPECTROSCOPIC STUDY OF THE BINARY SEMICONDUCTING GLASS PBV2O6
Authors: ALAGNA L ENDREGARD M PROSPERI T TOMLINSON AG
Citation: L. Alagna et al., X-RAY-ABSORPTION SPECTROSCOPIC STUDY OF THE BINARY SEMICONDUCTING GLASS PBV2O6, Journal of materials chemistry, 4(6), 1994, pp. 943-947
STRUCTURAL AND OPTICAL-PROPERTIES OF POROUS SILICON AT DIFFERENT POROSITIES
Authors: DIFRANCIA G TURCHINI S PROSPERI T MARTELLI F AMATO G DESANTIS M
Citation: G. Difrancia et al., STRUCTURAL AND OPTICAL-PROPERTIES OF POROUS SILICON AT DIFFERENT POROSITIES, Journal of applied physics, 76(6), 1994, pp. 3787-3790
RANDOM-PHASE-APPROXIMATION CALCULATIONS OF K-EDGE ROTATIONAL STRENGTHS OF CHIRAL MOLECULES - PROPYLENE-OXIDE
Authors: ALAGNA L DIFONZO S PROSPERI T TURCHINI S LAZERETTI P MALAGOLI M ZANASI R NATOLI CR STEPHENS PJ
Citation: L. Alagna et al., RANDOM-PHASE-APPROXIMATION CALCULATIONS OF K-EDGE ROTATIONAL STRENGTHS OF CHIRAL MOLECULES - PROPYLENE-OXIDE, Chemical physics letters, 223(5-6), 1994, pp. 402-410
GLANCING ANGLE EXAFS INVESTIGATION OF INGAAS GAAS STRAINED-LAYER MULTIPLE-QUANTUM WELLS - STRAIN AND BOND DISTANCES/
Authors: TURCHINI S PROIETTI MG MARTELLI F ALAGNA L BRUNI MR PROSPERI T SIMEONE MG GARCIA J
Citation: S. Turchini et al., GLANCING ANGLE EXAFS INVESTIGATION OF INGAAS GAAS STRAINED-LAYER MULTIPLE-QUANTUM WELLS - STRAIN AND BOND DISTANCES/, JPN J A P 1, 32, 1993, pp. 419-421
MICROSCOPIC INVESTIGATION OF THE STRAIN DISTRIBUTION IN INGAAS GAAS QUANTUM-WELL STRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY/
Authors: PROIETTI MG MARTELLI F TURCHINI S ALAGNA L BRUNI MR PROSPERI T SIMEONE MG GARCIA J
Citation: Mg. Proietti et al., MICROSCOPIC INVESTIGATION OF THE STRAIN DISTRIBUTION IN INGAAS GAAS QUANTUM-WELL STRUCTURES GROWN BY MOLECULAR-BEAM EPITAXY/, Journal of crystal growth, 127(1-4), 1993, pp. 592-595
Risultati: 1-17 |