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Citation: T. Warwick et al., A variable-included-angle plane-grating-monochromator on an undulator for spectroscopy and microscopy at the Advanced Light Source, NUCL INST A, 467, 2001, pp. 525-528
Authors:
Young, AT
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Padmore, HA
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Citation: At. Young et al., First commissioning results for the elliptically polarizing undulator beamline at the Advanced Light Source, NUCL INST A, 467, 2001, pp. 549-552
Citation: Ha. Padmore et al., A double crystal monochromator using tangentially bent crystals in combination with toroidal mirror focusing, NUCL INST A, 467, 2001, pp. 650-653
Authors:
Scholl, A
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Padmore, HA
Citation: A. Scholl et al., Exploring the microscopic origin of exchange bias with photoelectron emission microscopy (invited), J APPL PHYS, 89(11), 2001, pp. 7266-7268
Authors:
Lindenberg, AM
Kang, I
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Padmore, HA
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Citation: Am. Lindenberg et al., Time-resolved X-ray diffraction from coherent phonons during a laser-induced phase transition, PHYS REV L, 84(1), 2000, pp. 111-114
Authors:
Nolting, F
Scholl, A
Stohr, J
Seo, JW
Fompeyrine, J
Siegwart, H
Locquet, JP
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Luning, J
Fullerton, EE
Toney, MF
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Padmore, HA
Citation: F. Nolting et al., Direct observation of the alignment of ferromagnetic spins by antiferromagnetic spins, NATURE, 405(6788), 2000, pp. 767-769
Citation: At. Young et al., Magnetic high-resolution spectroscopy with Beamline 4.0.1-2: An elliptically polarizing undulator beamline at the Advanced Light Source, J ELEC SPEC, 103, 1999, pp. 885-889
Authors:
Stohr, J
Scholl, A
Regan, TJ
Anders, S
Luning, J
Scheinfein, MR
Padmore, HA
White, RL
Citation: J. Stohr et al., Images of the antiferromaguetic structure of a NiO(100) surface by means of X-ray magnetic linear dichroism spectromicroscopy, PHYS REV L, 83(9), 1999, pp. 1862-1865