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Results: 1-25/34
Authors:
Palasantzas, G
de Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Wetting on rough surfaces, ACT MATER, 49(17), 2001, pp. 3533-3538
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Influence of quasi-layer-by-layer roughness on proximity effects in thin film superconducting/normal-metal junctions, PHYSICA C, 355(3-4), 2001, pp. 211-216
Authors:
Palasantzas, G
van Agterveld, DTL
Koch, SA
De Hosson, JTM
Citation: G. Palasantzas et al., Influence of electron flux on the oxidation of Ni3Al surfaces, J VAC SCI A, 19(5), 2001, pp. 2581-2585
Authors:
Palasantzas, G
Zhao, YP
Wang, GC
Lu, TM
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Electrical conductivity and thin film growth dynamics (vol B 61, pg 11 109, 2000) - art. no. 079903, PHYS REV B, 6407(7), 2001, pp. 9903-9903
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode (vol B 63, art. no. 125404, 2001) - art. no. 239901, PHYS REV B, 6323(23), 2001, pp. 9901-9901
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Roughness effects on the electrical conductivity of thin films grown in a quasi-layer-by-layer mode - art. no. 125404, PHYS REV B, 6312(12), 2001, pp. 5404
Authors:
Palasantzas, G
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Non-conformal interface roughness effects on the giant magnetoresistance in magnetic multilayers, SURF SCI, 482, 2001, pp. 1026-1029
Authors:
van Agterveld, DTL
Koch, SA
Palasantzas, G
De Hosson, JTM
Citation: Dtl. Van Agterveld et al., Ultra high vacuum scanning Auger/electron microscopy studies of oxidation and B surface segregation of in situ fractured B-doped Ni3Al alloys, SURF SCI, 482, 2001, pp. 254-259
Authors:
Koch, SA
van Agterveld, DTL
Palasantzas, G
De Hosson, JTM
Citation: Sa. Koch et al., Electron beam induced oxidation of surfaces of Ni3Al-base alloys, SURF SCI, 476(3), 2001, pp. L267-L272
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, The effect of mound roughness on the electrical capacitance of a thin insulating film, SOL ST COMM, 118(4), 2001, pp. 203-206
Authors:
Zhao, YP
Gamache, RM
Wang, GC
Lu, TM
Palasantzas, G
De Hosson, JTM
Citation: Yp. Zhao et al., Effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity, J APPL PHYS, 89(2), 2001, pp. 1325-1330
Authors:
Palasantzas, G
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Correlated roughness effects on electrical conductivity of quantum wires, J APPL PHYS, 89(12), 2001, pp. 8002-8005
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Mound surface roughness effects on the thermal capacitance of thin films, J APPL PHYS, 89(11), 2001, pp. 6130-6134
Authors:
Tsamouras, D
Palasantzas, G
De Hosson, JTM
Citation: D. Tsamouras et al., Growth front roughening of room-temperature deposited oligomer films, APPL PHYS L, 79(12), 2001, pp. 1801-1803
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Linear growth of thin films under the influence of stress, APPL PHYS L, 78(20), 2001, pp. 3044-3046
Authors:
Van Agterveld, DTL
Palasantzas, G
De Hosson, JTM
Citation: Dtl. Van Agterveld et al., Effects of precipitates in Cu upon impact fracture: An ultra-high-vacuum study with local probe scanning Auger/electron microscopy, ACT MATER, 48(8), 2000, pp. 1995-2004
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Roughness effect on the measurement of interface stress, ACT MATER, 48(14), 2000, pp. 3641-3645
Authors:
Palasantzas, G
Zhao, YP
Wang, GC
Lu, TM
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Electrical conductivity and thin-film growth dynamics, PHYS REV B, 61(16), 2000, pp. 11109-11117
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Fractality aspects during agglomeration of solid-phase-epitaxy Co-silicidethin films, J VAC SCI B, 18(5), 2000, pp. 2472-2476
Authors:
Palasantzas, G
de Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Influence of proximity effects in superconductor/normal- metal junctions from mound roughness and film growth mechanisms, PHYSICA C, 330(1-2), 2000, pp. 99-104
Authors:
Palasantzas, G
Zhao, YP
De Hosson, JTM
Wang, GC
Citation: G. Palasantzas et al., Roughness effects on magnetic properties of thin films, PHYSICA B, 283(1-3), 2000, pp. 199-202
Authors:
Palasantzas, G
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Correlated roughness effects in the giant magnetoresistance of magnetic multilayers, ACT PHY P A, 97(3), 2000, pp. 495-498
Authors:
Palasantzas, G
Barnas, J
De Hosson, TM
Citation: G. Palasantzas et al., Self-affine roughness effects on electron transmission and electric current in tunnel junctions, J APPL PHYS, 88(2), 2000, pp. 927-931
Authors:
Palasantzas, G
Backx, G
Citation: G. Palasantzas et G. Backx, Roughness-induced fluid interface fluctuations due to polar and apolar interactions, PHYS REV E, 59(1), 1999, pp. 1259-1262
Authors:
Palasantzas, G
Barnas, J
Citation: G. Palasantzas et J. Barnas, Conductivity of quantum wires with rough boundaries, PHYS ST S-B, 211(2), 1999, pp. 671-679