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Results:
1-7
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Results: 7
Authors:
Delille, D
Pantel, R
Van Cappellen, E
Citation: D. Delille et al., Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fitting, ULTRAMICROS, 87(1-2), 2001, pp. 5-18
Authors:
Pantel, R
Torres, J
Paniez, P
Auvert, G
Citation: R. Pantel et al., Physical and chemical analysis of advanced interconnections using energy filtering transmission electron microscopy, MICROEL ENG, 50(1-4), 2000, pp. 277-284
Authors:
Motte, P
Proust, M
Torres, J
Gobil, Y
Morand, Y
Palleau, J
Pantel, R
Juhel, M
Citation: P. Motte et al., TiN-CVD process optimization for integration with Cu-CVD, MICROEL ENG, 50(1-4), 2000, pp. 369-374
Authors:
Torres, J
Palleau, J
Tardiff, F
Bernard, H
Beverina, A
Motte, P
Pantel, R
Juhel, M
Citation: J. Torres et al., Overview of Cu contamination during integration in a dual damascene architecture for sub-quarter micron technology, MICROEL ENG, 50(1-4), 2000, pp. 425-431
Authors:
Jurczak, M
Skotnicki, T
Paoli, M
Tormen, B
Martins, J
Regolini, JL
Dutartre, D
Ribot, P
Lenoble, D
Pantel, R
Monfray, S
Citation: M. Jurczak et al., Silicon-on-nothing (SON) - an innovative process for advanced CMOS, IEEE DEVICE, 47(11), 2000, pp. 2179-2187
Authors:
Pantel, R
Mascarin, G
Auvert, G
Citation: R. Pantel et al., Circuit failure identification using focused ion beam and transmission electron microscopy characterisation techniques., MICROEL ENG, 49(1-2), 1999, pp. 181-189
Authors:
Jouan, S
Planche, R
Baudry, H
Ribot, P
Chroboczek, JA
Dutartre, D
Gloria, D
Laurens, M
Llinares, P
Marty, M
Monroy, A
Morin, C
Pantel, R
Perrotin, A
de Pontcharra, J
Regolini, JL
Vincent, G
Chantre, A
Citation: S. Jouan et al., A high-speed low 1/f noise SiGeHBT technology using epitaxially-aligned polysilicon emitters, IEEE DEVICE, 46(7), 1999, pp. 1525-1531
Risultati:
1-7
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