Authors:
Ghibaudo, G
Pananakakis, G
Kies, R
Vincent, E
Papadas, C
Citation: G. Ghibaudo et al., Accelerated dielectric breakdown and wear out standard testing methods andstructures for reliability evaluation of thin oxides, MICROEL REL, 39(5), 1999, pp. 597-613
Authors:
Moisiadis, Y
Bouras, I
Papadas, C
Schoellkopf, JP
Citation: Y. Moisiadis et al., Transient self back-biased buffer for low-voltage high-performance applications in standard CMOS technologies, ELECTR LETT, 35(2), 1999, pp. 112-113