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Results:
1-21
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Results: 21
Authors:
Pichon, L
Mourgues, K
Raoult, F
Mohammed-Brahim, T
Kis-Sion, K
Briand, D
Bonnaud, O
Citation: L. Pichon et al., Thin film transistors fabricated by in situ doped unhydrogenated polysilicon films obtained by solid phase crystallization, SEMIC SCI T, 16(11), 2001, pp. 918-924
Authors:
Remazeilles, C
Quillet, V
Calligaro, T
Dran, JC
Pichon, L
Salomon, J
Citation: C. Remazeilles et al., PIXE elemental mapping on original manuscripts with an external microbeam.Application to manuscripts damaged by iron-gall ink corrosion, NUCL INST B, 181, 2001, pp. 681-687
Authors:
Mercha, A
Pichon, L
Carin, R
Mourgues, K
Bonnaud, O
Citation: A. Mercha et al., Grain boundary trap passivation in polysilicon thin film transistor investigated by low frequency noise, THIN SOL FI, 383(1-2), 2001, pp. 303-306
Authors:
Mercha, A
Vandamme, LKJ
Pichon, L
Carin, R
Bonnaud, O
Citation: A. Mercha et al., Current crowding and 1/f noise in polycrystalline silicon thin film transistors, J APPL PHYS, 90(8), 2001, pp. 4019-4026
Authors:
Camelio, S
Girardeau, T
Pichon, L
Straboni, A
Fayoux, C
Guerin, P
Citation: S. Camelio et al., Transformation of the semi-transparent into the metallic phase of zirconium nitride compounds by implantation at controlled temperature: the evolution of the optical properties, J OPT A-P A, 2(5), 2000, pp. 442-448
Authors:
Carpes, WP
Pichon, L
Razek, A
Citation: Wp. Carpes et al., Efficient analysis of resonant cavities by finite element method in the time domain, IEE P-MIC A, 147(1), 2000, pp. 53-57
Authors:
Carpes, WP
Pichon, L
Razek, A
Citation: Wp. Carpes et al., A 3D finite element method for the modelling of bounded and unbounded electromagnetic problems in the time domain, INT J N MOD, 13(6), 2000, pp. 527-540
Authors:
Carpes, WP
Pichon, L
Razek, A
Citation: Wp. Carpes et al., A 3D FEM model for EMC analysis - Coupling of an electromagnetic wave witha wire inside a cavity, COMPEL, 19(2), 2000, pp. 253-259
Authors:
Straboni, A
Pichon, L
Girardeau, T
Citation: A. Straboni et al., Production of stable and metastable phases of zirconium nitrides by NH3 plasma nitridation and by double ion beam sputtering of zirconium films, SURF COAT, 125(1-3), 2000, pp. 100-105
Authors:
Calligaro, T
Dran, JC
Ioannidou, E
Moignard, B
Pichon, L
Salomon, J
Citation: T. Calligaro et al., Development of an external beam nuclear microprobe on the Aglae facility of the Louvre museum, NUCL INST B, 161, 2000, pp. 328-333
Authors:
Marot, L
Pichon, L
Drouet, M
Straboni, A
Citation: L. Marot et al., Improved nitrogen transport in Fe-C alloys during NH3 plasma nitridation, MATER LETT, 44(1), 2000, pp. 35-38
Authors:
Mercha, A
Rhayem, J
Pichon, L
Valenza, M
Routoure, JM
Carin, R
Bonnaud, O
Rigaud, D
Citation: A. Mercha et al., Low-frequency noise in low temperature unhydrogenated polysilicon thin film transistors, MICROEL REL, 40(11), 2000, pp. 1891-1896
Authors:
Pichon, L
Straboni, A
Girardeau, T
Drouet, M
Widmayer, P
Citation: L. Pichon et al., Nitrogen and oxygen transport and reactions during plasma nitridation of zirconium thin films, J APPL PHYS, 87(2), 2000, pp. 925-932
Authors:
Gajan, H
Pichon, L
Marchand, C
Citation: H. Gajan et al., Finite element method for radiated emissions in EMC analysis, IEEE MAGNET, 36(4), 2000, pp. 964-967
Authors:
Carpes, WP
Ferreira, GS
Raizer, A
Pichon, L
Razek, A
Citation: Wp. Carpes et al., TLM and FEM methods applied in the analysis of electromagnetic coupling, IEEE MAGNET, 36(4), 2000, pp. 982-985
Authors:
Benhassine, S
Carpes, WP
Pichon, L
Citation: S. Benhassine et al., Comparison of mass lumping techniques for solving the 3D Maxwell's equations in the time domain, IEEE MAGNET, 36(4), 2000, pp. 1548-1552
Authors:
Pichon, L
Mercha, A
Carin, R
Bonnaud, O
Mohammed-Brahim, T
Helen, Y
Rogel, R
Citation: L. Pichon et al., Analysis of the activation energy of the subthreshold current in laser- and solid-phase-crystallized polycrystalline silicon thin-film transistors, APPL PHYS L, 77(4), 2000, pp. 576-578
Authors:
Pichon, L
Girardeau, T
Straboni, A
Lignou, F
Guerin, P
Perriere, J
Citation: L. Pichon et al., Zirconium nitrides deposited by dual ion beam sputtering: physical properties and growth modelling, APPL SURF S, 150(1-4), 1999, pp. 115-124
Authors:
Pichon, L
Girardeau, T
Straboni, A
Lignou, F
Perriere, J
Frigerio, JM
Citation: L. Pichon et al., Ion beam assisted deposition of zirconium nitrides for modulated optical index structures, NUCL INST B, 147(1-4), 1999, pp. 378-382
Authors:
Pichon, L
Girardeau, T
Lignou, F
Straboni, A
Citation: L. Pichon et al., Evidence of omega-phase in ion beam sputtered zirconium thin films, THIN SOL FI, 342(1-2), 1999, pp. 93-99
Authors:
Tala-Ighil, B
Rahal, A
Mourgues, K
Toutah, A
Pichon, L
Mohammed-Brahim, T
Raoult, F
Bonnaud, O
Citation: B. Tala-ighil et al., State creation induced by gate bias stress in unhydrogenated polysilicon TFTs, THIN SOL FI, 337(1-2), 1999, pp. 101-104
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1-21
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