AAAAAA
Results: 1-25/45
Authors:
Tsirelson, VG
Avilov, AS
Lepeshov, GG
Kulygin, AK
Stahn, J
Pietsch, U
Spence, JCH
Citation: Vg. Tsirelson et al., Quantitative analysis of the electrostatic potential in rock-salt crystalsusing accurate electron diffraction data, J PHYS CH B, 105(21), 2001, pp. 5068-5074
Authors:
Henneberg, O
Geue, T
Saphiannikova, M
Pietsch, U
Rochon, P
Natansohn, A
Citation: O. Henneberg et al., Formation and dynamics of polymer surface relief gratings, APPL SURF S, 182(3-4), 2001, pp. 272-279
Authors:
Pietsch, U
Grenzer, J
Geue, T
Neissendorfer, F
Brezsesinski, G
Symietz, C
Mohwald, H
Gudat, W
Citation: U. Pietsch et al., The energy-dispersive reflectometer at BESSY II: a challenge for thin filmanalysis, NUCL INST A, 467, 2001, pp. 1077-1080
Authors:
Stahn, J
Pietsch, U
Blaha, P
Schwarz, K
Citation: J. Stahn et al., Electric-field-induced charge-density variations in covalently bonded binary compounds - art. no. 165205, PHYS REV B, 6316(16), 2001, pp. 5205
Authors:
Davaasambuu, J
Daniel, A
Stahn, J
Pietsch, U
Citation: J. Davaasambuu et al., Harmonic and anharmonic thermal vibrations in cubic ZnSe, Z KRISTALL, 216(1), 2001, pp. 22-25
Authors:
Poloucek, P
Pietsch, U
Geue, T
Symietz, C
Brezesinski, G
Citation: P. Poloucek et al., X-ray reflectivity analysis of thin complex Langmuir-Blodgett films, J PHYS D, 34(4), 2001, pp. 450-458
Authors:
Grenzer, J
Darowski, N
Geue, T
Pietsch, U
Daniel, A
Rennon, S
Reithmaier, JP
Forchel, A
Citation: J. Grenzer et al., Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation, J PHYS D, 34(10A), 2001, pp. A11-A14
Authors:
Ulyanenkov, A
Inaba, K
Mikulik, P
Darowski, N
Omote, K
Pietsch, U
Grenzer, J
Forchel, A
Citation: A. Ulyanenkov et al., X-ray diffraction and reflectivity analysis of GaAs/InGaAs free-standing trapezoidal quantum wires, J PHYS D, 34(10A), 2001, pp. A179-A182
Authors:
Zeimer, U
Grenzer, J
Pietsch, U
Gramlich, S
Bugge, F
Smirnitzki, V
Weyers, M
Trankle, G
Citation: U. Zeimer et al., Investigation of strain-modulated InGaAs nanostructures by grazing-incidence x-ray diffraction and photoluminescence, J PHYS D, 34(10A), 2001, pp. A183-A187
Authors:
Pietsch, U
Stahn, J
Davaasambuu, J
Pucher, A
Citation: U. Pietsch et al., Electric field induced charge density variations in partially-ionic compounds, J PHYS CH S, 62(12), 2001, pp. 2129-2133
Authors:
Avilov, A
Lepeshov, G
Pietsch, U
Tsirelson, V
Citation: A. Avilov et al., Multipole analysis of the electron density and electrostatic potential in germanium by high-resolution electron diffraction, J PHYS CH S, 62(12), 2001, pp. 2135-2142
Authors:
Davaasambuu, J
Daniel, A
Stahn, J
Pietsch, U
Citation: J. Davaasambuu et al., Comparison of experimental and theoretical valence charge densities of cubic ZnSe, J PHYS CH S, 62(12), 2001, pp. 2147-2152
Authors:
Henneberg, O
Geue, T
Saphiannikova, M
Pietsch, U
Chi, LF
Rochon, P
Natansohn, AL
Citation: O. Henneberg et al., Atomic force microscopy inspection of the early state of formation of polymer surface relief gratings, APPL PHYS L, 79(15), 2001, pp. 2357-2359
Authors:
Zeimer, U
Bugge, F
Gramlich, S
Smirnitski, V
Weyers, M
Trankle, G
Grenzer, J
Pietsch, U
Cassabois, G
Emiliani, V
Lienau, C
Citation: U. Zeimer et al., Evidence for strain-induced lateral carrier confinement in InGaAs quantum wells by low-temperature near-field spectroscopy, APPL PHYS L, 79(11), 2001, pp. 1611-1613
Authors:
Pietsch, U
Rochon, P
Natansohn, A
Citation: U. Pietsch et al., Formation of a buried lateral density grating in azobenzene polymer films, ADVAN MATER, 12(15), 2000, pp. 1129
Authors:
Pietsch, U
Darowski, N
Ulyanenkov, A
Grenzer, J
Wang, KH
Forchel, A
Citation: U. Pietsch et al., Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data, PHYSICA B, 283(1-3), 2000, pp. 92-96
Authors:
Zhuang, Y
Pietsch, U
Stangl, J
Holy, V
Darowski, N
Grenzer, J
Zerlauth, S
Schaffler, F
Bauer, G
Citation: Y. Zhuang et al., In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction, PHYSICA B, 283(1-3), 2000, pp. 130-134
Authors:
Thunemann, AF
Kubowicz, S
Pietsch, U
Citation: Af. Thunemann et al., Ultrathin solid polyelectrolyte-surfactant complex films: Structure and wetting, LANGMUIR, 16(23), 2000, pp. 8562-8567
Authors:
Stahn, J
Geue, T
Grenzer, J
Pietsch, U
Citation: J. Stahn et al., Interaction of short-chain alkanes with the surface and interfaces of multilayer films built from amphiphilic molecules: An in-situ X-ray and neutronscattering probe, LANGMUIR, 16(20), 2000, pp. 7764-7768
Authors:
Zhuang, Y
Schelling, C
Stangl, J
Penn, C
Senz, S
Schaffler, F
Roch, T
Daniel, A
Grenzer, J
Pietsch, U
Bauer, G
Citation: Y. Zhuang et al., Structural and optical properties of Si/Si1-xGex wires, THIN SOL FI, 369(1-2), 2000, pp. 409-413
Authors:
Neumann, W
Buchsteiner, A
Mahler, W
Geue, T
Pietsch, U
Citation: W. Neumann et al., Dielectric loss spectroscopy at fatty acid salt multilayers, PHYS ST S-A, 177(1), 2000, pp. 237-249
Authors:
Geue, T
Schultz, M
Grenzer, J
Pietsch, U
Natansohn, A
Rochon, P
Citation: T. Geue et al., X-ray investigations of the molecular mobility within polymer surface gratings, J APPL PHYS, 87(11), 2000, pp. 7712-7719
Authors:
Pietsch, U
Citation: U. Pietsch, Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction, CURRENT SCI, 78(12), 2000, pp. 1484-1495
Authors:
Grenzer, J
Darowski, N
Pietsch, U
Daniel, A
Rennon, S
Reithmaier, JP
Forchel, A
Citation: J. Grenzer et al., Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation, APPL PHYS L, 77(26), 2000, pp. 4277-4279
Authors:
Veldkamp, M
Erko, A
Gudat, W
Abrosimov, NV
Alex, V
Khasanov, S
Shekhtman, V
Neissendorfer, F
Pietsch, U
Citation: M. Veldkamp et al., Si1-xGex laterally graded crystals as monochromators for x-ray absorption spectroscopy studies, JPN J A P 1, 38, 1999, pp. 612-615