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Results: 1-19 |
Results: 19

Authors: Zoethout, E Zandvliet, HJW Poelsema, B
Citation: E. Zoethout et al., Adatom assisted stabilization of ad dimers on Ge(001), J VAC SCI A, 19(4), 2001, pp. 1868-1870

Authors: Zandvliet, HJW Gurlu, O Poelsema, B
Citation: Hjw. Zandvliet et al., Temperature dependence of the step free energy - art. no. 073402, PHYS REV B, 6407(7), 2001, pp. 3402

Authors: van Dijken, S Di Santo, G Poelsema, B
Citation: S. Van Dijken et al., Influence of the deposition angle on the magnetic anisotropy in thin Co films on Cu(001) - art. no. 104431, PHYS REV B, 6310(10), 2001, pp. 4431

Authors: Esser, M Wormeester, H Poelsema, B
Citation: M. Esser et al., Breakdown of the simple kinematic approximation models in high-resolution LEED characterization of the initial growth of Si/Si(111), SURF SCI, 482, 2001, pp. 1355-1361

Authors: Zandvliet, HJW Zoethout, E Wulfhekel, W Poelsema, B
Citation: Hjw. Zandvliet et al., Origin of roughening in epitaxial growth of silicon on Si(001) and Ge(001)surfaces, SURF SCI, 482, 2001, pp. 391-395

Authors: Zandvliet, HJW Poelsema, B Swartzentruber, BS
Citation: Hjw. Zandvliet et al., Diffusion on semiconductor surfaces, PHYS TODAY, 54(7), 2001, pp. 40-45

Authors: van Dijken, S de Bruin, D Poelsema, B
Citation: S. Van Dijken et al., Kinetic physical etching for versatile novel design of well ordered self-affine nanogrooves, PHYS REV L, 86(20), 2001, pp. 4608-4611

Authors: Benes, NE Spijksma, G Verweij, H Wormeester, H Poelsema, B
Citation: Ne. Benes et al., CO2 sorption of a thin silica layer determined by spectroscopic ellipsometry, AICHE J, 47(5), 2001, pp. 1212-1218

Authors: van Dijken, S Vollmer, R Poelsema, B Kirschner, J
Citation: S. Van Dijken et al., The influence of CO and H-2 adsorption on the spin reorientation transition in Ni/Cu(001), J MAGN MAGN, 210(1-3), 2000, pp. 316-328

Authors: Galea, TM Ordas, C Zoethout, E Zandvliet, HJW Poelsema, B
Citation: Tm. Galea et al., Formation and decay of metastable Ge clusters on Ge(001), PHYS REV B, 62(11), 2000, pp. 7206-7212

Authors: van Dijken, S Jorritsma, LC Poelsema, B
Citation: S. Van Dijken et al., Grazing-incidence metal deposition: Pattern formation and slope selection, PHYS REV B, 61(20), 2000, pp. 14047-14058

Authors: Zoethout, E Gurlu, O Zandvliet, HJW Poelsema, B
Citation: E. Zoethout et al., The influence of strain on the diffusion of Si dimers on Si(001), SURF SCI, 452(1-3), 2000, pp. 247-252

Authors: Zandvliet, HJW Galea, TM Zoethout, E Poelsema, B
Citation: Hjw. Zandvliet et al., Diffusion driven concerted motion of surface atoms: Ge on Ge(001), PHYS REV L, 84(7), 2000, pp. 1523-1526

Authors: van Dijken, S Di Santo, G Poelsema, B
Citation: S. Van Dijken et al., Growth-induced uniaxial anisotropy in grazing-incidence deposited magneticfilms, APPL PHYS L, 77(13), 2000, pp. 2030-2032

Authors: Vollmer, R Gutjahr-Loser, T Kirschner, J van Dijken, S Poelsema, B
Citation: R. Vollmer et al., Spin-reorientation transition in Ni films on Cu(001): The influence of H-2adsorption, PHYS REV B, 60(9), 1999, pp. 6277-6280

Authors: Zandvliet, HJW Poelsema, B
Citation: Hjw. Zandvliet et B. Poelsema, Determination of surface stress anisotropy from domain wall fluctuations, PHYS REV B, 59(11), 1999, pp. 7289-7292

Authors: van Dijken, S Jorritsma, LC Poelsema, B
Citation: S. Van Dijken et al., Steering-enhanced roughening during metal deposition at grazing incidence, PHYS REV L, 82(20), 1999, pp. 4038-4041

Authors: Zoethout, E Zandvliet, HJW Wulfhekel, W Rosenfeld, G Poelsema, B
Citation: E. Zoethout et al., Diffusion mechanisms and the nature of Si ad-dimers on Ge(001), PHYS REV B, 58(24), 1998, pp. 16167-16171

Authors: Wulfhekel, W Zandvliet, HJW Hattink, BJ Rosenfeld, G Comsa, G Poelsema, B
Citation: W. Wulfhekel et al., Smooth growth fronts in Si/Ge heteroepitaxy by kinetic growth manipulation, PHYS REV B, 58(23), 1998, pp. 15359-15362
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