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Results: 1-22 |
Results: 22

Authors: Matkin, LS Watson, SJ Gleeson, HF Pindak, R Pitney, J Johnson, PM Huang, CC Barois, P Levelut, AM Srajer, G Pollmann, J Goodby, JW Hird, M
Citation: Ls. Matkin et al., Resonant x-ray scattering study of the antiferroelectric and ferrielectricphases in liquid crystal devices - art. no. 021705, PHYS REV E, 6402(2), 2001, pp. 1705

Authors: Longfield, MJ Wilmshurst, J Bouchenoire, L Cooper, MJ Mannix, D Lander, GH Bernhoeft, N Stunault, A Stirling, WG Pollmann, J Haskel, D Srajer, G
Citation: Mj. Longfield et al., The use of resonant X-ray magnetic scattering to examine the magnetic phases in UAs-USe solid solutions, J MAGN MAGN, 233(1-2), 2001, pp. 53-56

Authors: Wang, FH Kruger, P Pollmann, J
Citation: Fh. Wang et al., Electronic structure of 1X1 GaN(0001) and GaN(000(1)over-bar) surfaces - art. no. 035305, PHYS REV B, 6403(3), 2001, pp. 5305

Authors: Rossnagel, K Kipp, L Skibowski, M Solterbeck, C Strasser, T Schattke, W Voss, D Kruger, P Mazur, A Pollmann, J
Citation: K. Rossnagel et al., Three-dimensional Fermi surface determination by angle-resolved photoelectron spectroscopy - art. no. 125104, PHYS REV B, 6312(12), 2001, pp. 5104

Authors: Rohlfing, M Pollmann, J
Citation: M. Rohlfing et J. Pollmann, Dielectric function and reflectivity spectrum of SiC polytypes - art. no. 125201, PHYS REV B, 6312(12), 2001, pp. 5201

Authors: Kucharczyk, R Freking, U Kruger, P Pollmann, J
Citation: R. Kucharczyk et al., Electronic properties of AlGaAs-based biperiodic superlattices via pseudopotential calculations, SURF SCI, 482, 2001, pp. 612-617

Authors: Haskel, D Srajer, G Lang, JC Pollmann, J Nelson, CS Jiang, JS Bader, SD
Citation: D. Haskel et al., Enhanced interfacial magnetic coupling of Gd/Fe multilayers - art. no. 207201, PHYS REV L, 8720(20), 2001, pp. 7201

Authors: Pollmann, J
Citation: J. Pollmann, The reformation of community. Social welfare and Calvinist charity in Holland, 1572-1620, J ECCL HIST, 52(2), 2001, pp. 376-377

Authors: Pollmann, J
Citation: J. Pollmann, The emergence of tolerance in the Dutch Republic, J ECCL HIST, 52(2), 2001, pp. 379-380

Authors: Pollmann, J Srajer, G Haskel, D Lang, JC Maser, J Jiang, JS Bader, SD
Citation: J. Pollmann et al., Magnetic imaging of a buried SmCo layer in a spring magnet, J APPL PHYS, 89(11), 2001, pp. 7165-7167

Authors: Pollmann, J
Citation: J. Pollmann, Mutua-Christianorum-Tolerantia: Irenicism and toleration in the Netherlands: The Stinstra Affair, 1740-1745, ENGLISH HIS, 116(467), 2001, pp. 735-736

Authors: Lu, WC Kruger, P Pollmann, J
Citation: Wc. Lu et al., Ab initio studies on the beta-SiC(001)-(5x2) surface, PHYS REV B, 61(4), 2000, pp. 2680-2687

Authors: Stampfl, C Van de Walle, CG Vogel, D Kruger, P Pollmann, J
Citation: C. Stampfl et al., Native defects and impurities in InN: First-principles studies using the local-density approximation and self-interaction and relaxation-corrected pseudopotentials, PHYS REV B, 61(12), 2000, pp. R7846-R7849

Authors: Lu, WC Kruger, P Pollmann, J
Citation: Wc. Lu et al., Atomic and electronic structure of silicate adlayers on polar hexagonal SiC surfaces, PHYS REV B, 61(20), 2000, pp. 13737-13744

Authors: Pollmann, J Srajer, G Maser, J Lang, JC Nelson, CS Venkataraman, CT Isaacs, ED
Citation: J. Pollmann et al., Characterization of a microfocused circularly polarized x-ray probe, REV SCI INS, 71(6), 2000, pp. 2386-2390

Authors: Rohlfing, M Pollmann, J
Citation: M. Rohlfing et J. Pollmann, U parameter of the Mott-Hubbard insulator 6H-SiC(0001)-(root 3 x root 3)R30 degrees: An ab initio calculation, PHYS REV L, 84(1), 2000, pp. 135-138

Authors: Matkin, LS Gleeson, HF Mach, P Huang, CC Pindak, R Srajer, G Pollmann, J Goodby, JW Hird, M Seed, A
Citation: Ls. Matkin et al., Resonant x-ray scattering at the Se edge in liquid crystal free-standing films and devices, APPL PHYS L, 76(14), 2000, pp. 1863-1865

Authors: Pollmann, J Ruter, HD Gerdau, E
Citation: J. Pollmann et al., The temperature dependence of the hyperfine parameters of YIG below the Curie point, HYPER INTER, 122(3-4), 1999, pp. 353-364

Authors: Jaschke, J Ruter, HD Gerdau, E Smirnov, GV Sturhahn, W Pollmann, J
Citation: J. Jaschke et al., A single line linearly polarized source of 14.4 keV radiation by means of resonant absorption, NUCL INST B, 155(1-2), 1999, pp. 189-198

Authors: Lu, WC Kruger, P Pollmann, J
Citation: Wc. Lu et al., Atomic and electronic structure of beta-SiC(001)-(3 x 2), PHYS REV B, 60(4), 1999, pp. 2495-2504

Authors: Lu, WC Kruger, P Pollmann, J
Citation: Wc. Lu et al., Comment on "Missing-row asymmetric-dimer reconstruction of SiC(100)-c(4x2)" - Reply, PHYS REV L, 82(18), 1999, pp. 3722-3722

Authors: Neuhausen, J Evstaf'iev, VK Block, T Finckh, EW Tremel, W Augustin, L Fuchs, H Voss, D Kruger, P Mazur, A Pollmann, J
Citation: J. Neuhausen et al., Scanning probe microscopy study of the metal-rich layered chalcogenides TaM2Te2 (M = Co, Ni), CHEM MATER, 10(12), 1998, pp. 3870-3878
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