Authors:
Matkin, LS
Watson, SJ
Gleeson, HF
Pindak, R
Pitney, J
Johnson, PM
Huang, CC
Barois, P
Levelut, AM
Srajer, G
Pollmann, J
Goodby, JW
Hird, M
Citation: Ls. Matkin et al., Resonant x-ray scattering study of the antiferroelectric and ferrielectricphases in liquid crystal devices - art. no. 021705, PHYS REV E, 6402(2), 2001, pp. 1705
Authors:
Longfield, MJ
Wilmshurst, J
Bouchenoire, L
Cooper, MJ
Mannix, D
Lander, GH
Bernhoeft, N
Stunault, A
Stirling, WG
Pollmann, J
Haskel, D
Srajer, G
Citation: Mj. Longfield et al., The use of resonant X-ray magnetic scattering to examine the magnetic phases in UAs-USe solid solutions, J MAGN MAGN, 233(1-2), 2001, pp. 53-56
Citation: Fh. Wang et al., Electronic structure of 1X1 GaN(0001) and GaN(000(1)over-bar) surfaces - art. no. 035305, PHYS REV B, 6403(3), 2001, pp. 5305
Citation: M. Rohlfing et J. Pollmann, Dielectric function and reflectivity spectrum of SiC polytypes - art. no. 125201, PHYS REV B, 6312(12), 2001, pp. 5201
Authors:
Kucharczyk, R
Freking, U
Kruger, P
Pollmann, J
Citation: R. Kucharczyk et al., Electronic properties of AlGaAs-based biperiodic superlattices via pseudopotential calculations, SURF SCI, 482, 2001, pp. 612-617
Citation: J. Pollmann, Mutua-Christianorum-Tolerantia: Irenicism and toleration in the Netherlands: The Stinstra Affair, 1740-1745, ENGLISH HIS, 116(467), 2001, pp. 735-736
Authors:
Stampfl, C
Van de Walle, CG
Vogel, D
Kruger, P
Pollmann, J
Citation: C. Stampfl et al., Native defects and impurities in InN: First-principles studies using the local-density approximation and self-interaction and relaxation-corrected pseudopotentials, PHYS REV B, 61(12), 2000, pp. R7846-R7849
Citation: Wc. Lu et al., Atomic and electronic structure of silicate adlayers on polar hexagonal SiC surfaces, PHYS REV B, 61(20), 2000, pp. 13737-13744
Citation: M. Rohlfing et J. Pollmann, U parameter of the Mott-Hubbard insulator 6H-SiC(0001)-(root 3 x root 3)R30 degrees: An ab initio calculation, PHYS REV L, 84(1), 2000, pp. 135-138
Authors:
Matkin, LS
Gleeson, HF
Mach, P
Huang, CC
Pindak, R
Srajer, G
Pollmann, J
Goodby, JW
Hird, M
Seed, A
Citation: Ls. Matkin et al., Resonant x-ray scattering at the Se edge in liquid crystal free-standing films and devices, APPL PHYS L, 76(14), 2000, pp. 1863-1865
Citation: J. Pollmann et al., The temperature dependence of the hyperfine parameters of YIG below the Curie point, HYPER INTER, 122(3-4), 1999, pp. 353-364
Authors:
Jaschke, J
Ruter, HD
Gerdau, E
Smirnov, GV
Sturhahn, W
Pollmann, J
Citation: J. Jaschke et al., A single line linearly polarized source of 14.4 keV radiation by means of resonant absorption, NUCL INST B, 155(1-2), 1999, pp. 189-198
Authors:
Neuhausen, J
Evstaf'iev, VK
Block, T
Finckh, EW
Tremel, W
Augustin, L
Fuchs, H
Voss, D
Kruger, P
Mazur, A
Pollmann, J
Citation: J. Neuhausen et al., Scanning probe microscopy study of the metal-rich layered chalcogenides TaM2Te2 (M = Co, Ni), CHEM MATER, 10(12), 1998, pp. 3870-3878