Citation: Kn. Quader et al., HOT-CARRIER-RELIABILITY DESIGN RULES FOR TRANSLATING DEVICE DEGRADATION TO CMOS DIGITAL CIRCUIT DEGRADATION, I.E.E.E. transactions on electron devices, 41(5), 1994, pp. 681-691
Citation: Kn. Quader et al., HOT-CARRIER-RELIABILITY DESIGN GUIDELINES FOR CMOS LOGIC-CIRCUITS, IEEE journal of solid-state circuits, 29(3), 1994, pp. 253-262
Authors:
QUADER KN
LI CC
TU R
ROSENBAUM E
KO PK
HU CM
Citation: Kn. Quader et al., A BIDIRECTIONAL NMOSFET CURRENT REDUCTION MODEL FOR SIMULATION OF HOT-CARRIER-INDUCED CIRCUIT DEGRADATION, I.E.E.E. transactions on electron devices, 40(12), 1993, pp. 2245-2254