Authors:
RAYNAUD C
ETIENNE C
PEYRON P
LANEELLE MA
DAFFE M
Citation: C. Raynaud et al., EXTRACELLULAR ENZYME-ACTIVITIES POTENTIALLY INVOLVED IN THE PATHOGENICITY OF MYCOBACTERIUM-TUBERCULOSIS, Microbiology, 144, 1998, pp. 577-587
Authors:
MUNOZ M
RAYNAUD C
LANEELLE MA
JULIAN E
MARIN LML
SILVE G
AUSINA V
DAFFE M
LUQUIN M
Citation: M. Munoz et al., SEROREACTIVE SPECIES-SPECIFIC LIPOOLIGOSACCHARIDES OF MYCOBACTERIUM-MUCOGENICUM SP. NOV. (FORMERLY MYCOBACTERIUM CHELONAE-LIKE ORGANISMS) -IDENTIFICATION AND CHEMICAL CHARACTERIZATION, Microbiology, 144, 1998, pp. 137-148
Citation: Sh. Renn et al., TEMPERATURE-DEPENDENCE OF HOT-CARRIER EFFECTS IN 0.2 MU-M N-CHANNEL AND P-CHANNEL FULLY-DEPLETED UNIBOND MOSFET, Journal de physique. IV, 8(P3), 1998, pp. 13-16
Authors:
BERTHELOT P
TEYSSIER G
ROS A
RAYNAUD C
GRATTARD F
LUCHT F
Citation: P. Berthelot et al., NOSOCOMIAL COLONIZATION OF PREMATURE BABIES WITH KLEBSIELLA-OXYTOCA -EVIDENCE OF ENTERAL FEEDING PROCEDURES AS THE MEAN OF TRANSMISSION AND CONTROL OF THE OUTBREAK WITH THE USE OF GLOVES, Infection control and hospital epidemiology, 19(8), 1998, pp. 604-604
Authors:
RAYNAUD C
GHAFFOUR K
ORTOLLAND S
LOCATELLI ML
SOUIFI K
GUILLOT G
CHANTE JP
Citation: C. Raynaud et al., ELECTRICAL CHARACTERIZATION OF SILICON-CARBIDE N(-IMPLANTED N(+) EMITTER()PP(+) DIODES WITH AN N), Journal of applied physics, 84(6), 1998, pp. 3073-3077
Authors:
ORTOLLAND S
RAYNAUD C
LOCATELLI ML
CHANTE JP
SENES A
Citation: S. Ortolland et al., SURFACE EFFECTS ON CURRENT MECHANISMS IN 6H-SIC N(+)PP(+) STRUCTURES PASSIVATED WITH A DEPOSITED OXIDE, Journal of applied physics, 84(3), 1998, pp. 1688-1692
Authors:
MASSON P
AUTRAN JL
RAYNAUD C
FLAMENT O
PAILLET P
CHABRERIE C
Citation: P. Masson et al., SURFACE-POTENTIAL DETERMINATION IN IRRADIATED MOS-TRANSISTORS COMBINING CURRENT-VOLTAGE AND CHARGE-PUMPING MEASUREMENTS, IEEE transactions on nuclear science, 45(3), 1998, pp. 1355-1364
Citation: Sh. Renn et al., A THOROUGH INVESTIGATION OF THE DEGRADATION INDUCED BY HOT-CARRIER INJECTION IN DEEP-SUBMICRON N-CHANNEL AND P-CHANNEL PARTIALLY AND FULLY DEPLETED UNIBOND AND SIMOX MOSFETS, I.E.E.E. transactions on electron devices, 45(10), 1998, pp. 2146-2152
Citation: Sh. Renn et al., INVESTIGATION OF THE RELIABILITY OF UNIBOND AND SIMOX N-MOSFETS USINGCHARGE-PUMPING AND NOISE TECHNIQUES, Electronics Letters, 34(18), 1998, pp. 1788-1790
Authors:
GOLZIO M
MORA MP
RAYNAUD C
DELTEIL C
TEISSIE J
ROLS MP
Citation: M. Golzio et al., CONTROL BY OSMOTIC-PRESSURE OF VOLTAGE-INDUCED PERMEABILIZATION AND GENE-TRANSFER IN MAMMALIAN-CELLS, Biophysical journal, 74(6), 1998, pp. 3015-3022
Authors:
LEBEDEV AA
ORTOLAND S
RAYNAUD C
LOCATELLI ML
PLANSON D
CHANTE JP
Citation: Aa. Lebedev et al., DEEP CENTERS AND NEGATIVE TEMPERATURE-COEFFICIENT OF THE BREAKDOWN VOLTAGE OF SIC P-N STRUCTURES, Semiconductors, 31(7), 1997, pp. 735-737
Citation: C. Raynaud et al., TEMPERATURE-DEPENDENCE OF ELECTRICAL-PROPERTIES OF 6H-SIC BURIED GATEJFET, DIAMOND AND RELATED MATERIALS, 6(10), 1997, pp. 1504-1507
Authors:
FERLETCAVROIS V
MUSSEAU O
LERAY JL
PELLOIE JL
RAYNAUD C
Citation: V. Ferletcavrois et al., TOTAL-DOSE EFFECTS ON A FULLY-DEPLETED SOI NMOSFET AND ITS LATERAL PARASITIC TRANSISTOR, I.E.E.E. transactions on electron devices, 44(6), 1997, pp. 965-971
Authors:
RAYNAUD C
DUCROQUET F
BROUNKOV PN
GUILLOT G
PORTER LM
DAVIS RF
JAUSSAUD C
BILLON T
Citation: C. Raynaud et al., ELECTRICAL CHARACTERIZATION OF EPITAXIAL 6H-SIC BY ADMITTANCE SPECTROSCOPY, Materials science and technology, 12(1), 1996, pp. 94-97
Authors:
MENERATH JM
RAYNAUD C
RAVEL A
PEREZ N
BORDET P
CHIAMBARETTA F
BONICEL P
DIMEGLIO V
BOYER L
Citation: Jm. Menerath et al., MRI ASSESSMENT OF THE VASCULARIZATION OF SYNTHETIC HYDROXYAPATITE ORBITAL IMPLANTS, Investigative ophthalmology & visual science, 37(3), 1996, pp. 2853-2853
Authors:
ORTOLLAND S
RAYNAUD C
CHANTE JP
LOCATELLI ML
LEBEDEV AA
ANDREEV AN
SAVKINA NS
CHELNOKOV VE
RASTEGAEVA MG
SYRKIN AL
Citation: S. Ortolland et al., EFFECT OF BORON-DIFFUSION ON THE HIGH-VOLTAGE BEHAVIOR OF 6H-SIC P(+)NN(+) STRUCTURES, Journal of applied physics, 80(9), 1996, pp. 5464-5468