AAAAAA

   
Results: 1-25 | 26-43
Results: 1-25/43

Authors: NAIK RS LUTSKY JJ REIF R SODINI CG
Citation: Rs. Naik et al., ELECTROMECHANICAL COUPLING-CONSTANT EXTRACTION OF THIN-FILM PIEZOELECTRIC MATERIALS USING A BULK ACOUSTIC-WAVE RESONATOR, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 45(1), 1998, pp. 257-263

Authors: CHEN WZ REIF R
Citation: Wz. Chen et R. Reif, METROLOGY OF SUB-0.5 MU-M SILICON EPITAXIAL-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2330-2336

Authors: KARECKI S PRUETTE L REIF R BEU L SPARKS T VARTANIAN V
Citation: S. Karecki et al., USE OF 2H-HEPTAFLUOROPROPANE, 1-IODOHEPTAFLUOROPROPANE, AND 2-IODOHEPTAFLUOROPROPANE FOR A HIGH-ASPECT-RATIO VIA ETCH IN A HIGH-DENSITY PLASMA ETCH TOOL, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2722-2724

Authors: PRUETTE LC KARECKI SM REIF R LANGAN JG ROGERS SA CIOTTI RJ FELKER BS
Citation: Lc. Pruette et al., EVALUATION OF TRIFLUOROACETIC-ANHYDRIDE AS AN ALTERNATIVE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION CHAMBER CLEAN CHEMISTRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1577-1581

Authors: KARECKI SM PRUETTE LC REIF R
Citation: Sm. Karecki et al., PLASMA-ETCHING OF DIELECTRIC FILMS WITH NOVEL IODOFLUOROCARBON CHEMISTRIES - IODOTRIFLUOROETHYLENE AND 1-IODOHEPTAFLUOROPROPANE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 755-758

Authors: ADAM I ALEKSAN R ASTON D BAILLY P BEIGBEDER C BENAYOUN M BENKEBIL M BONNEAUD G BRETON D BRIAND H BROWN D BOURGEOIS P CHAUVEAU J CIZERON R COHENTANUGI J CONVERY M DAVID P DELAVAISSIERE C DELESQUEN A DELBUONO L FOUQUE G GAIDOT A GASTALDI F GENAT JF GOSSET L HALE D DEMONCHENAULT GH HAMON O KADEL R KADYK J KAROLAK M KAWAHARA H KRUEGER H LEBBOLO H LERUSTE PH LEDIBERDER F LONDON G LONG M LORY J LU A LUTZ AM LYNCH G MCCULLOCH M MCSHURLEY D MALCHOW R MATRICON P MAYER B MEADOWS B NARJOUX JL NOPPE JM OSHATZ D OXOBY G PLANO R PLASZCZYNSKI S PRIPSTEIN M RASSON J RATCLIFF B REIF R RENARD C ROOS L ROUSSOT E SARAZIN X SCHUNE MH SCHWIENING J SEN S SHELKOV V SOKOLOFF M STAENGLE H STILES P STONE R THIEBAUX C TRUONG K TOKI W VASILEIADIS G VASSEUR G VAVRA J VERDERI M VERSILLE S WARNER D WEBER T WEBER TF WENZEL W WILSON R WORMSER G YECHE C YELLIN S ZHANG B ZITO M
Citation: I. Adam et al., AN INTERNALLY REFLECTING CHERENKOV DETECTOR (DIRC) - PROPERTIES OF THE FUSED-SILICA RADIATORS, IEEE transactions on nuclear science, 45(3), 1998, pp. 450-455

Authors: ABE K ASHFORD V ASTON D BIENZ T BAIRD K BIRD F CAVALLISFORZA M COLLER J COYLE P COYNE D DASU S DUNWOODIE W DIMA M HALLEWELL G HASEGAWA Y IWASAKI Y KALELKAR M KAWAHARA H LEITH DWGS LU A MEADOWS B MULLER D MCCULLOCH M MCSHURLEY D NAGAMINE T NARITA S OXOBY G PAVEL TJ PLANO R RATCLIFF B REIF R RENSING P SCHNEIDER M SCHULTZ D SHAPIRO S SHAW H SIMOPOULOS C STAENGLE H STAMER P STILES P TOGE N VAVRA J WEBER T WHITAKER JS WILSON RJ WILLIAMS D WILLIAMS SH WILLOCQ S YELLIN S YUTA H
Citation: K. Abe et al., THE PERFORMANCE OF THE BARREL CRID AT THE SLD - LONG-TERM OPERATIONALEXPERIENCE, IEEE transactions on nuclear science, 45(3), 1998, pp. 648-656

Authors: ADAM I ALEKSAN R ASTON D BAILLY P BEIGBEDER C BENAYOUN M BENKEBIL M BONNEAUD G BRETON D BRIAND H BROWN D BOURGEOIS P CHAUVEAU J CIZERON R COHENTANUGI J CONVERY M DAVID P DELAVAISSIERE C DELESQUEN A DELBUONO L FOUQUE G GAIDOT A GASTALDI F GENAT JF GOSSET L HALE D DEMONCHENAULT GH HAMON O KADEL R KADYK J KAROLAK M KAWAHARA H KRUEGER H LEBBOLO H LERUSTE PH LEDIBERDER F LONDON G LONG M LORY J LU A LUTZ AM LYNCH G MCCULLOCH M MCSHURLEY D MALCHOW R MATRICON P MAYER B MEADOWS B NARJOUX JL NOPPE JM OSHATZ D OXOBY G PLANO R PLASZCZYNSKI S PRIPSTEIN M RASSON J RATCLIFF B REIF R RENARD C ROOS L ROUSSOT E SARAZIN X SCHUNE MH SCHWIENING J SEN S SHELKOV V SOKOLOFF M STAENGLE H STILES P STONE R THIEBAUX C TRUONG K TOKI W VASILEIADIS G VASSEUR G VAVRA J VERDERI M VERSILLE S WARNER D WEBER T WEBER TF WENZEL W WILSON R WORMSER G YECHE C YELLIN S ZHANG B ZITO M
Citation: I. Adam et al., DIRC, THE INTERNALLY REFLECTING RING IMAGING CHERENKOV DETECTOR FOR BABAR, IEEE transactions on nuclear science, 45(3), 1998, pp. 657-664

Authors: KARECKI S PRUETTE L REIF R
Citation: S. Karecki et al., USE OF NOVEL HYDROFLUOROCARBON AND IODOFLUOROCARBON CHEMISTRIES FOR AHIGH-ASPECT-RATIO VIA ETCH IN A HIGH-DENSITY PLASMA ETCH TOOL, Journal of the Electrochemical Society, 145(12), 1998, pp. 4305-4312

Authors: SHERMAN DJ TOVBIN J LAZAROVICH T AVRECH O REIF R HOFFMANN S CASPI E BOLDUR I
Citation: Dj. Sherman et al., CHORIOAMNIONITIS CAUSED BY GRAM-NEGATIVE BACTERIA AS AN ETIOLOGIC FACTOR IN PRETERM BIRTH, European journal of clinical microbiology & infectious diseases, 16(6), 1997, pp. 417-423

Authors: POLLAK L GUR R WALACH N REIF R TAMIR L SCHIFFER J
Citation: L. Pollak et al., CLINICAL DETERMINANTS OF LONG-TERM SURVIVAL IN PATIENTS WITH GLIOBLASTOMA-MULTIFORME, Tumori, 83(2), 1997, pp. 613-617

Authors: ALEKSAN R AMERMAN L ASTON D BENKEBIL M BESSON P BONNEAUD G BOURGEOIS P BROWN D CHAUVEAU J CIOCIO A CIZERON R DELESQUEN A DELBUONO L EMERY S GAIDOT A GOSSET L HALE D DEMONCHENAULT GH HAMON O HEARTY C JOUENNE A KADYK J KAWAHARA H KRUEGER H LONDON G LONG M LU A LUTZ AM LYNCH G MCSHURLEY D MEADOWS B NOPPE JM PASQUETTO E PLASZCZYNSKI S POPE W PRIPSTEIN M PRZYBYLSKI G RASSON J RATCLIFF BN REIF R SARAZIN X SCHUNE MH SCHWIENING J SEN S SHAPIRO S SOKOLOFF M STAENGLE H STILES P TAYLOR JD THERVILLE D TORASSA E VASILEIADIS G VASSEUR G VAVRA J VERDERI M WARNER D WEBER TF WENZEL W WILSON R WORMSER G YECHE C ZITO M
Citation: R. Aleksan et al., TEST OF A LARGE-SCALE PROTOTYPE OF THE DIRC, A CHERENKOV IMAGING DETECTOR BASED ON TOTAL INTERNAL-REFLECTION FOR BABAR AT PEP-II, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 397(2-3), 1997, pp. 261-282

Authors: KIM HW REIF R
Citation: Hw. Kim et R. Reif, EX-SITU WAFER SURFACE CLEANING BY HF DIPPING FOR LOW-TEMPERATURE SILICON EPITAXY, Thin solid films, 305(1-2), 1997, pp. 280-285

Authors: KIM HW ZHOU ZH REIF R
Citation: Hw. Kim et al., ROOM-TEMPERATURE WAFER SURFACE CLEANING BY IN-SITU ECR (ELECTRON-CYCLOTRON-RESONANCE) HYDROGEN PLASMA FOR SILICON HOMOEPITAXIAL GROWTH, Thin solid films, 302(1-2), 1997, pp. 169-178

Authors: CHEN WZ WESTHOFF R REIF R
Citation: Wz. Chen et al., DETERMINATION OF OPTICAL-CONSTANTS OF STRAINED SI1-XGEX EPITAXIAL LAYERS IN THE SPECTRAL RANGE 0.75-2.75 EV, Applied physics letters, 71(11), 1997, pp. 1525-1527

Authors: CHANIMOV M COHEN ML GRINSPUN Y HERBERT M REIF R KAUFMAN I BAHAR M
Citation: M. Chanimov et al., NEUROTOXICITY AFTER SPINAL-ANESTHESIA INDUCED BY SERIAL INTRATHECAL INJECTIONS OF MAGNESIUM-SULFATE - AN EXPERIMENTAL-STUDY IN A RAT MODEL, Anaesthesia, 52(3), 1997, pp. 223-228

Authors: NAKANO N TADA Y REIF R
Citation: N. Nakano et al., ANALYSIS OF THERMAL EFFECT ON THE INTERFACIAL OXIDE BETWEEN POLYSILICON AND SILICON FOR POLYSILICON BIPOLAR-TRANSISTORS BY CAPACITANCE AND CONTACT RESISTANCE MEASUREMENTS, JPN J A P 1, 35(11), 1996, pp. 5670-5673

Authors: KIM H REIF R
Citation: H. Kim et R. Reif, IN-SITU LOW-TEMPERATURE (600-DEGREES-C) WAFER SURFACE CLEANING BY ELECTRON-CYCLOTRON-RESONANCE HYDROGEN PLASMA FOR SILICON HOMOEPITAXIAL GROWTH, Thin solid films, 289(1-2), 1996, pp. 192-198

Authors: NOGUCHI T TANG AJ TSAI JA REIF R
Citation: T. Noguchi et al., COMPARISON OF EFFECTS BETWEEN LARGE-AREA-BEAM ELA AND SPC ON TFT CHARACTERISTICS, I.E.E.E. transactions on electron devices, 43(9), 1996, pp. 1454-1458

Authors: NOGUCHI T TSAI JA TANG AJ REIF R
Citation: T. Noguchi et al., RESISTIVITY STUDY OF P-IMPLANTED, B-IMPLANTED, AND BF2-IMPLANTED POLYCRYSTALLINE SI(1-X)G(X) FILMS WITH SUBSEQUENT ANNEALING (VOL 33, PG L1748, 1994), JPN J A P 2, 34(3A), 1995, pp. 338-338

Authors: NEGRI M BENDET N HALEVY A HALPERN Z REIF R BOGOKOVSKY H SCAPA E
Citation: M. Negri et al., GASTRIC-MUCOSAL CHANGES FOLLOWING GASTROPLASTY - A COMPARATIVE-STUDY BETWEEN VERTICAL BANDED GASTROPLASTY AND SILASTIC RING VERTICAL GASTROPLASTY, Obesity surgery, 5(4), 1995, pp. 383-386

Authors: ZHOU ZH REIF R
Citation: Zh. Zhou et R. Reif, EPI-FILM THICKNESS MEASUREMENTS USING EMISSION FOURIER-TRANSFORM INFRARED-SPECTROSCOPY .1. SENSOR CHARACTERIZATION, IEEE transactions on semiconductor manufacturing, 8(3), 1995, pp. 333-339

Authors: ZHOU ZH REIF R
Citation: Zh. Zhou et R. Reif, EPI-FILM THICKNESS MEASUREMENTS USING EMISSION FOURIER-TRANSFORM INFRARED-SPECTROSCOPY .2. REAL-TIME IN-SITU PROCESS MONITORING AND CONTROL, IEEE transactions on semiconductor manufacturing, 8(3), 1995, pp. 340-345

Authors: ASTON D HEARTY C KADYK J KAWAHARA H LU A LYNCH G MCSHURLEY D MEADOWS B MULLER D OXOBY G POPE W PRIPSTEIN M RATCLIFF B REIF R SIMOPOULOS C SMY M STAENGLE H STILES P WANG MZ WARNER D WENZEL W WILSON RJ YELLIN S ZHU Y
Citation: D. Aston et al., TEST OF A CONCEPTUAL PROTOTYPE OF THE TOTAL INTERNAL-REFLECTION CHERENKOV IMAGING DETECTOR (DIRC) WITH COSMIC MUONS, IEEE transactions on nuclear science, 42(4), 1995, pp. 534-538

Authors: TSAI JA TANG AJ NOGUCHI T REIF R
Citation: Ja. Tsai et al., EFFECTS OF GE ON MATERIAL AND ELECTRICAL-PROPERTIES OF POLYCRYSTALLINE SI1-XGEX FOR THIN-FILM TRANSISTORS, Journal of the Electrochemical Society, 142(9), 1995, pp. 3220-3225
Risultati: 1-25 | 26-43