Citation: Rs. Naik et al., ELECTROMECHANICAL COUPLING-CONSTANT EXTRACTION OF THIN-FILM PIEZOELECTRIC MATERIALS USING A BULK ACOUSTIC-WAVE RESONATOR, IEEE transactions on ultrasonics, ferroelectrics, and frequency control, 45(1), 1998, pp. 257-263
Citation: Wz. Chen et R. Reif, METROLOGY OF SUB-0.5 MU-M SILICON EPITAXIAL-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2330-2336
Authors:
KARECKI S
PRUETTE L
REIF R
BEU L
SPARKS T
VARTANIAN V
Citation: S. Karecki et al., USE OF 2H-HEPTAFLUOROPROPANE, 1-IODOHEPTAFLUOROPROPANE, AND 2-IODOHEPTAFLUOROPROPANE FOR A HIGH-ASPECT-RATIO VIA ETCH IN A HIGH-DENSITY PLASMA ETCH TOOL, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(4), 1998, pp. 2722-2724
Authors:
PRUETTE LC
KARECKI SM
REIF R
LANGAN JG
ROGERS SA
CIOTTI RJ
FELKER BS
Citation: Lc. Pruette et al., EVALUATION OF TRIFLUOROACETIC-ANHYDRIDE AS AN ALTERNATIVE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION CHAMBER CLEAN CHEMISTRY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(3), 1998, pp. 1577-1581
Citation: Sm. Karecki et al., PLASMA-ETCHING OF DIELECTRIC FILMS WITH NOVEL IODOFLUOROCARBON CHEMISTRIES - IODOTRIFLUOROETHYLENE AND 1-IODOHEPTAFLUOROPROPANE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(2), 1998, pp. 755-758
Authors:
ADAM I
ALEKSAN R
ASTON D
BAILLY P
BEIGBEDER C
BENAYOUN M
BENKEBIL M
BONNEAUD G
BRETON D
BRIAND H
BROWN D
BOURGEOIS P
CHAUVEAU J
CIZERON R
COHENTANUGI J
CONVERY M
DAVID P
DELAVAISSIERE C
DELESQUEN A
DELBUONO L
FOUQUE G
GAIDOT A
GASTALDI F
GENAT JF
GOSSET L
HALE D
DEMONCHENAULT GH
HAMON O
KADEL R
KADYK J
KAROLAK M
KAWAHARA H
KRUEGER H
LEBBOLO H
LERUSTE PH
LEDIBERDER F
LONDON G
LONG M
LORY J
LU A
LUTZ AM
LYNCH G
MCCULLOCH M
MCSHURLEY D
MALCHOW R
MATRICON P
MAYER B
MEADOWS B
NARJOUX JL
NOPPE JM
OSHATZ D
OXOBY G
PLANO R
PLASZCZYNSKI S
PRIPSTEIN M
RASSON J
RATCLIFF B
REIF R
RENARD C
ROOS L
ROUSSOT E
SARAZIN X
SCHUNE MH
SCHWIENING J
SEN S
SHELKOV V
SOKOLOFF M
STAENGLE H
STILES P
STONE R
THIEBAUX C
TRUONG K
TOKI W
VASILEIADIS G
VASSEUR G
VAVRA J
VERDERI M
VERSILLE S
WARNER D
WEBER T
WEBER TF
WENZEL W
WILSON R
WORMSER G
YECHE C
YELLIN S
ZHANG B
ZITO M
Citation: I. Adam et al., AN INTERNALLY REFLECTING CHERENKOV DETECTOR (DIRC) - PROPERTIES OF THE FUSED-SILICA RADIATORS, IEEE transactions on nuclear science, 45(3), 1998, pp. 450-455
Authors:
ABE K
ASHFORD V
ASTON D
BIENZ T
BAIRD K
BIRD F
CAVALLISFORZA M
COLLER J
COYLE P
COYNE D
DASU S
DUNWOODIE W
DIMA M
HALLEWELL G
HASEGAWA Y
IWASAKI Y
KALELKAR M
KAWAHARA H
LEITH DWGS
LU A
MEADOWS B
MULLER D
MCCULLOCH M
MCSHURLEY D
NAGAMINE T
NARITA S
OXOBY G
PAVEL TJ
PLANO R
RATCLIFF B
REIF R
RENSING P
SCHNEIDER M
SCHULTZ D
SHAPIRO S
SHAW H
SIMOPOULOS C
STAENGLE H
STAMER P
STILES P
TOGE N
VAVRA J
WEBER T
WHITAKER JS
WILSON RJ
WILLIAMS D
WILLIAMS SH
WILLOCQ S
YELLIN S
YUTA H
Citation: K. Abe et al., THE PERFORMANCE OF THE BARREL CRID AT THE SLD - LONG-TERM OPERATIONALEXPERIENCE, IEEE transactions on nuclear science, 45(3), 1998, pp. 648-656
Authors:
ADAM I
ALEKSAN R
ASTON D
BAILLY P
BEIGBEDER C
BENAYOUN M
BENKEBIL M
BONNEAUD G
BRETON D
BRIAND H
BROWN D
BOURGEOIS P
CHAUVEAU J
CIZERON R
COHENTANUGI J
CONVERY M
DAVID P
DELAVAISSIERE C
DELESQUEN A
DELBUONO L
FOUQUE G
GAIDOT A
GASTALDI F
GENAT JF
GOSSET L
HALE D
DEMONCHENAULT GH
HAMON O
KADEL R
KADYK J
KAROLAK M
KAWAHARA H
KRUEGER H
LEBBOLO H
LERUSTE PH
LEDIBERDER F
LONDON G
LONG M
LORY J
LU A
LUTZ AM
LYNCH G
MCCULLOCH M
MCSHURLEY D
MALCHOW R
MATRICON P
MAYER B
MEADOWS B
NARJOUX JL
NOPPE JM
OSHATZ D
OXOBY G
PLANO R
PLASZCZYNSKI S
PRIPSTEIN M
RASSON J
RATCLIFF B
REIF R
RENARD C
ROOS L
ROUSSOT E
SARAZIN X
SCHUNE MH
SCHWIENING J
SEN S
SHELKOV V
SOKOLOFF M
STAENGLE H
STILES P
STONE R
THIEBAUX C
TRUONG K
TOKI W
VASILEIADIS G
VASSEUR G
VAVRA J
VERDERI M
VERSILLE S
WARNER D
WEBER T
WEBER TF
WENZEL W
WILSON R
WORMSER G
YECHE C
YELLIN S
ZHANG B
ZITO M
Citation: I. Adam et al., DIRC, THE INTERNALLY REFLECTING RING IMAGING CHERENKOV DETECTOR FOR BABAR, IEEE transactions on nuclear science, 45(3), 1998, pp. 657-664
Citation: S. Karecki et al., USE OF NOVEL HYDROFLUOROCARBON AND IODOFLUOROCARBON CHEMISTRIES FOR AHIGH-ASPECT-RATIO VIA ETCH IN A HIGH-DENSITY PLASMA ETCH TOOL, Journal of the Electrochemical Society, 145(12), 1998, pp. 4305-4312
Authors:
SHERMAN DJ
TOVBIN J
LAZAROVICH T
AVRECH O
REIF R
HOFFMANN S
CASPI E
BOLDUR I
Citation: Dj. Sherman et al., CHORIOAMNIONITIS CAUSED BY GRAM-NEGATIVE BACTERIA AS AN ETIOLOGIC FACTOR IN PRETERM BIRTH, European journal of clinical microbiology & infectious diseases, 16(6), 1997, pp. 417-423
Authors:
ALEKSAN R
AMERMAN L
ASTON D
BENKEBIL M
BESSON P
BONNEAUD G
BOURGEOIS P
BROWN D
CHAUVEAU J
CIOCIO A
CIZERON R
DELESQUEN A
DELBUONO L
EMERY S
GAIDOT A
GOSSET L
HALE D
DEMONCHENAULT GH
HAMON O
HEARTY C
JOUENNE A
KADYK J
KAWAHARA H
KRUEGER H
LONDON G
LONG M
LU A
LUTZ AM
LYNCH G
MCSHURLEY D
MEADOWS B
NOPPE JM
PASQUETTO E
PLASZCZYNSKI S
POPE W
PRIPSTEIN M
PRZYBYLSKI G
RASSON J
RATCLIFF BN
REIF R
SARAZIN X
SCHUNE MH
SCHWIENING J
SEN S
SHAPIRO S
SOKOLOFF M
STAENGLE H
STILES P
TAYLOR JD
THERVILLE D
TORASSA E
VASILEIADIS G
VASSEUR G
VAVRA J
VERDERI M
WARNER D
WEBER TF
WENZEL W
WILSON R
WORMSER G
YECHE C
ZITO M
Citation: R. Aleksan et al., TEST OF A LARGE-SCALE PROTOTYPE OF THE DIRC, A CHERENKOV IMAGING DETECTOR BASED ON TOTAL INTERNAL-REFLECTION FOR BABAR AT PEP-II, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 397(2-3), 1997, pp. 261-282
Citation: Hw. Kim et R. Reif, EX-SITU WAFER SURFACE CLEANING BY HF DIPPING FOR LOW-TEMPERATURE SILICON EPITAXY, Thin solid films, 305(1-2), 1997, pp. 280-285
Citation: Wz. Chen et al., DETERMINATION OF OPTICAL-CONSTANTS OF STRAINED SI1-XGEX EPITAXIAL LAYERS IN THE SPECTRAL RANGE 0.75-2.75 EV, Applied physics letters, 71(11), 1997, pp. 1525-1527
Authors:
CHANIMOV M
COHEN ML
GRINSPUN Y
HERBERT M
REIF R
KAUFMAN I
BAHAR M
Citation: M. Chanimov et al., NEUROTOXICITY AFTER SPINAL-ANESTHESIA INDUCED BY SERIAL INTRATHECAL INJECTIONS OF MAGNESIUM-SULFATE - AN EXPERIMENTAL-STUDY IN A RAT MODEL, Anaesthesia, 52(3), 1997, pp. 223-228
Citation: N. Nakano et al., ANALYSIS OF THERMAL EFFECT ON THE INTERFACIAL OXIDE BETWEEN POLYSILICON AND SILICON FOR POLYSILICON BIPOLAR-TRANSISTORS BY CAPACITANCE AND CONTACT RESISTANCE MEASUREMENTS, JPN J A P 1, 35(11), 1996, pp. 5670-5673
Citation: H. Kim et R. Reif, IN-SITU LOW-TEMPERATURE (600-DEGREES-C) WAFER SURFACE CLEANING BY ELECTRON-CYCLOTRON-RESONANCE HYDROGEN PLASMA FOR SILICON HOMOEPITAXIAL GROWTH, Thin solid films, 289(1-2), 1996, pp. 192-198
Citation: T. Noguchi et al., COMPARISON OF EFFECTS BETWEEN LARGE-AREA-BEAM ELA AND SPC ON TFT CHARACTERISTICS, I.E.E.E. transactions on electron devices, 43(9), 1996, pp. 1454-1458
Citation: T. Noguchi et al., RESISTIVITY STUDY OF P-IMPLANTED, B-IMPLANTED, AND BF2-IMPLANTED POLYCRYSTALLINE SI(1-X)G(X) FILMS WITH SUBSEQUENT ANNEALING (VOL 33, PG L1748, 1994), JPN J A P 2, 34(3A), 1995, pp. 338-338
Authors:
NEGRI M
BENDET N
HALEVY A
HALPERN Z
REIF R
BOGOKOVSKY H
SCAPA E
Citation: M. Negri et al., GASTRIC-MUCOSAL CHANGES FOLLOWING GASTROPLASTY - A COMPARATIVE-STUDY BETWEEN VERTICAL BANDED GASTROPLASTY AND SILASTIC RING VERTICAL GASTROPLASTY, Obesity surgery, 5(4), 1995, pp. 383-386
Citation: Zh. Zhou et R. Reif, EPI-FILM THICKNESS MEASUREMENTS USING EMISSION FOURIER-TRANSFORM INFRARED-SPECTROSCOPY .1. SENSOR CHARACTERIZATION, IEEE transactions on semiconductor manufacturing, 8(3), 1995, pp. 333-339
Citation: Zh. Zhou et R. Reif, EPI-FILM THICKNESS MEASUREMENTS USING EMISSION FOURIER-TRANSFORM INFRARED-SPECTROSCOPY .2. REAL-TIME IN-SITU PROCESS MONITORING AND CONTROL, IEEE transactions on semiconductor manufacturing, 8(3), 1995, pp. 340-345
Authors:
ASTON D
HEARTY C
KADYK J
KAWAHARA H
LU A
LYNCH G
MCSHURLEY D
MEADOWS B
MULLER D
OXOBY G
POPE W
PRIPSTEIN M
RATCLIFF B
REIF R
SIMOPOULOS C
SMY M
STAENGLE H
STILES P
WANG MZ
WARNER D
WENZEL W
WILSON RJ
YELLIN S
ZHU Y
Citation: D. Aston et al., TEST OF A CONCEPTUAL PROTOTYPE OF THE TOTAL INTERNAL-REFLECTION CHERENKOV IMAGING DETECTOR (DIRC) WITH COSMIC MUONS, IEEE transactions on nuclear science, 42(4), 1995, pp. 534-538
Citation: Ja. Tsai et al., EFFECTS OF GE ON MATERIAL AND ELECTRICAL-PROPERTIES OF POLYCRYSTALLINE SI1-XGEX FOR THIN-FILM TRANSISTORS, Journal of the Electrochemical Society, 142(9), 1995, pp. 3220-3225