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Results:
1-24
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Results: 24
Authors:
RONNOW D
LASTRASMARTINEZ LF
CARDONA M
Citation: D. Ronnow et al., ISOTOPE EFFECTS ON THE ELECTRONIC CRITICAL-POINTS OF GERMANIUM - ELLIPSOMETRIC INVESTIGATION OF THE E-1 AND E-1+DELTA(1) TRANSITIONS, The European Physical Journal. B: Condensed Matter Physics, 5(1), 1998, pp. 29-35
Authors:
RONNOW D
EISENHAMMER T
ROOS A
Citation: D. Ronnow et al., SURFACE-ROUGHNESS CHARACTERIZATION OF A THIN TRANSPARENT DIELECTRIC-SILVER TANDEM BY SPECTROSCOPIC LIGHT-SCATTERING, Solar energy materials and solar cells, 52(1-2), 1998, pp. 37-43
Authors:
RONNOW D
SANTOS P
CARDONA M
ANASTASSAKIS E
KUBALL M
Citation: D. Ronnow et al., PIEZO-OPTICS OF INP IN THE VISIBLE-ULTRAVIOLET RANGE, Physical review. B, Condensed matter, 57(8), 1998, pp. 4432-4442
Authors:
RONNOW D
Citation: D. Ronnow, INTERFACE ROUGHNESS STATISTICS OF THIN-FILMS FROM ANGLE-RESOLVED LIGHT-SCATTERING AT 3 WAVELENGTHS, Optical engineering, 37(2), 1998, pp. 696-704
Authors:
RONNOW D
LINDSTROM T
ISIDORSSON J
RIBBING CG
Citation: D. Ronnow et al., SURFACE-ROUGHNESS OF OXIDIZED COPPER-FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY AND SPECTROSCOPIC LIGHT-SCATTERING, Thin solid films, 325(1-2), 1998, pp. 92-98
Authors:
CARDONA M
RONNOW D
SANTOS PV
Citation: M. Cardona et al., ELLIPSOMETRIC INVESTIGATIONS OF PIEZO-OPTICAL EFFECTS, Thin solid films, 313, 1998, pp. 10-17
Authors:
GRANQVIST CG
AZENS A
HJELM A
KULLMAN L
NIKLASSON GA
RONNOW D
MATTSSON MS
VESZELEI M
VAIVARS G
Citation: Cg. Granqvist et al., RECENT ADVANCES IN ELECTROCHROMICS FOR SMART WINDOWS APPLICATIONS, Solar energy, 63(4), 1998, pp. 199-216
Authors:
RONNOW D
ISIDORSSON J
Citation: D. Ronnow et J. Isidorsson, ELECTROCRYSTALLIZATION STUDIED IN-SITU BY OPTICAL-SCATTERING (VOL 100, PG 695, 1997), Solid state communications, 101(10), 1997, pp. 783-783
Authors:
GRANQVIST CG
AZENS A
ISIDORSSON J
KHARRAZI M
KULLMAN L
LINDSTROM T
NIKLASSON GA
RIBBING CG
RONNOW D
MATTSSON MS
VESZELEI M
Citation: Cg. Granqvist et al., TOWARDS THE SMART WINDOW - PROGRESS IN ELECTROCHROMICS, Journal of non-crystalline solids, 218, 1997, pp. 273-279
Authors:
RONNOW D
Citation: D. Ronnow, DETERMINATION OF INTERFACE ROUGHNESS CROSS-CORRELATION OF THIN-FILMS FROM SPECTROSCOPIC LIGHT-SCATTERING MEASUREMENTS, Journal of applied physics, 81(8), 1997, pp. 3627-3636
Authors:
LINDSTROM T
KULLMAN L
RONNOW D
RIBBING CG
GRANQVIST CG
Citation: T. Lindstrom et al., ELECTROCHROMIC CONTROL OF THIN-FILM LIGHT-SCATTERING, Journal of applied physics, 81(3), 1997, pp. 1464-1469
Authors:
RONNOW D
ISIDORSSON J
NIKLASSON GA
Citation: D. Ronnow et al., SURFACE-ROUGHNESS OF SPUTTERED ZRO2 FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY AND SPECTROSCOPIC LIGHT-SCATTERING, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 54(4), 1996, pp. 4021-4026
Authors:
GRANQVIST CG
AZENS A
KULLMAN L
RONNOW D
Citation: Cg. Granqvist et al., PROGRESS IN SMART WINDOWS RESEARCH - IMPROVED ELECTROCHROMIC W-OXIDE-FILMS AND TRANSPARENT TI-CE OXIDE COUNTER ELECTRODES, Renewable energy, 8(1-4), 1996, pp. 97-106
ELASTIC LIGHT-SCATTERING AND ELECTROCHEMICAL DURABILITY OF ELECTROCHROMIC TUNGSTEN-OXIDE-BASED FILMS
Authors:
KULLMAN L
RONNOW D
GRANQVIST CG
Citation: L. Kullman et al., ELASTIC LIGHT-SCATTERING AND ELECTROCHEMICAL DURABILITY OF ELECTROCHROMIC TUNGSTEN-OXIDE-BASED FILMS, Thin solid films, 288(1-2), 1996, pp. 330-333
Authors:
RONNOW D
KULLMAN L
GRANQVIST CG
Citation: D. Ronnow et al., SPECTROSCOPIC LIGHT-SCATTERING FROM ELECTROCHROMIC TUNGSTEN-OXIDE-BASED FILMS, Journal of applied physics, 80(1), 1996, pp. 423-430
Authors:
ROOS A
RONNOW D
Citation: A. Roos et D. Ronnow, DIFFUSE-REFLECTANCE AND TRANSMITTANCE SPECTRA OF AN INTERFERENCE LAYER .1. MODEL FORMULATION AND PROPERTIES (VOL 33, PG 7908, 1994), Applied optics, 35(16), 1996, pp. 3076-3076
Authors:
RONNOW D
ANDERSON SK
NIKLASSON GA
Citation: D. Ronnow et al., SURFACE-ROUGHNESS EFFECTS IN ELLIPSOMETRY - COMPARISON OF TRUNCATED SPHERE AND EFFECTIVE-MEDIUM MODELS, Optical materials, 4(6), 1995, pp. 815-821
Authors:
RONNOW D
ROOS A
Citation: D. Ronnow et A. Roos, CORRECTION FACTORS FOR REFLECTANCE AND TRANSMITTANCE MEASUREMENTS OF SCATTERING SAMPLES FOCUSING COBLENTZ SPHERES AND INTEGRATING SPHERES, Review of scientific instruments, 66(3), 1995, pp. 2411-2422
Authors:
LEFEZ B
KAROUNI K
LENGLET M
RONNOW D
RIBBING CG
Citation: B. Lefez et al., APPLICATION OF REFLECTANCE SPECTROPHOTOMETRY TO THE STUDY OF COPPER(I) OXIDES (CU2O AND CU3O2) ON METALLIC SUBSTRATE, Surface and interface analysis, 22(1-12), 1994, pp. 451-455
Authors:
RONNOW D
VESZELEI E
Citation: D. Ronnow et E. Veszelei, DESIGN REVIEW OF AN INSTRUMENT FOR SPECTROSCOPIC TOTAL INTEGRATED LIGHT-SCATTERING MEASUREMENTS IN THE VISIBLE WAVELENGTH REGION, Review of scientific instruments, 65(2), 1994, pp. 327-334
Authors:
ROOS A
RONNOW D
Citation: A. Roos et D. Ronnow, DIFFUSE-REFLECTANCE AND TRANSMITTANCE SPECTRA OF AN INTERFERENCE LAYER .1. MODEL FORMULATION AND PROPERTIES, Applied optics, 33(34), 1994, pp. 7908-7917
Authors:
RONNOW D
ROOS A
Citation: D. Ronnow et A. Roos, DIFFUSE-REFLECTANCE AND TRANSMITTANCE SPECTRA OF AN INTERFERENCE LAYER .2. EVALUATION OF TIN OXIDE-COATED GLASS, Applied optics, 33(34), 1994, pp. 7918-7927
Authors:
RONNOW D
ROOS A
Citation: D. Ronnow et A. Roos, STRAY-LIGHT CORRECTIONS IN INTEGRATING-SPHERE MEASUREMENTS ON LOW-SCATTERING SAMPLES, Applied optics, 33(25), 1994, pp. 6092-6097
Authors:
RONNOW D
BERGKVIST M
ROOS A
RIBBING CG
Citation: D. Ronnow et al., DETERMINATION OF INTERFACE ROUGHNESS BY USING A SPECTROSCOPIC TOTAL-INTEGRATED-SCATTER INSTRUMENT, Applied optics, 32(19), 1993, pp. 3448-3451
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