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Results: 1-25/54
Authors:
DRESEL T
BRINKMANN S
SCHREINER R
SCHWIDER J
Citation: T. Dresel et al., TESTING OF ROD OBJECTS BY GRAZING-INCIDENCE INTERFEROMETRY - THEORY, Journal of the Optical Society of America. A, Optics, image science,and vision., 15(11), 1998, pp. 2921-2928
Authors:
PFUND J
LINDLEIN N
SCHWIDER J
Citation: J. Pfund et al., DYNAMIC-RANGE EXPANSION OF A SHACK-HARTMANN SENSOR BY USE OF A MODIFIED UNWRAPPING ALGORITHM, Optics letters, 23(13), 1998, pp. 995-997
Authors:
PFUND J
LINDLEIN N
SCHWIDER J
BUROW R
BLUMEL T
ELSSNER KE
Citation: J. Pfund et al., ABSOLUTE SPHERICITY MEASUREMENT - A COMPARATIVE-STUDY OF THE USE OF INTERFEROMETRY AND A SHACK-HARTMANN SENSOR, Optics letters, 23(10), 1998, pp. 742-744
Authors:
EISNER M
LINDLEIN N
SCHWIDER J
Citation: M. Eisner et al., CONFOCAL MICROSCOPY WITH A REFRACTIVE MICROLENS-PINHOLE ARRAY, Optics letters, 23(10), 1998, pp. 748-749
Authors:
BRINKMANN S
SCHREINER R
DRESEL T
SCHWIDER J
Citation: S. Brinkmann et al., INTERFEROMETRIC TESTING OF PLANE AND CYLINDRICAL WORKPIECES WITH COMPUTER-GENERATED HOLOGRAMS, Optical engineering, 37(9), 1998, pp. 2506-2511
Authors:
LINDLEIN N
SIMON F
SCHWIDER J
Citation: N. Lindlein et al., SIMULATION OF MICRO-OPTICAL ARRAY SYSTEMS WITH RAYTRACE, Optical engineering, 37(6), 1998, pp. 1809-1816
Authors:
SCHWIDER J
Citation: J. Schwider, DOE-BASED INTERFEROMETRY, Optik, 108(4), 1998, pp. 181-196
Authors:
PFUND J
LINDLEIN N
SCHWIDER J
Citation: J. Pfund et al., MISALIGNMENT EFFECTS OF THE SHACK-HARTMANN SENSOR, Applied optics, 37(1), 1998, pp. 22-27
Authors:
GUNDLACH A
HUNTLEY JM
MANZKE B
SCHWIDER J
Citation: A. Gundlach et al., SPECKLE SHEARING INTERFEROMETRY USING A DIFFRACTIVE OPTICAL BEAMSPLITTER, Optical engineering, 36(5), 1997, pp. 1488-1493
Authors:
SCHWIDER J
SICKINGER H
Citation: J. Schwider et H. Sickinger, ARRAYTESTS FOR MICROLENSES, Optik, 107(1), 1997, pp. 26-34
Authors:
SCHWIDER J
Citation: J. Schwider, WHITE-LIGHT FIZEAU INTERFEROMETER, Applied optics, 36(7), 1997, pp. 1433-1437
Authors:
SCHREIBER H
SCHWIDER J
Citation: H. Schreiber et J. Schwider, LATERAL SHEARING INTERFEROMETER BASED ON 2 RONCHI PHASE GRATINGS IN SERIES, Applied optics, 36(22), 1997, pp. 5321-5324
Authors:
LINDLEIN N
SCHREINER R
BRINKMANN S
DRESEL T
SCHWIDER J
Citation: N. Lindlein et al., AXICON-TYPE TEST INTERFEROMETER FOR CYLINDRICAL SURFACES - SYSTEMATIC-ERROR ASSESSMENT, Applied optics, 36(13), 1997, pp. 2791-2795
Authors:
HASELBECK S
SCHWIDER J
Citation: S. Haselbeck et J. Schwider, MEASUREMENT OF MICROOPTICAL COMPONENTS US ING ATOMIC-FORCE MICROSCOPY, TM. Technisches Messen, 63(5), 1996, pp. 191-193
Authors:
DRESEL T
SCHWIDER J
Citation: T. Dresel et J. Schwider, FABRICATION OF OPTICAL-COMPONENTS BY LASER LITHOGRAPHY, Applied surface science, 106, 1996, pp. 379-382
Authors:
FALKENSTORFER O
LINDLEIN N
KEINONEN T
SCHWIDER J
Citation: O. Falkenstorfer et al., DIFFRACTION-LIMITED HOLOGRAPHIC LENSES IN DICHROMATED GELATIN, Optical engineering, 35(7), 1996, pp. 2026-2033
Authors:
KIPFER P
COLLISCHON M
HAIDNER H
SCHWIDER J
Citation: P. Kipfer et al., SUBWAVELENGTH STRUCTURES AND THEIR USE IN DIFFRACTIVE OPTICS, Optical engineering, 35(3), 1996, pp. 726-731
Authors:
SCHWIDER J
Citation: J. Schwider, ACHROMATIC DESIGN OF HOLOGRAPHIC OPTICAL INTERCONNECTS, Optical engineering, 35(3), 1996, pp. 826-831
Authors:
EISNER M
SCHWIDER J
Citation: M. Eisner et J. Schwider, TRANSFERRING RESIST MICROLENSES INTO SILICON BY REACTIVE ION ETCHING, Optical engineering, 35(10), 1996, pp. 2979-2982
Authors:
HEISSMEIER M
SHERIDAN JT
SCHWIDER J
Citation: M. Heissmeier et al., CALIBRATION OF A MICROLITHOGRAPHIC FABRICATION PROCESS USING NONDESTRUCTIVE TESTING AND RIGOROUS ELECTROMAGNETIC THEORY, Optik, 103(1), 1996, pp. 12-18
Authors:
BRINKMANN S
DRESEL T
SCHREINER R
SCHWIDER J
Citation: S. Brinkmann et al., AXICON-TYPE TEST INTERFEROMETER FOR CYLINDRICAL SURFACES, Optik, 102(3), 1996, pp. 106-110
Authors:
BRENNER KH
HAUSLER G
LEUCHS G
SCHWIDER J
Citation: Kh. Brenner et al., CONGRATULATIONS TO LOHMANN,ADOLF, Optik, 102(3), 1996, pp. 135-135
Authors:
DU C
ZURL K
SCHWIDER J
Citation: C. Du et al., WAVE-FRONT CHARACTERIZATION WITH A MINIATURIZED SHACK-HARTMANN SENSOR, Optik, 101(4), 1996, pp. 151-156
Authors:
SCHWIDER J
SCHREIBER H
ZHOU L
Citation: J. Schwider et al., PHYSICAL LIMITATIONS AND CHALLENGES IN MODERN INTERFEROMETRY, Optik, 101(4), 1996, pp. 166-172
Authors:
DRESEL T
BEYERLEIN M
SCHWIDER J
Citation: T. Dresel et al., DESIGN OF COMPUTER-GENERATED BEAM-SHAPING HOLOGRAMS BY ITERATIVE FINITE-ELEMENT MESH ADAPTION, Applied optics, 35(35), 1996, pp. 6865-6874