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Results:
1-16
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Results: 16
Authors:
DORFFEL W
ALBRECHT M
LUDERS H
MARCINIAK H
PARWARESCH R
SCHWARZE EW
TRAUZEDDEL R
HAVERS W
HENZE G
JANKASCHAUB G
MANN G
NIEMEYER C
POTTER R
SCHELLONG G
SELLE B
TREUNER J
RUHL U
Citation: W. Dorffel et al., MULTINATIONAL TRIAL FOR TREATMENT OF HODGKINS-DISEASE IN CHILDHOOD AND ADOLESCENCE GPOH-HD-95 - INTERIM-REPORT AFTER 21 2 YEARS/, Klinische Padiatrie, 210(4), 1998, pp. 212-219
Authors:
BOHNE W
REINSPERGER GU
ROHRICH J
ROSCHERT G
SELLE B
Citation: W. Bohne et al., COMPOSITION ANALYSIS OF CO DOPED FESIX FILMS BY COMBINING STANDARD AND HEAVY-ION RBS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 273-277
Authors:
TIEFENBACHER U
DEBUS J
HUBER PE
FUSS M
SELLE B
WANNENMACHER M
Citation: U. Tiefenbacher et al., THE ROLE OF CONFORMAL STEREOTACTIC RADIOTHERAPY IN THE TREATMENT OF RECURRENT MEDULLOBLASTOMA, Radiology, 209P, 1998, pp. 975-975
Authors:
MARTINEZ FL
MARTIL I
GONZALEZDIAZ G
SELLE B
SIEBER I
Citation: Fl. Martinez et al., INFLUENCE OF RAPID THERMAL ANNEALING PROCESSES ON THE PROPERTIES OF SINX-H FILMS DEPOSITED BY THE ELECTRON-CYCLOTRON-RESONANCE METHOD, Journal of non-crystalline solids, 230, 1998, pp. 523-527
Authors:
TIEFENBACHER U
DEBUS J
FUSS M
HUBER P
SELLE B
WANNENMACHER M
Citation: U. Tiefenbacher et al., IS THERE A ROLE OF 3-DIMENSIONAL CONFORMAL BOOST FOR THE TREATMENT OFMEDULLOBLASTOMA, European journal of cancer, 33, 1997, pp. 916-916
Authors:
SCHOPKE A
SELLE B
SIEBER I
REINSPERGER GU
STAUSS P
HERZ K
POWALLA M
Citation: A. Schopke et al., CHARACTERIZATION OF THE STOICHIOMETRY OF COEVAPORATED FESIX FILMS BY AES, EDX, RES, AND ELECTRON-MICROSCOPY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 322-325
Authors:
SCHNELLBUGEL A
SELLE B
ANTON R
Citation: A. Schnellbugel et al., DETERMINATION OF THE STOICHIOMETRY AND THE YB2+ YB3+ RATIO IN YBFX, OPTICAL IAD FILMS BY RES AND IN-SITU XPS ANALYSIS/, Mikrochimica acta, 125(1-4), 1997, pp. 239-243
Authors:
DOSCHER M
OERTEL G
REINSPERGER GU
SELLE B
SIEBER I
TROPPENZ U
Citation: M. Doscher et al., COMBINATION OF RBS ANALYSIS AND INFRARED VIBRATIONAL SPECTROSCOPY FORTHE CHARACTERIZATION OF SEMICONDUCTING BETA-FESI2 FILMS, Mikrochimica acta, 125(1-4), 1997, pp. 257-261
Authors:
BOHNE W
FENSKE F
KELLING S
SCHOPKE A
SELLE B
Citation: W. Bohne et al., REFINED RES AND AES TECHNIQUES FOR THE ANALYSIS OF THIN-FILMS USED INPHOTOVOLTAIC DEVICES, Physica status solidi. b, Basic research, 194(1), 1996, pp. 69-78
Authors:
FENSKE F
LANGE H
OERTEL G
REINSPERGER GU
SCHUMANN J
SELLE B
Citation: F. Fenske et al., CHARACTERIZATION OF SEMICONDUCTING SILICIDE FILMS BY INFRARED VIBRATIONAL SPECTROSCOPY, Materials chemistry and physics, 43(3), 1996, pp. 238-242
Authors:
FENSKE F
SCHOPKE A
SCHULZE S
SELLE B
Citation: F. Fenske et al., ANALYTICAL STUDIES OF NICKEL SILICIDE FORMATION THROUGH A THIN TI LAYER, Applied surface science, 104, 1996, pp. 218-222
Authors:
LANGE H
HENRION W
SELLE B
REINSPERGER GU
OERTEL G
VONKANEL H
Citation: H. Lange et al., OPTICAL-PROPERTIES OF BETA-FESI2 FILMS GROWN ON SI SUBSTRATES WITH DIFFERENT DEGREE OF STRUCTURAL PERFECTION, Applied surface science, 102, 1996, pp. 169-172
Authors:
SIEBER I
SCHOPKE A
SELLE B
Citation: I. Sieber et al., COMPARATIVE COMPOSITION ANALYSIS OF SIOX AND SINX THIN-FILMS BY AES, EDX AND RBS, Fresenius' journal of analytical chemistry, 353(5-8), 1995, pp. 639-641
RBS ANALYSIS OF THIN MOSIX FILMS - CORRELATION BETWEEN STOICHIOMETRY AND SOME FEATURES OF SPUTTERING
Authors:
ELSTNER B
SCHOPKE A
SELLE B
Citation: B. Elstner et al., RBS ANALYSIS OF THIN MOSIX FILMS - CORRELATION BETWEEN STOICHIOMETRY AND SOME FEATURES OF SPUTTERING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 297-300
Authors:
KRANKENHAGEN R
SCHMIDT M
HENRION W
SIEBER I
SELLE B
FLIETNER H
Citation: R. Krankenhagen et al., OPTICAL AND PHOTOELECTRICAL PROPERTIES OF MU-C-SI LAYERS AND THE INFLUENCE OF SUBSEQUENT HYDROGENATION, Physica status solidi. a, Applied research, 145(2), 1994, pp. 401-406
Authors:
REINSPERGER GU
SCHOPKE A
SELLE B
Citation: Gu. Reinsperger et al., QUANTITATIVE COMPOSITION ANALYSIS OF SEMICONDUCTING SILICIDE FILMS, Physica status solidi. a, Applied research, 145(2), 1994, pp. 425-428
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