Authors:
GALAEV AA
PARKHOMENKO YN
PODGORNYI DA
SHCHERBACHEV KD
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Citation: Vt. Bublik et Kd. Shcherbachev, X-RAY DIFFUSE-SCATTERING BY MICRODEFECTS IN NONSTOICHIOMETRIC INSB SINGLE-CRYSTALS, Crystallography reports, 42(2), 1997, pp. 286-290
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Citation: Kd. Shcherbachev et al., THE STUDY OF MICRODEFECTS IN GAAS SINGLE- CRYSTALS DOPED WITH SI BY X-RAY DIFFUSE-SCATTERING, Kristallografia, 40(5), 1995, pp. 868-876
Citation: Vt. Bublik et Kd. Shcherbachev, MICRODEFECTS IN UNDOPED GAAS SINGLE-CRYST ALS GROWN FROM THE MELTS OFDIFFERENT NONSTOICHIOMETRIC COMPOSITIONS, Kristallografia, 39(6), 1994, pp. 1105-1111
Citation: Kd. Shcherbachev et Vt. Bublik, MEASUREMENT OF DIFFUSE-X-RAY SCATTERING ON A 3-CRYSTAL X-RAY DIFFRACTOMETER, Industrial laboratory, 60(8), 1994, pp. 473-477