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Results: 1-25/57
Authors:
OKINO H
TOYODA Y
SHIMIZU M
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: H. Okino et al., THERMALLY STIMULATED CURRENT AND POLARIZATION FATIGUE IN PB(ZR,TI)O-3THIN-FILMS, JPN J A P 1, 37(9B), 1998, pp. 5137-5140
Authors:
IBRAHIM RC
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: Rc. Ibrahim et al., HIGHLY ORIENTED NB-DOPED LEAD TITANATE THIN-FILMS BY REACTIVE SPUTTERING - FABRICATION AND STRUCTURE ANALYSES, JPN J A P 1, 37(8), 1998, pp. 4539-4543
Authors:
FUJISAWA H
HYODO S
JITSUI K
SHIMIZU M
NIU H
OKINO H
SHIOSAKI T
Citation: H. Fujisawa et al., ELECTRICAL-PROPERTIES OF PZT THIN-FILMS GROWN ON IR IRO2 BOTTOM ELECTRODES BY MOCVD/, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 107-114
Authors:
UEYAMA R
KAMADA K
HARADA A
UEYAMA T
YAMAMOTO T
SHIOSAKI T
KURIBAYASHI K
Citation: R. Ueyama et al., PREPARATION OF AG-PD ALLOY POWDERS AND THEIR EVALUATION FOR USE IN MULTILAYER INTERNAL ELECTRODE (PART 1), Nippon Seramikkusu Kyokai gakujutsu ronbunshi, 106(9), 1998, pp. 942-946
Authors:
SHIOSAKI T
SHIMIZU M
Citation: T. Shiosaki et M. Shimizu, PB-BASED AND BI-BASED FERROELECTRIC THIN-FILMS, Journal of the Korean Physical Society, 32, 1998, pp. 1316-1320
Authors:
SHIMIZU M
FUJISAWA H
HYODO S
NAKASHIMA S
NIU H
OKINO H
SHIOSAKI T
Citation: M. Shimizu et al., PB(ZR,TI)O-3 THIN-FILM DEPOSITION ON IR AND IRO2 ELECTRODES BY MOCVD, Journal of the Korean Physical Society, 32, 1998, pp. 1349-1352
Authors:
NISHIDA T
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: T. Nishida et al., EVALUATIONS OF INPLANE ORIENTATION OF LINBO3 FILMS USING AN ENERGY-DISPERSIVE TOTAL-REFLECTION X-RAY DIFFRACTOMETER, Journal of the Korean Physical Society, 32, 1998, pp. 1622-1624
Authors:
SHIMIZU M
HYODO S
FUJISAWA H
NIU H
SHIOSAKI T
Citation: M. Shimizu et al., STEP COVERAGE CHARACTERISTICS OF PB(ZR, TI)O-3 THIN-FILMS ON VARIOUS ELECTRODE MATERIALS BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, JPN J A P 1, 36(9B), 1997, pp. 5808-5811
Authors:
CHEN ZM
ADACHI M
SHIOSAKI T
KAWABATA A
Citation: Zm. Chen et al., GROWTH OF BATIO3-CE SINGLE-CRYSTALS AND THEIR PROPERTIES, JPN J A P 1, 36(9B), 1997, pp. 5943-5946
Authors:
NISHIDA T
IBRAHIM RC
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: T. Nishida et al., THEORETICAL-STUDY ON SURFACE-ACOUSTIC-WAVE CHARACTERISTICS OF LINBO3 FILMS ON SAPPHIRE SUBSTRATES, JPN J A P 1, 36(9B), 1997, pp. 6077-6082
Authors:
OKINO H
SHIMIZU M
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: H. Okino et al., A STUDY OF THE DEFECT STRUCTURES IN MOCVD-GROWN PBZRXTI1-XO3 THIN-FILMS BY THERMALLY STIMULATED CURRENT MEASUREMENTS, Integrated ferroelectrics, 18(1-4), 1997, pp. 63-70
Authors:
FUJISAWA H
SHIMIZU M
NIU H
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: H. Fujisawa et al., SIMULTANEOUS OBSERVATION OF THE SURFACE-TOPOGRAPHY AND CURRENT FLOW OF PZT THIN-FILMS USING AN ATOMIC-FORCE MICROSCOPE, Integrated ferroelectrics, 18(1-4), 1997, pp. 71-78
Authors:
OKAMURA S
MORI K
TSUKAMOTO T
SHIOSAKI T
Citation: S. Okamura et al., FABRICATION OF FERROELECTRIC BI4TI3O12 THIN-FILMS AND MICROPATTERNS BY MEANS OF CHEMICAL SOLUTION DECOMPOSITION AND ELECTRON-BEAM IRRADIATION, Integrated ferroelectrics, 18(1-4), 1997, pp. 311-318
Authors:
FUJISAWA H
SHIMIZU M
SHIOSAKI T
Citation: H. Fujisawa et al., CHARACTERIZATION OF PB(ZR,TI)O-3 THIN-FILMS BY MOCVD USING THE TOTAL-REFLECTION X-RAY-DIFFRACTION METHOD, Integrated ferroelectrics, 15(1-4), 1997, pp. 1-8
Authors:
SHIMIZU M
FUJISAWA H
SHIOSAKI T
Citation: M. Shimizu et al., EFFECTS OF LA AND NB MODIFICATION ON THE ELECTRICAL-PROPERTIES OF PB(ZR,TI)O-3 THIN-FILMS BY MOCVD, Integrated ferroelectrics, 14(1-4), 1997, pp. 69-75
Authors:
SHIMIZU M
FUJISAWA H
SHIOSAKI T
Citation: M. Shimizu et al., MOCVD OF PB-BASED FERROELECTRIC OXIDE THIN-FILMS, Journal of crystal growth, 174(1-4), 1997, pp. 464-472
Authors:
FUJISAWA H
SHIMIZU M
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: H. Fujisawa et al., INVESTIGATION OF THE CURRENT PATH OF PB(ZR,TI)O-3 THIN-FILMS USING ANATOMIC-FORCE MICROSCOPE WITH SIMULTANEOUS CURRENT MEASUREMENT, Applied physics letters, 71(3), 1997, pp. 416-418
Authors:
ISHIBASHI Y
ICHINOSE N
OKUYAMA M
SHIOSAKI T
YOSHINO K
Citation: Y. Ishibashi et al., FERROELECTRIC MATERIALS AND THEIR APPLICATIONS - FOREWORD, JPN J A P 1, 35(9B), 1996, pp. 6-6
Authors:
FUJISAWA H
SHIMIZU M
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: H. Fujisawa et al., DEPENDENCE OF CRYSTALLINE-STRUCTURE AND LATTICE-PARAMETERS ON FILM THICKNESS IN PBTIO3 PT/MGO EPITAXIAL STRUCTURE/, JPN J A P 1, 35(9B), 1996, pp. 4913-4918
Authors:
IBRAHIM RC
SAKAI T
NISHIDA T
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: Rc. Ibrahim et al., CHARACTERIZATION OF NIOBIUM-DOPED LEAD TITANATE THIN-FILMS, JPN J A P 1, 35(9B), 1996, pp. 4995-4998
Authors:
NISHIDA T
ISHIDA K
HORIUCHI T
SHIOSAKI T
MATSUSHIGE K
Citation: T. Nishida et al., INPLANE OBSERVATIONS OF RF-SPUTTERED LINBO3 THIN-FILMS USING AN ENERGY-DISPERSIVE TOTAL-REFLECTION X-RAY DIFFRACTOMETER, JPN J A P 2, 35(12B), 1996, pp. 1699-1702
Authors:
SCOTT JF
ADACHI M
SHIOSAKI T
Citation: Jf. Scott et al., PROCEEDINGS OF THE 3RD PACIFIC-RIM-CONFERENCE ON FERROELECTRIC APPLICATIONS - CO-OP INN KYOTO, KYOTO, JAPAN - MAY 27-29, 1996 .2. GUEST EDITORIAL, Integrated ferroelectrics, 13(1-3), 1996, pp. 11-12
Authors:
SCOTT JF
ADACHI M
SHIOSAKI T
Citation: Jf. Scott et al., PROCEEDINGS OF THE 3RD CIFIC-RIM-CONFERENCE-ON-FERROELECTRIC-APPLICATIONS - CO-OP INN KYOTO, KYOTO, JAPAN - MAY 27-29, 1996 .1., Integrated ferroelectrics, 12(2-4), 1996, pp. 7-8
Authors:
UYEDA M
SHIOSAKI T
YOKOMIZO K
SUZUKI K
URAKI F
TANAKA T
KIDO Y
Citation: M. Uyeda et al., MICROBIAL-DEGRADATION OF DISINFECTANTS, STRUCTURES OF CHLORHEXIDINE DEGRADATION INTERMEDIATES, CHDI-B, CHDI-BR AND CHDI-D, PRODUCED BY PSEUDOMONAS SP STRAIN NO A-3, Eisei Kagaku, 42(2), 1996, pp. 121-126
Authors:
HIDAKA T
MARUYAMA T
SAITOH M
MIKOSHIBA N
SHIMIZU M
SHIOSAKI T
WILLS LA
HISKES R
DICAROLIS SA
AMANO J
Citation: T. Hidaka et al., FORMATION AND OBSERVATION OF 50 NM POLARIZED DOMAINS IN PBZR1-XTIXO3 THIN-FILM USING SCANNING PROBE MICROSCOPE, Applied physics letters, 68(17), 1996, pp. 2358-2359