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Results:
1-8
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Results: 8
Authors:
ROSU MF
NIESEN L
VANVEEN A
SLOOF WG
Citation: Mf. Rosu et al., A MOSSBAUER STUDY OF KR INCORPORATIONS IN SPUTTERED A-SI FILMS, Journal of physics. Condensed matter, 8(12), 1996, pp. 1971-1978
Authors:
SLOOF WG
KOOI BJ
DELHEZ R
DEKEIJSER TH
MITTEMEIJER EJ
Citation: Wg. Sloof et al., DIFFRACTION ANALYSIS OF NONUNIFORM STRESSES IN SURFACE-LAYERS - APPLICATION TO CRACKED TIN COATINGS CHEMICALLY VAPOR-DEPOSITED ON MO, Journal of materials research, 11(6), 1996, pp. 1440-1457
Authors:
GREUTER MJW
NIESEN L
VANVEEN A
HAKVOORT RA
VERWERFT M
DEHOSSON JTM
BERNTSEN AJM
SLOOF WG
Citation: Mjw. Greuter et al., KR INCORPORATION IN SPUTTERED AMORPHOUS SI LAYERS, Journal of applied physics, 77(7), 1995, pp. 3467-3478
Authors:
ZANDBERGEN HW
SLOOF WG
CAVA RJ
KRAJEWSKI JJ
PECK WF
Citation: Hw. Zandbergen et al., ELECTRON-MICROSCOPY ON YPD5B3CX, X=0 OR 0.35, Physica. C, Superconductivity, 226(3-4), 1994, pp. 365-376
Authors:
APPELBOOM HM
MATIJASEVIC VC
MATHU F
RIETVELD G
ANCZYKOWSKI B
PETERSE WJAM
TUINSTRA F
MOOIJ JE
SLOOF WG
RIJKEN HA
KLEIN SS
VANIJZENDOORN LJ
Citation: Hm. Appelboom et al., SM-BA-CU-O FILMS GROWN AT LOW-TEMPERATURE AND PRESSURE, Physica. C, Superconductivity, 214(3-4), 1993, pp. 323-334
Authors:
GREUTER MJW
NIESEN L
HAKVOORT RA
DEROODE J
VANVEEN A
BERNTSEN AJM
SLOOF WG
Citation: Mjw. Greuter et al., KRYPTON INCORPORATION IN SPUTTERED SILICON FILMS, Hyperfine interactions, 79(1-4), 1993, pp. 669-674
Authors:
ALKEMADE PFA
WERNER K
RADELAAR S
SLOOF WG
Citation: Pfa. Alkemade et al., A FAST METHOD FOR THE SIMULATION OF XPS AND AES SPECTRA, Applied surface science, 70-1, 1993, pp. 24-28
Authors:
GOLDSTEIN JI
CHOI SK
VANLOO FJJ
HEIJLIGERS HJM
BASTIN GF
SLOOF WG
Citation: Ji. Goldstein et al., THE INFLUENCE OF OXIDE SURFACE-LAYERS ON BULK ELECTRON-PROBE MICROANALYSIS OF OXYGEN - APPLICATION TO TI-SI-O COMPOUNDS, Scanning, 15(3), 1993, pp. 165-170
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