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Citation: W. Bijnens et al., ELECTRICAL-FIELD INDUCED AGING OF POLYMER LIGHT-EMITTING-DIODES IN ANOXYGEN-RICH ATMOSPHERE STUDIED BY EMISSION MICROSCOPY, SCANNING ELECTRON-MICROSCOPY AND SECONDARY-ION MASS-SPECTROSCOPY, Synthetic metals, 96(2), 1998, pp. 87-96
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Citation: Vi. Dimitrov et al., A METHOD FOR DETERMINATION OF THE EFFECTIVE DIFFUSION-COEFFICIENT ANDSPUTTERING RATE DURING PLASMA-DIFFUSION TREATMENT, Surface & coatings technology, 99(3), 1998, pp. 234-241
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Citation: P. Demo et al., TRANSIENT NUCLEATION OF DIAMOND - THEORETICAL AND EXPERIMENTAL-STUDY, DIAMOND AND RELATED MATERIALS, 6(9), 1997, pp. 1092-1096
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Citation: V. Vorlicek et al., QUANTITATIVE STUDY OF RAMAN-SCATTERING AND DEFECT OPTICAL-ABSORPTION IN CVD DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 704-707
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Citation: G. Knuyt et al., ON THE DEVELOPMENT OF CVD DIAMOND FILM MORPHOLOGY DUE TO THE TWINNINGON (111)-SURFACES, DIAMOND AND RELATED MATERIALS, 6(2-4), 1997, pp. 435-439
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Citation: S. Wouters et al., INFLUENCE OF THE PLASMA CURRENT TO TI-MELT ON THE PLASMA PARAMETERS AND MICROSTRUCTURE OF TIN COATINGS IN THE TRIODE ION PLATING SYSTEM, Surface & coatings technology, 97(1-3), 1997, pp. 114-121
Citation: S. Kadlec et al., ENERGY-RESOLVED MASS-SPECTROMETRY AND MONTE-CARLO SIMULATION OF ATOMIC TRANSPORT IN MAGNETRON SPUTTERING, Surface & coatings technology, 97(1-3), 1997, pp. 633-641
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Citation: S. Wouters et al., ENERGY-RESOLVED MASS-SPECTRA OF IONS AND NEUTRALS IN TRIODE ION PLATING OF TI(C,N) COATINGS, Surface & coatings technology, 92(1-2), 1997, pp. 56-61
Citation: S. Kadlec et al., ENERGY-DISTRIBUTION OF IONS IN AN UNBALANCED MAGNETRON PLASMA MEASURED WITH ENERGY-RESOLVED MASS-SPECTROMETRY, Surface & coatings technology, 89(1-2), 1997, pp. 177-184
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Citation: Vi. Dimitrov et al., A SIMPLE DIFFUSION-MODEL OF SURFACE MODIFICATION BY PLASMA, Physica status solidi. a, Applied research, 159(2), 1997, pp. 405-416
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Citation: W. Deceuninck et al., DESIGN OF A NEW TEST STRUCTURE FOR THE STUDY OF ELECTROMIGRATION WITHEARLY RESISTANCE CHANGE MEASUREMENTS, Microelectronics and reliability, 37(12), 1997, pp. 1813-1816
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Citation: Vi. Dimitrov et al., A DIFFUSION-MODEL OF METAL-SURFACE MODIFICATION DURING PLASMA NITRIDING, Applied physics A: Materials science & processing, 63(5), 1996, pp. 475-480
Citation: M. Vanecek et al., EVIDENCE FOR THE PRINCIPAL DEFECT STATES IN CVD DIAMOND FILMS - OPTICAL STUDY, DIAMOND AND RELATED MATERIALS, 5(9), 1996, pp. 952-957
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Citation: M. Nesladek et al., INVESTIGATION OF N-DOPING IN CVD DIAMOND USING GAP STATES SPECTROSCOPY, DIAMOND AND RELATED MATERIALS, 5(9), 1996, pp. 1006-1011