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Results: 1-8 |
Results: 8
SINGLE-PROBE-BEAM DIFFERENTIAL AMPLITUDE AND PHASE-SCANNING INTERFEROMETER
Authors: SUDDENDORF MB SOMEKH MG SEE CW
Citation: Mb. Suddendorf et al., SINGLE-PROBE-BEAM DIFFERENTIAL AMPLITUDE AND PHASE-SCANNING INTERFEROMETER, Applied optics, 36(25), 1997, pp. 6202-6210
A FAST-SCANNING OPTICAL MICROSCOPE FOR IMAGING MAGNETIC DOMAIN-STRUCTURES
Authors: PING GL SEE CW SOMEKH MG SUDDENDORF MB VINCENT JH FOOTNER PK
Citation: Gl. Ping et al., A FAST-SCANNING OPTICAL MICROSCOPE FOR IMAGING MAGNETIC DOMAIN-STRUCTURES, Scanning, 18(1), 1996, pp. 8-12
COMBINED DIFFERENTIAL AMPLITUDE AND PHASE INTERFEROMETER WITH A SINGLE PROBE BEAM
Authors: SUDDENDORF MB SEE CW SOMEKH MG
Citation: Mb. Suddendorf et al., COMBINED DIFFERENTIAL AMPLITUDE AND PHASE INTERFEROMETER WITH A SINGLE PROBE BEAM, Applied physics letters, 67(1), 1995, pp. 28-30
RESPONSE OF INTERFEROMETER BASED PROBE SYSTEMS TO PHOTODISPLACEMENT IN LAYERED MEDIA
Authors: LIU M SUDDENDORF MB SOMEKH MG
Citation: M. Liu et al., RESPONSE OF INTERFEROMETER BASED PROBE SYSTEMS TO PHOTODISPLACEMENT IN LAYERED MEDIA, Journal of applied physics, 76(1), 1994, pp. 207-215
THERMAL-WAVE PROBE MICROSCOPY FOR MATERIALS CHARACTERIZATION
Authors: SUDDENDORF MB SOMEKH MG LIU M
Citation: Mb. Suddendorf et al., THERMAL-WAVE PROBE MICROSCOPY FOR MATERIALS CHARACTERIZATION, International journal of electronics, 77(1), 1994, pp. 71-76
SINGLE-BEAM PHOTOREFLECTANCE MICROSCOPY SYSTEM WITH ELECTRONIC FEEDBACK
Authors: SUDDENDORF MB SOMEKH MG
Citation: Mb. Suddendorf et Mg. Somekh, SINGLE-BEAM PHOTOREFLECTANCE MICROSCOPY SYSTEM WITH ELECTRONIC FEEDBACK, Electronics Letters, 30(5), 1994, pp. 398-399
MODELING OF PHOTOREFLECTANCE PHENOMENA IN LAYERED MEDIA
Authors: LIU M SUDDENDORF MB SOMEKH MG SHEARD SJ
Citation: M. Liu et al., MODELING OF PHOTOREFLECTANCE PHENOMENA IN LAYERED MEDIA, Semiconductor science and technology, 8(8), 1993, pp. 1639-1647
NONCONTACTING MEASUREMENT OF OPAQUE THIN-FILMS USING A DUAL-BEAM THERMAL-WAVE PROBE
Authors: SUDDENDORF MB LIU M SOMEKH MG
Citation: Mb. Suddendorf et al., NONCONTACTING MEASUREMENT OF OPAQUE THIN-FILMS USING A DUAL-BEAM THERMAL-WAVE PROBE, Applied physics letters, 62(25), 1993, pp. 3256-3258
Risultati: 1-8 |