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Results:
1-20
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Results: 20
Authors:
Nieminen, M
Sajavaara, T
Rauhala, E
Putkonen, M
Niinisto, L
Citation: M. Nieminen et al., Surface-controlled growth of LaAlO3 thin films by atomic layer epitaxy, J MAT CHEM, 11(9), 2001, pp. 2340-2345
Authors:
Vehkamaki, M
Hanninen, T
Ritala, M
Leskela, M
Sajavaara, T
Rauhala, E
Keinonen, J
Citation: M. Vehkamaki et al., Atomic layer deposition of SrTiO3 thin films from a novel strontium precursor-strontium-bis(tri-isopropylcyclopentadienyl), CHEM VAPOR, 7(2), 2001, pp. 75-80
Authors:
Putkonen, M
Sajavaara, T
Johansson, LS
Niinisto, L
Citation: M. Putkonen et al., Low-temperature ALE deposition of Y2O3 thin films from beta-diketonate precursors, CHEM VAPOR, 7(1), 2001, pp. 44-50
Authors:
Koskinen, J
Ronkainen, H
Varjus, S
Muukkonen, T
Holmberg, K
Sajavaara, T
Citation: J. Koskinen et al., Low friction ta-C films with hydrogen reservoirs, DIAM RELAT, 10(3-7), 2001, pp. 1030-1035
Authors:
Gago, R
Jimenez, I
Sajavaara, T
Rauhala, E
Albella, JM
Citation: R. Gago et al., X-Ray absorption studies of cubic boron-carbon-nitrogen films grown by ionbeam assisted evaporation, DIAM RELAT, 10(3-7), 2001, pp. 1165-1169
Authors:
Gago, R
Jimenez, I
Caceres, D
Agullo-Rueda, F
Sajavaara, T
Albella, JM
Climent-Font, A
Vergara, I
Raisanen, J
Rauhala, E
Citation: R. Gago et al., Hardening mechanisms in graphitic carbon nitride films grown with N-2/Ar ion assistance, CHEM MATER, 13(1), 2001, pp. 129-135
Authors:
Arstila, K
Sajavaara, T
Keinonen, J
Citation: K. Arstila et al., Monte Carlo simulation of multiple and plural scattering in elastic recoildetection, NUCL INST B, 174(1-2), 2001, pp. 163-172
Authors:
Vainonen-Ahlgren, E
Ahlgren, T
Likonen, J
Lehto, S
Sajavaara, T
Rydman, W
Keinonen, J
Wu, CH
Citation: E. Vainonen-ahlgren et al., Deuterium diffusion in silicon-doped diamondlike carbon films - art. no. 045406, PHYS REV B, 6304(4), 2001, pp. 5406
Authors:
Guina, M
Xiang, N
Vainionpaa, A
Okhotnikov, OG
Sajavaara, T
Keinonen, J
Citation: M. Guina et al., Self-starting stretched-pulse fiber laser mode locked and stabilized with slow and fast semiconductor saturable absorbers, OPTICS LETT, 26(22), 2001, pp. 1809-1811
Authors:
Alen, P
Juppo, M
Ritala, M
Sajavaara, T
Keinonen, J
Leskela, M
Citation: P. Alen et al., Atomic layer deposition of Ta(Al)N(C) thin films using trimethylaluminum as a reducing agent, J ELCHEM SO, 148(10), 2001, pp. G566-G571
Authors:
Putkonen, M
Sajavaara, T
Niinisto, L
Citation: M. Putkonen et al., Enhanced growth rate in atomic layer epitaxy deposition of magnesium oxidethin films, J MAT CHEM, 10(8), 2000, pp. 1857-1861
Authors:
Kukli, K
Ritala, M
Schuisky, M
Leskela, M
Sajavaara, T
Keinonen, J
Uustare, T
Harsta, A
Citation: K. Kukli et al., Atomic layer deposition of titanium oxide from TiI4 and H2O2, CHEM VAPOR, 6(6), 2000, pp. 303-310
Authors:
Sajavaara, T
Arstila, K
Laakso, A
Keinonen, J
Citation: T. Sajavaara et al., Effects of surface roughness on results in elastic recoil detection measurements, NUCL INST B, 161, 2000, pp. 235-239
Authors:
Matero, R
Rahtu, A
Ritala, M
Leskela, M
Sajavaara, T
Citation: R. Matero et al., Effect of water dose on the atomic layer deposition rate of oxide thin films, THIN SOL FI, 368(1), 2000, pp. 1-7
Authors:
Ritala, M
Kukli, K
Rahtu, A
Raisanen, PI
Leskela, M
Sajavaara, T
Keinonen, J
Citation: M. Ritala et al., Atomic layer deposition of oxide thin films with metal alkoxides as oxygensources, SCIENCE, 288(5464), 2000, pp. 319-321
Authors:
Khriachtchev, L
Vainonen-Ahlgren, E
Sajavaara, T
Ahlgren, T
Keinonen, J
Citation: L. Khriachtchev et al., Stability of Si-C films prepared by a pulsed arc discharge method: Thermaltreatment and heavy-ion irradiation, J APPL PHYS, 88(4), 2000, pp. 2118-2124
Authors:
Kemell, M
Ritala, M
Saloniemi, H
Leskela, M
Sajavaara, T
Rauhala, E
Citation: M. Kemell et al., One-step electrodeposition of Cu2-xSe and CuInSe2 thin films by the induced co-deposition mechanism, J ELCHEM SO, 147(3), 2000, pp. 1080-1087
Authors:
Rissanen, L
Schaaf, P
Neubauer, M
Lieb, KP
Keinonen, J
Sajavaara, T
Citation: L. Rissanen et al., The production of the new cubic FeN phase by reactive magnetron sputtering, APPL SURF S, 139, 1999, pp. 261-265
Authors:
Zhang, YW
Whitlow, HJ
Winzell, T
Bubb, IF
Sajavaara, T
Arstila, K
Keinonen, J
Citation: Yw. Zhang et al., Detection efficiency of time-of-flight energy elastic recoil detection analysis systems, NUCL INST B, 149(4), 1999, pp. 477-489
Authors:
Sajavaara, T
Lappalainen, R
Arstila, K
Li, WM
Ritala, M
Leskela, M
Soininen, E
Citation: T. Sajavaara et al., Modification of ALE-grown SrS thin films by ion implantation of Cu and codopants, NUCL INST B, 148(1-4), 1999, pp. 715-719
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