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Citation: P. Furcas et al., Damp Heat test on LiNbO optical modulators, MICROEL REL, 41(9-10), 2001, pp. 1603-1607

Authors: Vanzi, M Bonfiglio, A Magistrali, F Salmini, G

Citation: M. Vanzi et al., Electron microscopy of life-tested semiconductor laser diodes, MICRON, 31(3), 2000, pp. 259-267

Authors: Vanzi, M Salmini, G De Palo, R

Citation: M. Vanzi et al., New FIB/TEM evidence for a REDR mechanism in sudden failures of 980 nm SL SQW InGaAs/AlGaAs pump laser diodes, MICROEL REL, 40(8-10), 2000, pp. 1753-1757

Authors: Vanzi, M Bonfiglio, A Salaris, P Deplano, P Trogu, EF Serpe, A Salmini, G De Palo, R

Citation: M. Vanzi et al., Gold removal in failure analysis of GaAs-based laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1043-1047

Authors: Vanzi, M Martines, G Bonfiglio, A Licheri, M D'Arco, R Salmini, G De Palo, R

Citation: M. Vanzi et al., A simpler method for life-testing laser diodes, MICROEL REL, 39(6-7), 1999, pp. 1067-1071