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Results: 1-9 |
Results: 9
Optical spectroscopy during growth of PTCDA-C-60 complex thin films
Authors: Park, S Tenne, DA Salvan, G Kampen, TU Zahn, DRT
Citation: S. Park et al., Optical spectroscopy during growth of PTCDA-C-60 complex thin films, J PHYS CH B, 105(48), 2001, pp. 12076-12081
Optical anisotropy of organic layers on GaAs(001)
Authors: Paraian, AM Rossow, U Park, S Salvan, G Friedrich, M Kampen, TU Zahn, DRT
Citation: Am. Paraian et al., Optical anisotropy of organic layers on GaAs(001), J VAC SCI B, 19(4), 2001, pp. 1658-1661
Raman spectroscopy: a powerful tool for characterisation of Ag/3,4,9,10-perylene-tetracarboxylic-dianhydride/GaAs heterostructures
Authors: Salvan, G Tenne, DA Kampen, TU Scholz, R Jungnickel, G Frauenheim, T Zahn, DRT
Citation: G. Salvan et al., Raman spectroscopy: a powerful tool for characterisation of Ag/3,4,9,10-perylene-tetracarboxylic-dianhydride/GaAs heterostructures, APPL SURF S, 179(1-4), 2001, pp. 113-117
Time-resolved photoluminescence characterisation of thin PTCDA films on Si(100)
Authors: Kobitski, AY Salvan, G Wagner, HP Zahn, DRT
Citation: Ay. Kobitski et al., Time-resolved photoluminescence characterisation of thin PTCDA films on Si(100), APPL SURF S, 179(1-4), 2001, pp. 209-212
Growth of organic films on passivated semiconductor surfaces: gallium arsenide versus silicon
Authors: Kampen, TU Salvan, G Tenne, D Scholz, R Zahn, DRT
Citation: Tu. Kampen et al., Growth of organic films on passivated semiconductor surfaces: gallium arsenide versus silicon, APPL SURF S, 175, 2001, pp. 326-331
Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements
Authors: Salvan, G Himcinschi, C Kobitski, AY Friedrich, M Wagner, HP Kampen, TU Zahn, DRT
Citation: G. Salvan et al., Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements, APPL SURF S, 175, 2001, pp. 363-368
Optical characterisation of PTCDA films grown on passivated semiconductor substrates
Authors: Kampen, TU Salvan, G Friedrich, M Tenne, DA Park, S Zahn, DRT
Citation: Tu. Kampen et al., Optical characterisation of PTCDA films grown on passivated semiconductor substrates, APPL SURF S, 166(1-4), 2000, pp. 387-391
Raman monitoring of organic semiconductor heterostructure formation
Authors: Kampen, TU Tenne, DA Park, S Salvan, G Scholz, R Zahn, DRT
Citation: Tu. Kampen et al., Raman monitoring of organic semiconductor heterostructure formation, PHYS ST S-B, 215(1), 1999, pp. 431-434
EPR and magnetic susceptibility studies of B2O3-SrO-Fe2O3 glasses
Authors: Ardelean, I Salvan, G Peteanu, M Simon, V Himcinschi, C Ciorcas, F
Citation: I. Ardelean et al., EPR and magnetic susceptibility studies of B2O3-SrO-Fe2O3 glasses, MOD PHY L B, 13(22-23), 1999, pp. 801-808
Risultati: 1-9 |