Authors:
Elsass, CR
Poblenz, C
Heying, B
Fini, P
Petroff, PM
DenBaars, SP
Mishra, UK
Speck, JS
Saxler, A
Elhamrib, S
Mitchel, WC
Citation: Cr. Elsass et al., Influence of growth temperature and thickness of AlGaN caps on electron transport in AlGaN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy, JPN J A P 1, 40(11), 2001, pp. 6235-6238
Authors:
Elsass, CR
Smorchkova, IP
Ben, HY
Haus, E
Poblenz, C
Fini, P
Maranowski, K
Petroff, PM
DenBaars, SP
Mishra, UK
Speck, JS
Saxler, A
Elhamri, S
Mitchel, WC
Citation: Cr. Elsass et al., Electron transport in AlGaN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy, JPN J A P 2, 39(10B), 2000, pp. L1023-L1025
Authors:
Saxler, A
Debray, P
Perrin, R
Elhamri, S
Mitchel, WC
Elsass, CR
Smorchkova, LP
Heying, B
Haus, E
Fini, P
Ibbetson, JP
Keller, S
Petroff, PM
DenBaars, SP
Mishra, UK
Speck, JS
Citation: A. Saxler et al., Electrical transport of an AlGaN/GaN two-dimensional electron gas, MRS I J N S, 5, 2000, pp. NIL_532-NIL_537
Authors:
Elhamri, S
Saxler, A
Mitchel, WC
Elsass, CR
Smorchkova, IP
Heying, B
Haus, E
Fini, P
Ibbetson, JP
Keller, S
Petroff, PM
DenBaars, SP
Mishra, UK
Speck, JS
Citation: S. Elhamri et al., Persistent photoconductivity study in a high mobility AlGaN/GaN heterostructure, J APPL PHYS, 88(11), 2000, pp. 6583-6588
Authors:
Van Nostrand, JE
Solomon, J
Saxler, A
Xie, QH
Reynolds, DC
Look, DC
Citation: Je. Van Nostrand et al., Dissociation of Al2O3(0001) substrates and the roles of silicon and oxygenin n-type GaN thin solid films grown by gas-source molecular beam epitaxy, J APPL PHYS, 87(12), 2000, pp. 8766-8772
Authors:
Capano, MA
Cooper, JA
Melloch, MR
Saxler, A
Mitchel, WC
Citation: Ma. Capano et al., Ionization energies and electron mobilities in phosphorus- and nitrogen-implanted 4H-silicon carbide, J APPL PHYS, 87(12), 2000, pp. 8773-8777
Authors:
Saxler, A
Debray, P
Perrin, R
Elhamri, S
Mitchel, WC
Elsass, CR
Smorchkova, IP
Heying, B
Haus, E
Fini, P
Ibbetson, JP
Keller, S
Petroff, PM
DenBaars, SP
Mishra, UK
Speck, JS
Citation: A. Saxler et al., Characterization of an AlGaN/GaN two-dimensional electron gas structure, J APPL PHYS, 87(1), 2000, pp. 369-374