Authors:
Schell, N
Matz, W
Eichhorn, F
Prokert, F
Berberich, F
Citation: N. Schell et al., Synchrotron radiation studies of thin films and implanted layers with the materials research endstation of ROBL, J ALLOY COM, 328(1-2), 2001, pp. 105-111
Authors:
Berberich, F
Matz, W
Kreissig, U
Richter, E
Schell, N
Moller, W
Citation: F. Berberich et al., Structural characterisation of hardening of Ti-Al-V alloys after nitridation by plasma immersion ion implantation, APPL SURF S, 179(1-4), 2001, pp. 13-19
Authors:
Bauer, A
Reischauer, P
Krausslich, J
Schell, N
Matz, W
Goetz, K
Citation: A. Bauer et al., Structure refinement of the silicon carbide polytypes 4H and 6H: unambiguous determination of the refinement parameters, ACT CRYST A, 57, 2001, pp. 60-67
Authors:
Matz, W
Schell, N
Neumann, W
Bottiger, J
Chevallier, J
Citation: W. Matz et al., A two magnetron sputter deposition chamber for in situ observation of thinfilm growth by synchrotron radiation scattering, REV SCI INS, 72(8), 2001, pp. 3344-3348
Authors:
Berberich, F
Matz, W
Richter, E
Schell, N
Kreissig, U
Moller, W
Citation: F. Berberich et al., Structural mechanisms of the mechanical degradation of Ti-Al-V alloys: in situ study during annealing, SURF COAT, 128, 2000, pp. 450-454
Authors:
Reich, T
Bernhard, G
Geipel, G
Funke, H
Hennig, C
Rossberg, A
Matz, W
Schell, N
Nitsche, H
Citation: T. Reich et al., The Rossendorf Beam Line ROBL - a dedicated experimental station for XAFS measurements of actinides and other radionuclides, RADIOCH ACT, 88(9-11), 2000, pp. 633-637
Authors:
Matz, W
Schell, N
Bernhard, G
Prokert, F
Reich, T
Claussner, J
Oehme, W
Schlenk, R
Dienel, S
Funke, H
Eichhorn, F
Betzl, M
Prohl, D
Strauch, U
Huttig, G
Krug, H
Neumann, W
Brendler, V
Reichel, P
Denecke, MA
Nitsche, H
Citation: W. Matz et al., ROBL - a CRG beamline for radiochemistry and materials research at the ESRF, J SYNCHROTR, 6, 1999, pp. 1076-1085
Citation: F. Eichhorn et al., Strain and SiC particle formation in silicon implanted with carbon ions ofmedium fluence studied by synchrotron x-ray diffraction, J APPL PHYS, 86(8), 1999, pp. 4184-4187