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Results:
1-13
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Results: 13
Authors:
Schweitz, KO
Chevallier, J
Bottiger, J
Matz, W
Schell, N
Citation: Ko. Schweitz et al., Hardness in Ag/Ni, Au/Ni and Cu/Ni multilayers, PHIL MAG A, 81(8), 2001, pp. 2021-2032
Authors:
Schell, N
Matz, W
Eichhorn, F
Prokert, F
Berberich, F
Citation: N. Schell et al., Synchrotron radiation studies of thin films and implanted layers with the materials research endstation of ROBL, J ALLOY COM, 328(1-2), 2001, pp. 105-111
Authors:
Berberich, F
Matz, W
Kreissig, U
Richter, E
Schell, N
Moller, W
Citation: F. Berberich et al., Structural characterisation of hardening of Ti-Al-V alloys after nitridation by plasma immersion ion implantation, APPL SURF S, 179(1-4), 2001, pp. 13-19
Authors:
Bauer, A
Reischauer, P
Krausslich, J
Schell, N
Matz, W
Goetz, K
Citation: A. Bauer et al., Structure refinement of the silicon carbide polytypes 4H and 6H: unambiguous determination of the refinement parameters, ACT CRYST A, 57, 2001, pp. 60-67
Authors:
Matz, W
Schell, N
Neumann, W
Bottiger, J
Chevallier, J
Citation: W. Matz et al., A two magnetron sputter deposition chamber for in situ observation of thinfilm growth by synchrotron radiation scattering, REV SCI INS, 72(8), 2001, pp. 3344-3348
Authors:
Berberich, F
Matz, W
Richter, E
Schell, N
Kreissig, U
Moller, W
Citation: F. Berberich et al., Structural mechanisms of the mechanical degradation of Ti-Al-V alloys: in situ study during annealing, SURF COAT, 128, 2000, pp. 450-454
Authors:
Pfeiffer, F
Salditt, T
Hoghoj, P
Anderson, I
Schell, N
Citation: F. Pfeiffer et al., X-ray waveguides with multiple guiding layers, PHYS REV B, 62(24), 2000, pp. 16939-16943
Authors:
Hess, G
Bauer, A
Krausslich, J
Fissel, A
Schroter, B
Richter, W
Schell, N
Matz, W
Goetz, K
Citation: G. Hess et al., Si/Ge-nanocrystals on SiC(0001), THIN SOL FI, 380(1-2), 2000, pp. 86-88
Authors:
Reich, T
Bernhard, G
Geipel, G
Funke, H
Hennig, C
Rossberg, A
Matz, W
Schell, N
Nitsche, H
Citation: T. Reich et al., The Rossendorf Beam Line ROBL - a dedicated experimental station for XAFS measurements of actinides and other radionuclides, RADIOCH ACT, 88(9-11), 2000, pp. 633-637
Authors:
Hecker, M
Tietjen, D
Prokert, F
Schell, N
Schneider, CM
Citation: M. Hecker et al., Investigation of Co/Cu/NiFe-multilayers by X-ray reflectometry and diffraction, MIKROCH ACT, 133(1-4), 2000, pp. 239-241
Authors:
Mattern, N
Hecker, M
Fischer, D
Wenzel, C
Schell, N
Matz, W
Engelmann, H
Zschech, E
Citation: N. Mattern et al., X-ray structure characterization of barriers for Cu metallization, MICROEL REL, 40(8-10), 2000, pp. 1765-1770
Authors:
Matz, W
Schell, N
Bernhard, G
Prokert, F
Reich, T
Claussner, J
Oehme, W
Schlenk, R
Dienel, S
Funke, H
Eichhorn, F
Betzl, M
Prohl, D
Strauch, U
Huttig, G
Krug, H
Neumann, W
Brendler, V
Reichel, P
Denecke, MA
Nitsche, H
Citation: W. Matz et al., ROBL - a CRG beamline for radiochemistry and materials research at the ESRF, J SYNCHROTR, 6, 1999, pp. 1076-1085
Authors:
Eichhorn, F
Schell, N
Matz, W
Kogler, R
Citation: F. Eichhorn et al., Strain and SiC particle formation in silicon implanted with carbon ions ofmedium fluence studied by synchrotron x-ray diffraction, J APPL PHYS, 86(8), 1999, pp. 4184-4187
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