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Results:
1-14
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Results: 14
Authors:
Holscher, H
Gotsmann, B
Allers, W
Schwarz, UD
Fuchs, H
Wiesendanger, R
Citation: H. Holscher et al., Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique - art. no. 075402, PHYS REV B, 6407(7), 2001, pp. 5402
Authors:
Holscher, H
Schwarz, UD
Citation: H. Holscher et Ud. Schwarz, Friction studied with the scanning force microscope, Z METALLKUN, 92(9), 2001, pp. 1040-1045
Authors:
Allers, W
Schwarz, A
Holscher, H
Schwarz, UD
Wiesendanger, R
Citation: W. Allers et al., Dynamic scanning force microscopy at low temperatures, JPN J A P 1, 39(6B), 2000, pp. 3701-3706
Authors:
Schwarz, A
Allers, W
Schwarz, UD
Wiesendanger, R
Citation: A. Schwarz et al., Dynamic-mode scanning force microscopy study of n-InAs(110)-(1 x 1) at lowtemperatures, PHYS REV B, 61(4), 2000, pp. 2837-2845
Authors:
Schwarz, A
Allers, W
Schwarz, UD
Wiesendanger, R
Citation: A. Schwarz et al., Detection of doping atom distributions and individual dopants in InAs(110)by dynamic-mode scanning force microscopy in ultrahigh vacuum, PHYS REV B, 62(20), 2000, pp. 13617-13622
Authors:
Schwarz, UD
Holscher, H
Wiesendanger, R
Citation: Ud. Schwarz et al., Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanisms, and image interpretation, PHYS REV B, 62(19), 2000, pp. 13089-13097
Authors:
Holscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
Citation: H. Holscher et al., Interpretation of "true atomic resolution" images of graphite (0001) in noncontact atomic force microscopy, PHYS REV B, 62(11), 2000, pp. 6967-6970
Authors:
Holscher, H
Schwarz, A
Allers, W
Schwarz, UD
Wiesendanger, R
Citation: H. Holscher et al., Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001)in the contact and noncontact regimes, PHYS REV B, 61(19), 2000, pp. 12678-12681
Authors:
Allers, W
Schwarz, A
Schwarz, UD
Wiesendanger, R
Citation: W. Allers et al., Dynamic scanning force microscopy at low temperatures on a noble-gas crystal: Atomic resolution on the xenon(111) surface, EUROPH LETT, 48(3), 1999, pp. 276-279
Authors:
Allers, W
Schwarz, A
Schwarz, UD
Wiesendanger, R
Citation: W. Allers et al., Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite (0001), APPL SURF S, 140(3-4), 1999, pp. 247-252
Authors:
Schwarz, A
Allers, W
Schwarz, UD
Wiesendanger, R
Citation: A. Schwarz et al., Simultaneous imaging of the In and As sublattice on InAs(110)-(1 X 1) withdynamic scanning force microscopy, APPL SURF S, 140(3-4), 1999, pp. 293-297
Authors:
Holscher, H
Schwarz, UD
Wiesendanger, R
Citation: H. Holscher et al., Calculation of the frequency shift in dynamic force microscopy, APPL SURF S, 140(3-4), 1999, pp. 344-351
Authors:
Holscher, H
Raberg, W
Schwarz, UD
Hasbach, A
Wandelt, K
Wiesendanger, R
Citation: H. Holscher et al., Imaging of sub-unit-cell structures in the contact mode of the scanning force microscope, PHYS REV B, 59(3), 1999, pp. 1661-1664
Authors:
Holscher, H
Allers, W
Schwarz, UD
Schwarz, A
Wiesendanger, R
Citation: H. Holscher et al., Determination of tip-sample interaction potentials by dynamic force spectroscopy, PHYS REV L, 83(23), 1999, pp. 4780-4783
Risultati:
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