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Results: 1-25 | 26-36
Results: 1-25/36

Authors: Naftel, SJ Sham, TK Yiu, YM Yates, BW
Citation: Sj. Naftel et al., Calcium L-edge XANES study of some calcium compounds, J SYNCHROTR, 8, 2001, pp. 255-257

Authors: Hu, YF Sham, TK Zou, Z Xu, GQ Chan, L Yates, BW Bancroft, GM
Citation: Yf. Hu et al., A study of titanium nitride diffusion barriers between aluminium and silicon by X-ray absorption spectroscopy: the Si, Ti and N results, J SYNCHROTR, 8, 2001, pp. 860-862

Authors: Naftel, SJ Yiu, YM Sham, TK Yates, BW
Citation: Sj. Naftel et al., X-ray excited optical luminescence (XEOL) studies of CaF2 at the Ca L-3,L-2-edge, J ELEC SPEC, 119(2-3), 2001, pp. 215-220

Authors: Zhang, P Kim, PS Sham, TK
Citation: P. Zhang et al., XANES studies of CdS nano-structures on porous silicon, J ELEC SPEC, 119(2-3), 2001, pp. 229-233

Authors: Naftel, SJ Martin, RR Sham, TK Macfie, SM Jones, KW
Citation: Sj. Naftel et al., Micro-synchrotron X-ray fluorescence of cadmium-challenged corn roots, J ELEC SPEC, 119(2-3), 2001, pp. 235-239

Authors: Coulthard, I Sham, TK Hu, YF Naftel, SJ Kim, PS Freeland, JW
Citation: I. Coulthard et al., Threshold behavior of the Cu L3M4,5M4,5 Auger effect of Cu metal at the L-3 edge - art. no. 115101, PHYS REV B, 6411(11), 2001, pp. 5101

Authors: Martin, RR Sham, TK Won, GW Jones, KW Feng, H
Citation: Rr. Martin et al., Synchrotron x-ray fluorescence and secondary ion mass spectrometry in treering microanalysis: applications to dendroanalysis, X-RAY SPECT, 30(5), 2001, pp. 338-341

Authors: Zhang, P Naftel, SJ Sham, TK
Citation: P. Zhang et al., Multichannel detection x-ray absorption near edge structures study on the structural characteristics of dendrimer-stabilized CdS quantum dots, J APPL PHYS, 90(6), 2001, pp. 2755-2759

Authors: Sun, XH Tang, YH Zhang, P Naftel, SJ Sammynaiken, R Sham, TK Peng, HY Zhang, YF Wong, NB Lee, ST
Citation: Xh. Sun et al., X-ray absorption fine structure and electron energy loss spectroscopy study of silicon nanowires at the Si L-3,L-2 edge, J APPL PHYS, 90(12), 2001, pp. 6379-6383

Authors: Sun, XH Peng, HY Tang, YH Shi, WS Wong, NB Lee, CS Lee, ST Sham, TK
Citation: Xh. Sun et al., Surface reactivity of Si nanowires, J APPL PHYS, 89(11), 2001, pp. 6396-6399

Authors: Tang, YH Zheng, YF Lee, CS Wang, N Lee, ST Sham, TK
Citation: Yh. Tang et al., Carbon monoxide-assisted growth of carbon nanotubes, CHEM P LETT, 342(3-4), 2001, pp. 259-264

Authors: Tang, YH Zhang, P Kim, PS Sham, TK Hu, YF Sun, XH Wong, NB Fung, MK Zheng, YF Lee, CS Lee, ST
Citation: Yh. Tang et al., Amorphous carbon nanowires investigated by near-edge-x-ray-absorption-fine-structures, APPL PHYS L, 79(23), 2001, pp. 3773-3775

Authors: Tang, YH Sun, XH Au, FCK Liao, LS Peng, HY Lee, CS Lee, ST Sham, TK
Citation: Yh. Tang et al., Microstructure and field-emission characteristics of boron-doped Si nanoparticle chains, APPL PHYS L, 79(11), 2001, pp. 1673-1675

Authors: Naftel, SJ Zhang, P Kim, PS Sham, TK Coulthard, I Antel, WJ Freeland, JW Frigo, SP Fung, MK Lee, ST Hu, YF Yates, BW
Citation: Sj. Naftel et al., Soft x-ray-excited luminescence and optical x-ray absorption fine structures of tris (8-hydroxyquinoline) aluminum, APPL PHYS L, 78(13), 2001, pp. 1847-1849

Authors: Kim, PS Sham, TK Zhang, P Fung, MK Lee, ST Hu, YF Yates, BW
Citation: Ps. Kim et al., X-ray excited optical luminescence studies of tris-(2,2 '-bipyridine)ruthenium(II) at the C,N K-edge and Ru L-3,(2)-edge, J AM CHEM S, 123(36), 2001, pp. 8870-8871

Authors: Coulthard, I Jiang, DT Zhu, YJ Sham, TK
Citation: I. Coulthard et al., A systematic study of synchrotron light induced luminescence from porous silicon: Implications to morphology and chemical effect dependent electronicbehaviour, J POROUS MA, 7(1-3), 2000, pp. 165-168

Authors: Zhang, YF Liao, LS Chan, WH Lee, ST Sammynaiken, R Sham, TK
Citation: Yf. Zhang et al., Electronic structure of silicon nanowires: A photoemission and x-ray absorption study, PHYS REV B, 61(12), 2000, pp. 8298-8305

Authors: Holroyd, RA Preses, JM Sham, TK
Citation: Ra. Holroyd et al., Ion yields for tetramethylgermane exposed to X-rays near the GeK-edge, J PHYS CH A, 104(12), 2000, pp. 2859-2864

Authors: Yates, BW Hu, YF Tan, KH Retzlaff, G Cavell, RG Sham, TK Bancroft, GM
Citation: Bw. Yates et al., First results from the Canadian SGM beamline at SRC, J SYNCHROTR, 7, 2000, pp. 296-300

Authors: Coulthard, I Antel, WJ Frigo, SP Freeland, JW Moore, J Calaway, WS Pellin, MJ Mendelsohn, M Sham, TK Naftel, SJ Stampfl, APJ
Citation: I. Coulthard et al., Resonant Auger studies of metallic systems, J VAC SCI A, 18(4), 2000, pp. 1955-1958

Authors: Sham, TK Sammynaiken, R Zhu, YJ Zhang, P Coulthard, I Naftel, SJ
Citation: Tk. Sham et al., X-ray excited optical luminescence (XEOL): a potential tool for OELD studies, THIN SOL FI, 363(1-2), 2000, pp. 318-321

Authors: Coulthard, I Sammynaiken, R Naftel, SJ Zhang, P Sham, TK
Citation: I. Coulthard et al., Porous silicon: A template for the preparation of nanophase metals and bimetallic aggregates, PHYS ST S-A, 182(1), 2000, pp. 157-162

Authors: Naftel, SJ Coulthard, I Jiang, DT Sham, TK Yates, BW Tan, KH
Citation: Sj. Naftel et al., The role of oxygen in the photoluminescence of porous silicon: Some recentobservations, PHYS ST S-A, 182(1), 2000, pp. 373-378

Authors: Coulthard, I Antel, WJ Freeland, JW Sham, TK Naftel, SJ Zhang, P
Citation: I. Coulthard et al., Influence of sample oxidation on the nature of optical luminescence from porous silicon, APPL PHYS L, 77(4), 2000, pp. 498-500

Authors: Sankar, J Sham, TK Puddephatt, RJ
Citation: J. Sankar et al., Low temperature chemical vapour deposition of ruthenium and ruthenium dioxide on polymer surfaces, J MAT CHEM, 9(10), 1999, pp. 2439-2444
Risultati: 1-25 | 26-36