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Results: 1-6 |
Results: 6

Authors: Shikler, R Fried, N Meoded, T Rosenwaks, Y
Citation: R. Shikler et al., Measuring minority-carrier diffusion length using a Kelvin probe force microscope, PHYS REV B, 61(16), 2000, pp. 11041-11046

Authors: Shikler, R Rosenwaks, Y
Citation: R. Shikler et Y. Rosenwaks, Kelvin probe force microscopy using near-field optical tips, APPL SURF S, 157(4), 2000, pp. 256-262

Authors: Shikler, R Rosenwaks, Y
Citation: R. Shikler et Y. Rosenwaks, Near-field surface photovoltage, APPL PHYS L, 77(6), 2000, pp. 836-838

Authors: Shikler, R Meoded, T Fried, N Mishori, B Rosenwaks, Y
Citation: R. Shikler et al., Two-dimensional surface band structure of operating light emitting devices, J APPL PHYS, 86(1), 1999, pp. 107-113

Authors: Meoded, T Shikler, R Fried, N Rosenwaks, Y
Citation: T. Meoded et al., Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy, APPL PHYS L, 75(16), 1999, pp. 2435-2437

Authors: Shikler, R Meoded, T Fried, N Rosenwaks, Y
Citation: R. Shikler et al., Potential imaging of operating light-emitting devices using Kelvin force microscopy, APPL PHYS L, 74(20), 1999, pp. 2972-2974
Risultati: 1-6 |