Authors:
Simin, G
Hu, X
Ilinskaya, N
Zhang, J
Tarakji, A
Kumar, A
Yang, J
Khan, MA
Gaska, R
Shur, MS
Citation: G. Simin et al., Large periphery high-power AlGaN/GaN metal-oxide-semiconductor heterostructure field effect transistors on SiC with oxide-bridging, IEEE ELEC D, 22(2), 2001, pp. 53-55
Authors:
Rumyantsev, SL
Pala, N
Shur, MS
Gaska, R
Levinshtein, ME
Khan, MA
Simin, G
Hu, X
Yang, J
Citation: Sl. Rumyantsev et al., Low frequency noise in GaN metal semiconductor and metal oxide semiconductor field effect transistors, J APPL PHYS, 90(1), 2001, pp. 310-314
Citation: Ap. Dmitriev et al., High-field transport in a dense two-dimensional electron gas in elementarysemiconductors, J APPL PHYS, 89(7), 2001, pp. 3793-3797
Authors:
Rumyantsev, SL
Pala, N
Shur, MS
Borovitskaya, E
Dmitriev, AP
Levinshtein, ME
Gaska, R
Khan, MA
Yang, JW
Hu, XH
Simin, G
Citation: Sl. Rumyantsev et al., Generation-recombination noise in GaN/A1GaN heterostructure field effect transistors, IEEE DEVICE, 48(3), 2001, pp. 530-534
Authors:
Hu, X
Koudymov, A
Simin, G
Yang, J
Khan, MA
Tarakji, A
Shur, MS
Gaska, R
Citation: X. Hu et al., Si3N4/AlGaN/GaN-metal-insulator-semiconductor heterostructure field-effecttransistors, APPL PHYS L, 79(17), 2001, pp. 2832-2834
Authors:
Simin, G
Koudymov, A
Tarakji, A
Hu, X
Yang, J
Khan, MA
Shur, MS
Gaska, R
Citation: G. Simin et al., Induced strain mechanism of current collapse in AlGaN/GaN heterostructure field-effect transistors, APPL PHYS L, 79(16), 2001, pp. 2651-2653
Authors:
Adivarahan, V
Simin, G
Tamulaitis, G
Srinivasan, R
Yang, J
Khan, MA
Shur, MS
Gaska, R
Citation: V. Adivarahan et al., Indium-silicon co-doping of high-aluminum-content AlGaN for solar blind photodetectors, APPL PHYS L, 79(12), 2001, pp. 1903-1905
Authors:
Adivarahan, V
Lunev, A
Khan, MA
Yang, J
Simin, G
Shur, MS
Gaska, R
Citation: V. Adivarahan et al., Very-low-specific-resistance Pd/Ag/Au/Ti/Au alloyed ohmic contact to p GaNfor high-current devices, APPL PHYS L, 78(18), 2001, pp. 2781-2783
Citation: Jq. Lu et Ms. Shur, Terahertz detection by high-electron-mobility transistor: Enhancement by drain bias, APPL PHYS L, 78(17), 2001, pp. 2587-2588
Authors:
Tarakji, A
Simin, G
Ilinskaya, N
Hu, X
Kumar, A
Koudymov, A
Yang, J
Khan, MA
Shur, MS
Gaska, R
Citation: A. Tarakji et al., Mechanism of radio-frequency current collapse in GaN-AlGaN field-effect transistors, APPL PHYS L, 78(15), 2001, pp. 2169-2171