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Results:
1-7
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Results: 7
Authors:
Rodrigues, AM
Gomes, HL
Stallinga, P
Pereira, L
Pereira, E
Citation: Am. Rodrigues et al., Electrical characterization of CVD diamond-n(+) silicon junctions, DIAM RELAT, 10(3-7), 2001, pp. 858-862
Authors:
Stallinga, P
Gomes, HL
Charas, A
Morgado, J
Alcacer, L
Citation: P. Stallinga et al., Electrical characterization of pn-junctions of PPV and silicon, SYNTH METAL, 121(1-3), 2001, pp. 1535-1536
Authors:
Stallinga, P
Gomes, HL
Rost, H
Holmes, AB
Harrison, MG
Friend, RH
Citation: P. Stallinga et al., Minority-carrier effects in poly-phenylenevinylene as studied by electrical characterization, J APPL PHYS, 89(3), 2001, pp. 1713-1724
Authors:
Stallinga, P
Gomes, HL
Rost, H
Holmes, AB
Harrison, MG
Friend, RH
Citation: P. Stallinga et al., Electronic levels in MEH-PPV, SYNTH METAL, 111, 2000, pp. 535-537
Authors:
Stallinga, P
Gomes, HL
Rost, H
Holmes, AB
Harrison, MG
Friend, RH
Biscarini, F
Taliani, C
Jones, GW
Taylor, DM
Citation: P. Stallinga et al., Determination of deep and shallow levels in conjugated polymers by electrical methods, PHYSICA B, 274, 1999, pp. 923-926
Authors:
Stallinga, P
Gomes, HL
Jones, GW
Taylor, DM
Citation: P. Stallinga et al., Electrical study of impurity states in conjugated polymers, SYNTH METAL, 101(1-3), 1999, pp. 496-497
Authors:
Gomes, HL
Stallinga, P
Rost, H
Holmes, AB
Harrison, MG
Friend, RH
Citation: Hl. Gomes et al., Analysis of deep levels in a phenylenevinylene polymer by transient capacitance methods, APPL PHYS L, 74(8), 1999, pp. 1144-1146
Risultati:
1-7
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