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Results: 1-9 |
Results: 9

Authors: Bihannic, I Michot, LJ Lartiges, BS Vantelon, D Labille, J Thomas, F Susini, J Salome, M Fayard, B
Citation: I. Bihannic et al., First direct visualization of oriented mesostructures in clay gels by synchrotron-based X-ray fluorescence microscopy, LANGMUIR, 17(14), 2001, pp. 4144-4147

Authors: Ortega, R Deves, G Bonnin-Mosbah, M Salome, M Susini, J Anderson, LM Kasprzak, KS
Citation: R. Ortega et al., Chromium mapping in male mice reproductive glands exposed to CrCl3 using proton and X-ray synchrotron radiation microbeams, NUCL INST B, 181, 2001, pp. 485-488

Authors: Wilhein, T Kaulich, B Susini, J
Citation: T. Wilhein et al., Two zone plate interference contrast microscopy at 4 keV photon energy, OPT COMMUN, 193(1-6), 2001, pp. 19-26

Authors: Wilhein, T Kaulich, B Di Fabrizio, E Romanato, F Cabrini, S Susini, J
Citation: T. Wilhein et al., Differential interference contrast x-ray microscopy with submicron resolution, APPL PHYS L, 78(14), 2001, pp. 2082-2084

Authors: Schneider, G Hambach, D Niemann, B Kaulich, B Susini, J Hoffmann, N Hasse, W
Citation: G. Schneider et al., In situ x-ray microscopic observation of the electromigration in passivated Cu interconnects, APPL PHYS L, 78(13), 2001, pp. 1936-1938

Authors: David, C Kaulich, B Barrett, R Salome, M Susini, J
Citation: C. David et al., High-resolution lenses for sub-100 nm x-ray fluorescence microscopy, APPL PHYS L, 77(23), 2000, pp. 3851-3853

Authors: Oestreich, S Kaulich, B Susini, J
Citation: S. Oestreich et al., Single-movement fixed-exit channelcut x-ray monochromator based on profiled surfaces, REV SCI INS, 70(4), 1999, pp. 1921-1925

Authors: Di Fabrizio, E Romanato, F Gentili, M Cabrini, S Kaulich, B Susini, J Barrett, R
Citation: E. Di Fabrizio et al., High-efficiency multilevel zone plates for keV X-rays, NATURE, 401(6756), 1999, pp. 895-898

Authors: Kaulich, B Oestreich, S Salome, M Barrett, R Susini, J Wilhein, T Di Fabrizio, E Gentili, M Charalambous, P
Citation: B. Kaulich et al., Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm, APPL PHYS L, 75(26), 1999, pp. 4061-4063
Risultati: 1-9 |