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Results: 1-12 |
Results: 12
OPTICAL DETERMINATION OF SHALLOW CARRIER PROFILES USING FOURIER-TRANSFORM INFRARED ELLIPSOMETRY
Authors: TIWALD TE THOMPSON DW WOOLLAM JA
Citation: Te. Tiwald et al., OPTICAL DETERMINATION OF SHALLOW CARRIER PROFILES USING FOURIER-TRANSFORM INFRARED ELLIPSOMETRY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 312-315
THE ORIGIN OF THE BERREMAN EFFECT IN SIC HOMOSTRUCTURES
Authors: ZOLLNER S CARREJO JP TIWALD TE WOOLLAM JA
Citation: S. Zollner et al., THE ORIGIN OF THE BERREMAN EFFECT IN SIC HOMOSTRUCTURES, Physica status solidi. b, Basic research, 208(1), 1998, pp. 3-4
DETERMINATION OF OPTICAL ANISOTROPY IN CALCITE FROM ULTRAVIOLET TO MIDINFRARED BY GENERALIZED ELLIPSOMETRY
Authors: THOMPSON DW DEVRIES MJ TIWALD TE WOOLLAM JA
Citation: Dw. Thompson et al., DETERMINATION OF OPTICAL ANISOTROPY IN CALCITE FROM ULTRAVIOLET TO MIDINFRARED BY GENERALIZED ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 341-346
APPLICATION OF IR VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY TO THE DETERMINATION OF FREE-CARRIER CONCENTRATION DEPTH PROFILES
Authors: TIWALD TE THOMPSON DW WOOLLAM JA PAULSON W HANCE R
Citation: Te. Tiwald et al., APPLICATION OF IR VARIABLE-ANGLE SPECTROSCOPIC ELLIPSOMETRY TO THE DETERMINATION OF FREE-CARRIER CONCENTRATION DEPTH PROFILES, Thin solid films, 313, 1998, pp. 661-666
INFRARED FREE-CARRIER RESPONSE OF IN0.15GA0.85AS0.17SB0.83 EPILAYERS ON GASB
Authors: SNYDER PG TIWALD TE THOMPSON DW IANNO NJ WOOLLAM JA MAUK MG SHELLENBARGER ZA
Citation: Pg. Snyder et al., INFRARED FREE-CARRIER RESPONSE OF IN0.15GA0.85AS0.17SB0.83 EPILAYERS ON GASB, Thin solid films, 313, 1998, pp. 667-670
OPTICAL INVESTIGATIONS OF MIXED-PHASE BORON-NITRIDE THIN-FILMS BY INFRARED SPECTROSCOPIC ELLIPSOMETRY
Authors: SCHUBERT M FRANKE E NEUMANN H TIWALD TE THOMPSON DW WOOLLAM JA HAHN J
Citation: M. Schubert et al., OPTICAL INVESTIGATIONS OF MIXED-PHASE BORON-NITRIDE THIN-FILMS BY INFRARED SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 692-696
IR ELLIPSOMETRY STUDIES OF POLYMERS AND OXYGEN PLASMA-TREATED POLYMERS
Authors: BUNGAY CL TIWALD TE THOMPSON DW DEVRIES MJ WOOLLAM JA ELMAN JF
Citation: Cl. Bungay et al., IR ELLIPSOMETRY STUDIES OF POLYMERS AND OXYGEN PLASMA-TREATED POLYMERS, Thin solid films, 313, 1998, pp. 713-717
DETERMINATION OF THE MID-IR OPTICAL-CONSTANTS OF WATER AND LUBRICANTSUSING IR ELLIPSOMETRY COMBINED WITH AN ATR CELL
Authors: TIWALD TE THOMPSON DW WOOLLAM JA PEPPER SV
Citation: Te. Tiwald et al., DETERMINATION OF THE MID-IR OPTICAL-CONSTANTS OF WATER AND LUBRICANTSUSING IR ELLIPSOMETRY COMBINED WITH AN ATR CELL, Thin solid films, 313, 1998, pp. 718-721
IN-SITU INFRARED AND VISIBLE-LIGHT ELLIPSOMETRIC INVESTIGATIONS OF BORON-NITRIDE THIN-FILMS AT ELEVATED-TEMPERATURES
Authors: FRANKE E SCHUBERT M HECHT JD NEUMANN H TIWALD TE THOMPSON DW YAO H WOOLLAM JA HAHN J
Citation: E. Franke et al., IN-SITU INFRARED AND VISIBLE-LIGHT ELLIPSOMETRIC INVESTIGATIONS OF BORON-NITRIDE THIN-FILMS AT ELEVATED-TEMPERATURES, Journal of applied physics, 84(1), 1998, pp. 526-532
INFRARED OPTICAL-PROPERTIES OF MIXED-PHASE THIN-FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY USING BORON-NITRIDE AS AN EXAMPLE
Authors: SCHUBERT M RHEINLANDER B FRANKE E NEUMANN H TIWALD TE WOOLLAM JA HAHN J RICHTER F
Citation: M. Schubert et al., INFRARED OPTICAL-PROPERTIES OF MIXED-PHASE THIN-FILMS STUDIED BY SPECTROSCOPIC ELLIPSOMETRY USING BORON-NITRIDE AS AN EXAMPLE, Physical review. B, Condensed matter, 56(20), 1997, pp. 13306-13313
PHASE AND MICROSTRUCTURE INVESTIGATIONS OF BORON-NITRIDE THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY IN THE VISIBLE AND INFRARED SPECTRAL RANGE
Authors: FRANKE E SCHUBERT M NEUMANN H TIWALD TE THOMPSON DW WOOLLAM JA HAHN J RICHTER F
Citation: E. Franke et al., PHASE AND MICROSTRUCTURE INVESTIGATIONS OF BORON-NITRIDE THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY IN THE VISIBLE AND INFRARED SPECTRAL RANGE, Journal of applied physics, 82(6), 1997, pp. 2906-2911
INFRARED ELLIPSOMETRY ON HEXAGONAL AND CUBIC BORON-NITRIDE THIN-FILMS
Authors: FRANKE E NEUMANN H SCHUBERT M TIWALD TE WOOLLAM JA HAHN J
Citation: E. Franke et al., INFRARED ELLIPSOMETRY ON HEXAGONAL AND CUBIC BORON-NITRIDE THIN-FILMS, Applied physics letters, 70(13), 1997, pp. 1668-1670
Risultati: 1-12 |