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Results: 1-9 |
Results: 9
ADVANCED MAGNETOTRANSPORT CHARACTERIZATION OF LPE-GROWN HG1-XCDXTE BYQUANTITATIVE MOBILITY SPECTRUM ANALYSIS
Authors: MEYER JR HOFFMAN CA BARTOLI FJ ANTOSZEWSKI J FARAONE L TOBIN SP NORTON PW ARD CK REESE DJ COLOMBO L LIAO PK
Citation: Jr. Meyer et al., ADVANCED MAGNETOTRANSPORT CHARACTERIZATION OF LPE-GROWN HG1-XCDXTE BYQUANTITATIVE MOBILITY SPECTRUM ANALYSIS, Journal of electronic materials, 25(8), 1996, pp. 1157-1164
TRACE COPPER MEASUREMENTS AND ELECTRICAL EFFECTS IN LPE HGCDTE
Authors: TOWER JP TOBIN SP NORTON PW BOLLONG AB SOCHA A TREGILGAS JH ARD CK ARLINGHAUS HF
Citation: Jp. Tower et al., TRACE COPPER MEASUREMENTS AND ELECTRICAL EFFECTS IN LPE HGCDTE, Journal of electronic materials, 25(8), 1996, pp. 1183-1187
IMPURITY STUDY OF CDZNTE SUBSTRATES USED FOR LPE HGCDTE
Authors: BOLLONG AB FELDEWERTH G TOWER JP TOBIN SP KESTIGIAN M NORTON PW SCHAAKE HF ARD CK
Citation: Ab. Bollong et al., IMPURITY STUDY OF CDZNTE SUBSTRATES USED FOR LPE HGCDTE, Advanced materials for optics and electronics, 5(2), 1995, pp. 87-99
THE RELATIONSHIP BETWEEN LATTICE MATCHING AND CROSSHATCH IN LIQUID-PHASE EPITAXY HGCDTE ON CDZNTE SUBSTRATES
Authors: TOBIN SP SMITH FTJ NORTON PW WU J DUDLEY M DIMARZIO D CASAGRANDE LG
Citation: Sp. Tobin et al., THE RELATIONSHIP BETWEEN LATTICE MATCHING AND CROSSHATCH IN LIQUID-PHASE EPITAXY HGCDTE ON CDZNTE SUBSTRATES, Journal of electronic materials, 24(9), 1995, pp. 1189-1199
CDZNTE SUBSTRATE IMPURITIES AND THEIR EFFECTS ON LIQUID-PHASE EPITAXYHGCDTE
Authors: TOWER JP TOBIN SP KESTIGIAN M NORTON PW BOLLONG AB SCHAAKE HF ARD CK
Citation: Jp. Tower et al., CDZNTE SUBSTRATE IMPURITIES AND THEIR EFFECTS ON LIQUID-PHASE EPITAXYHGCDTE, Journal of electronic materials, 24(5), 1995, pp. 497-504
A COMPARISON OF TECHNIQUES FOR NONDESTRUCTIVE COMPOSITION MEASUREMENTS IN CDZNTE SUBSTRATES
Authors: TOBIN SP TOWER JP NORTON PW CHANDLERHOROWITZ D AMIRTHARAJ PM LOPES VC DUNCAN WM SYLLAIOS AJ ARD CK GILES NC LEE J BALASUBRAMANIAN R BOLLONG AB STEINER TW THEWALT MLW BOWEN DK TANNER BK
Citation: Sp. Tobin et al., A COMPARISON OF TECHNIQUES FOR NONDESTRUCTIVE COMPOSITION MEASUREMENTS IN CDZNTE SUBSTRATES, Journal of electronic materials, 24(5), 1995, pp. 697-705
HALL-EFFECT CHARACTERIZATION OF LPE HGCDTE P N HETEROJUNCTIONS/
Authors: TOBIN SP PULTZ GN KRUEGER EE KESTIGIAN M WONG KK NORTON PW
Citation: Sp. Tobin et al., HALL-EFFECT CHARACTERIZATION OF LPE HGCDTE P N HETEROJUNCTIONS/, Journal of electronic materials, 22(8), 1993, pp. 907-914
X-RAY-DIFFRACTION CHARACTERIZATION OF LPE HGCDTE HETEROJUNCTION PHOTODIODE MATERIAL
Authors: TOBIN SP KRUEGER EE PULTZ GN KESTIGIAN M WONG KK NORTON PW
Citation: Sp. Tobin et al., X-RAY-DIFFRACTION CHARACTERIZATION OF LPE HGCDTE HETEROJUNCTION PHOTODIODE MATERIAL, Journal of electronic materials, 22(8), 1993, pp. 959-966
THE IMPACT OF CHARACTERIZATION TECHNIQUES ON HGCDTE INFRARED DETECTORTECHNOLOGY
Authors: REINE MB MASCHHOFF KR TOBIN SP NORTON PW MROCZKOWSKI JA KRUEGER EE
Citation: Mb. Reine et al., THE IMPACT OF CHARACTERIZATION TECHNIQUES ON HGCDTE INFRARED DETECTORTECHNOLOGY, Semiconductor science and technology, 8(6), 1993, pp. 788-804
Risultati: 1-9 |