Authors:
TOMISHIMA S
MORISHITA F
TSUKUDE M
YAMAGATA T
ARIMOTO K
Citation: S. Tomishima et al., A LONG DATA RETENTION SOI DRAM WITH THE BODY REFRESH FUNCTION, IEICE transactions on electronics, E80C(7), 1997, pp. 899-904
Authors:
KUGE S
MORISHITA F
TSURUDA T
TOMISHIMA S
TSUKUDE M
YAMAGATA T
ARIMOTO K
Citation: S. Kuge et al., SOI-DRAM CIRCUIT TECHNOLOGIES FOR LOW-POWER HIGH-SPEED MULTIGIGA SCALE MEMORIES, IEICE transactions on electronics, E79C(7), 1996, pp. 997-1002
Authors:
TOMISHIMA S
KUGE S
TSUKUDE M
YAMAGATA T
ARIMOTO K
Citation: S. Tomishima et al., A BLANKET SOURCE LINE ARCHITECTURE WITH TRIPLE METAL FOR GIGA SCALE MEMORY LSIS, IEICE transactions on electronics, E79C(6), 1996, pp. 808-811
Authors:
KUGE S
MORISHITA F
TSURUDA T
TOMISHIMA S
TSUKUDE M
YAMAGATA T
ARIMOTO K
Citation: S. Kuge et al., SOI-DRAM CIRCUIT TECHNOLOGIES - FOR LOW-POWER HIGH-SPEED MULTIGIGA SCALE MEMORIES, IEEE journal of solid-state circuits, 31(4), 1996, pp. 586-591
Authors:
YAMAGATA T
TOMISHIMA S
TSUKUDE M
TSURUDA T
HASHIZUME Y
ARIMOTO K
Citation: T. Yamagata et al., LOW-VOLTAGE CIRCUIT-DESIGN TECHNIQUES FOR BATTERY-OPERATED AND OR GIGA-SCALE DRAMS/, IEEE journal of solid-state circuits, 30(11), 1995, pp. 1183-1188
Authors:
OOISHI T
ASAKURA M
TOMISHIMA S
HIDAKA H
ARIMOTO K
FUJISHIMA K
Citation: T. Ooishi et al., A WELL-SYNCHRONIZED SENSING EQUALIZING METHOD FOR SUB-1.0-V OPERATINGADVANCED DRAMS, IEICE transactions on electronics, E77C(5), 1994, pp. 762-770
Authors:
OOISHI T
ASAKURA M
TOMISHIMA S
HIDAKA H
ARIMOTO K
FUJISHIMA K
Citation: T. Ooishi et al., A WELL-SYNCHRONIZED SENSING EQUALIZING METHOD FOR SUB-1.0-V OPERATINGADVANCED DRAMS, IEEE journal of solid-state circuits, 29(4), 1994, pp. 432-440
Authors:
ASAKURA M
OOISHI T
TSUKUDE M
TOMISHIMA S
EIMORI T
HIDAKA H
OHNO Y
ARIMOTO K
FUJISHIMA K
NISHIMURA T
YOSHIHARA T
Citation: M. Asakura et al., AN EXPERIMENTAL 256-MB DRAM WITH BOOSTED SENSE-GROUND SCHEME, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1303-1309
Authors:
ASAKURA M
OOISHI T
TSUKUDE M
TOMISHIMA S
EIMORI T
HIDAKA H
OHNO Y
ARIMOTO K
FUJISHIMA K
NISHIMURA T
YOSHIHARA T
Citation: M. Asakura et al., AN EXPERIMENTAL 256-MB DRAM WITH BOOSTED SENSE-GROUND SCHEME, IEEE journal of solid-state circuits, 29(11), 1994, pp. 1303-1309