Authors:
Stolichnov, I
Tagantsev, A
Setter, N
Okhonin, S
Fazan, P
Cross, JS
Tsukada, M
Bartic, A
Wouters, D
Citation: I. Stolichnov et al., Constant-current study of dielectric breakdown of Pb(Zr,Ti)O-3 ferroelectric film capacitors, INTEGR FERR, 32(1-4), 2001, pp. 737-746
Authors:
Stolichnov, I
Tagantsev, A
Colla, E
Gentil, S
Hiboux, S
Baborowski, J
Muralt, P
Setter, N
Citation: I. Stolichnov et al., Downscaling of Pb(Zr,Ti)O-3 film thickness for low-voltage ferroelectric capacitors: Effect of charge relaxation at the interfaces, J APPL PHYS, 88(4), 2000, pp. 2154-2156
Authors:
Stolichnov, I
Tagantsev, A
Setter, N
Okhonin, S
Fazan, P
Cross, JS
Tsukada, M
Citation: I. Stolichnov et al., Dielectric breakdown in (Pb,La)(Zr,Ti)O-3 ferroelectric thin films with Ptand oxide electrodes, J APPL PHYS, 87(4), 2000, pp. 1925-1931
Citation: A. Tagantsev, dc-electric-field-induced microwave loss in ferroelectrics and intrinsic limitation for the quality factor of a tunable component, APPL PHYS L, 76(9), 2000, pp. 1182-1184
Authors:
Stolichnov, I
Tagantsev, A
Setter, N
Cross, JS
Fujiki, M
Tsukada, M
Citation: I. Stolichnov et al., Degradation of asymmetrical Pt/SRO/PLZT/Pt capacitors: Role of Pt and oxide electrodes, INTEGR FERR, 26(1-4), 1999, pp. 1013-1023
Authors:
Stolichnov, I
Tagantsev, A
Doebeli, M
Schmuki, P
Citation: I. Stolichnov et al., Pt-ion-implantation-induced suppression of leakage conduction in Pt/Pb(ZrxTi1-x)O-3/Pt capacitors, INTEGR FERR, 23(1-4), 1999, pp. 191-198
Citation: I. Stolichnov et A. Tagantsev, Space-charge influenced-injection model for conduction in Pb(ZrxTi1-x)O-3 thin films (vol 84, pg 3216, 1998), J APPL PHYS, 85(4), 1999, pp. 2457-2457
Authors:
Stolichnov, I
Tagantsev, A
Setter, N
Cross, JS
Tsukada, M
Citation: I. Stolichnov et al., Control of leakage conduction of high-fatigue-endurance (Pb, La)(Zr, Ti)O-3 film ferroelectric capacitors with Pt/SrRuO3 electrodes, APPL PHYS L, 75(12), 1999, pp. 1790-1792
Authors:
Stolichnov, I
Tagantsev, A
Setter, N
Cross, JS
Tsukada, M
Citation: I. Stolichnov et al., Top-interface-controlled switching and fatigue endurance of (Pb, La)(Zr,Ti)O-3 ferroelectric capacitors, APPL PHYS L, 74(23), 1999, pp. 3552-3554