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Results: 1-16 |
Results: 16
Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine
Authors: Carpentier, P Capitan, M Chesne, ML Fanchon, E Kahn, R Lequien, S Stuhrmann, H Thiaudiere, D Vicat, J Zajac, W Zielinski, P
Citation: P. Carpentier et al., Anomalous diffraction with soft X-ray synchrotron radiation: DANES from pentakismethylammonium undecachlorodibismuthate at the K absorption edge of chlorine, J ALLOY COM, 328(1-2), 2001, pp. 64-70
H10: A materials and high temperature beamline at LURE/DCI
Authors: Gailhanou, M Dubuisson, JM Ribbens, M Roussier, L Betaille, D Creoff, C Lemonnier, M Denoyer, J Bouillot, C Jucha, A Lena, A Idir, M Bessiere, M Thiaudiere, D Hennet, L Landron, C Coutures, JP
Citation: M. Gailhanou et al., H10: A materials and high temperature beamline at LURE/DCI, NUCL INST A, 467, 2001, pp. 745-747
Influence of the electrolyte viscosity on the structural features of porous silicon
Authors: Servidori, M Ferrero, C Lequien, S Milita, S Parisini, A Romestain, R Sama, S Setzu, S Thiaudiere, D
Citation: M. Servidori et al., Influence of the electrolyte viscosity on the structural features of porous silicon, SOL ST COMM, 118(2), 2001, pp. 85-90
Porous silicon characterization by x-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam
Authors: Sama, S Ferrero, C Lequien, S Milita, S Romestain, R Servidori, M Setzu, S Thiaudiere, D
Citation: S. Sama et al., Porous silicon characterization by x-ray reflectivity: problems arising from using a vacuum environment with synchrotron beam, J PHYS D, 34(6), 2001, pp. 841-845
Local structure and dynamics of high temperature SrO-Al2O3 liquids studiedby Al-27 NMR and SrK-edge XAS spectroscopy
Authors: Capron, M Florian, P Fayon, F Trumeau, D Hennet, L Gaihlanou, M Thiaudiere, D Landron, C Douy, A Massiot, D
Citation: M. Capron et al., Local structure and dynamics of high temperature SrO-Al2O3 liquids studiedby Al-27 NMR and SrK-edge XAS spectroscopy, J NON-CRYST, 293, 2001, pp. 496-501
The hydration structure of Br- from anomalous x-ray diffraction
Authors: Ramos, S Barnes, AC Neilson, GW Thiaudiere, D Lequien, S
Citation: S. Ramos et al., The hydration structure of Br- from anomalous x-ray diffraction, J PHYS-COND, 12(8A), 2000, pp. A203-A208
Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse X-ray scattering
Authors: Vogel, M Munster, C Fenzl, W Thiaudiere, D Salditt, T
Citation: M. Vogel et al., Fully hydrated and highly oriented membranes: an experimental setup amenable to specular and diffuse X-ray scattering, PHYSICA B, 283(1-3), 2000, pp. 32-36
Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions
Authors: Naudon, A Babonneau, D Thiaudiere, D Lequien, S
Citation: A. Naudon et al., Grazing-incidence small-angle X-ray scattering applied to the characterization of aggregates in surface regions, PHYSICA B, 283(1-3), 2000, pp. 69-74
Structural and morphological studies of Co/SiO2 discontinuous multilayers
Authors: Thiaudiere, D Proux, O Micha, JS Revenant, C Regnard, JR Lequien, S
Citation: D. Thiaudiere et al., Structural and morphological studies of Co/SiO2 discontinuous multilayers, PHYSICA B, 283(1-3), 2000, pp. 114-118
The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies
Authors: Capitan, MJ Thiaudiere, D Goirand, L Taffut, R Lequien, S
Citation: Mj. Capitan et al., The ID01 beamline at the ESRF: the diffuse scattering technique applied tosurface and interface studies, PHYSICA B, 283(1-3), 2000, pp. 256-261
Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography
Authors: Kahn, R Carpentier, P Berthet-Colominas, C Capitan, M Chesne, ML Fanchon, E Lequien, S Thiaudiere, D Vicat, J Zielinski, P Stuhrmann, H
Citation: R. Kahn et al., Feasibility and review of anomalous X-ray diffraction at long wavelengths in materials research and protein crystallography, J SYNCHROTR, 7, 2000, pp. 131-138
Anomalous X-ray diffraction with soft X-ray synchrotron radiation
Authors: Carpentier, P Berthet-Colominas, C Capitan, M Chesne, ML Fanchon, E Lequien, S Stuhrmann, H Thiaudiere, D Vicat, J Zielinski, P Kahn, R
Citation: P. Carpentier et al., Anomalous X-ray diffraction with soft X-ray synchrotron radiation, CELL MOL B, 46(5), 2000, pp. 915-935
GISAXS study of Cu-Ni alloy clusters obtained by double ion implantation in silicate glasses
Authors: Cattaruzza, E d'Acapito, F Gonella, F Longo, A Martorana, A Mattei, G Maurizio, C Thiaudiere, D
Citation: E. Cattaruzza et al., GISAXS study of Cu-Ni alloy clusters obtained by double ion implantation in silicate glasses, J APPL CRYS, 33(1), 2000, pp. 740-743
Co-sputtering C-Gu thin film synthesis: microstructural study of copper precipitates encapsulated into a carbon matrix
Authors: Cabioc'h, T Naudon, A Jaouen, M Thiaudiere, D Babonneau, D
Citation: T. Cabioc'H et al., Co-sputtering C-Gu thin film synthesis: microstructural study of copper precipitates encapsulated into a carbon matrix, PHIL MAG B, 79(3), 1999, pp. 501-516
Morphological characterization of ion-sputtered C-Ag C/C-Ag and Ag/C filmsby GISAXS
Authors: Babonneau, D Naudon, A Thiaudiere, D Lequien, S
Citation: D. Babonneau et al., Morphological characterization of ion-sputtered C-Ag C/C-Ag and Ag/C filmsby GISAXS, J APPL CRYS, 32, 1999, pp. 226-233
Morphological analysis of aggregates embedded in thin superficial films bygrazing incidence small-angle X-ray scattering
Authors: Babonneau, D Naudon, A Cabioc'h, T Thiaudiere, D Lyon, O Petroff, F
Citation: D. Babonneau et al., Morphological analysis of aggregates embedded in thin superficial films bygrazing incidence small-angle X-ray scattering, J PHYS IV, 8(P5), 1998, pp. 295-302
Risultati: 1-16 |